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ORCIDArpita Dutta
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2020 – today
- 2024
[j23]Swadhin Kumar Barisal
, Arpita Dutta, Sangharatna Godboley, Bibhudatta Sahoo, Durga Prasad Mohapatra:
SMUP: A technique to improve MC/DC using specified patterns. Comput. Electr. Eng. 120: 109706 (2024)- [j22]Arpita Dutta, Samit Biswas, Amit Kumar Das:
EmoComicNet: A multi-task model for comic emotion recognition. Pattern Recognit. 150: 110261 (2024) - [j21]Saksham Sahai Srivastava, Arpita Dutta, Rajib Mall:
Effective fault localization using probabilistic and grouping approach. Int. J. Syst. Assur. Eng. Manag. 15(9): 4616-4635 (2024) - [c21]Arpita Dutta, Rasool Maghareh, Joxan Jaffar, Sangharatna Godboley, Xiao Liang Yu:
TracerX: Pruning Dynamic Symbolic Execution with Deletion and Weakest Precondition Interpolation (Competition Contribution). FASE 2024: 320-325 - [i2]Saksham Sahai Srivastava, Arpita Dutta, Rajib Mall:
Effective Fault Localization using Probabilistic and Grouping Approach. CoRR abs/2403.05022 (2024) - 2023
- [j20]Arpan Garai, Arpita Dutta, Samit Biswas:
Automatic dewarping of camera-captured comic document images. Multim. Tools Appl. 82(1): 1537-1552 (2023) - [c20]Arpita Dutta:
Enhancing Fault Localization by incorporating Statement Frequency and Test Case Contribution. QRS 2023: 128-137 - 2022
- [j19]Arpita Dutta, Samit Biswas, Amit Kumar Das:
BCBId: first Bangla comic dataset and its applications. Int. J. Document Anal. Recognit. 25(4): 265-279 (2022) - [j18]Swadhin Kumar Barisal, Shorya Pratap Singh Chauhan, Arpita Dutta, Sangharatna Godboley, Bibhudatta Sahoo, Durga Prasad Mohapatra:
BOOMPizer: Minimization and prioritization of CONCOLIC based boosted MC/DC test cases. J. King Saud Univ. Comput. Inf. Sci. 34(10 Part B): 9757-9776 (2022) - [j17]Sourav Biswas, Raghav Rathi, Arpita Dutta, Pabitra Mitra, Rajib Mall:
A regression test case prioritization technique targeting 'hard to detect' faults. Int. J. Syst. Assur. Eng. Manag. 13(3): 1066-1081 (2022) - [c19]Sangharatna Godboley, Arpita Dutta, Pisipati Radha Krishna, Durga Prasad Mohapatra:
SSG-AFL: Vulnerability detection for Reactive Systems using Static Seed Generator based AFL. COMPSAC 2022: 1728-1733 - [c18]Arpita Dutta, Rajib Mall:
An Ensemble Classifier based Method for Effective Fault Localization. ICSOFT 2022: 159-166 - [c17]Arpita Dutta:
Poster: EBFL-An Ensemble Classifier based Fault Localization. ICST 2022: 473-476 - [c16]Swadhin Kumar Barisal, Arpita Dutta, Sangharatna Godboley, Bibhudatta Sahoo, Durga Prasad Mohapatra:
Agility Based Coverage Improvement. LASD 2022: 170-186 - [c15]Arpita Dutta:
A Complete Unit Test Framework for Agile Software Development. LASD 2022: 189-197 - 2021
- [j16]Abha Maru, Arpita Dutta, Vinod Kumar Kulamala, Durga Prasad Mohapatra:
Software fault localization using BP neural network based on function and branch coverage. Evol. Intell. 14(1): 87-104 (2021) - [j15]Swadhin Kumar Barisal, Arpita Dutta, Sangharatna Godboley, Bibhudatta Sahoo, Durga Prasad Mohapatra:
MC/DC guided Test Sequence Prioritization using Firefly Algorithm. Evol. Intell. 14(1): 105-118 (2021) - [j14]Arpita Dutta, Samit Biswas, Amit Kumar Das:
CNN-based segmentation of speech balloons and narrative text boxes from comic book page images. Int. J. Document Anal. Recognit. 24(1): 49-62 (2021) - [j13]Arpita Dutta, Arpan Garai, Samit Biswas, Amit Kumar Das:
Segmentation of text lines using multi-scale CNN from warped printed and handwritten document images. Int. J. Document Anal. Recognit. 24(4): 299-313 (2021) - [j12]Arpita Dutta, Amit Jha, Rajib Mall:
MuSim: Mutation-based Fault Localization Using Test Case Proximity. Int. J. Softw. Eng. Knowl. Eng. 31(5): 725-744 (2021) - [j11]Arpita Dutta, Krishna Kunal, Saksham Sahai Srivastava, Shubham Shankar, Rajib Mall:
FTFL: A Fisher's test-based approach for fault localization. Innov. Syst. Softw. Eng. 17(4): 381-405 (2021) - [j10]Arpita Dutta, Saksham Sahai Srivastava, Sangharatna Godboley, Durga Prasad Mohapatra:
Combi-FL: Neural network and SBFL based fault localization using mutation analysis. J. Comput. Lang. 66: 101064 (2021) - [c14]Ayan Datta, Karanvir Singh, Arpita Dutta, Kousik Debnath:
A Timing Aware Connectivity Optimization Technique for Improving Energy Efficiency of High-Performance CPUs. COOL CHIPS 2021: 1-6 - [c13]Sangharatna Godboley, Arpita Dutta:
Dy-COPECA: A Dynamic Version of MC/DC Analyzer for C Program. ENASE 2021: 197-204 - [c12]Sangharatna Godboley, Joxan Jaffar, Rasool Maghareh, Arpita Dutta:
Toward optimal mc/dc test case generation. ISSTA 2021: 505-516 - [c11]Arpita Dutta, Sangharatna Godboley:
MSFL: A Model for Fault Localization Using Mutation-Spectra Technique. LASD 2021: 156-173 - 2020
- [j9]Arpita Dutta, Richa Manral, Pabitra Mitra, Rajib Mall:
Hierarchically Localizing Software Faults Using DNN. IEEE Trans. Reliab. 69(4): 1267-1292 (2020) - [c10]Arpita Dutta, Rajib Mall:
A Function Dependency based Approach for Fault Localization with D. ICSOFT 2020: 273-283
2010 – 2019
- 2019
- [j8]Arpita Dutta, Anwesha Patel, Rajib Mall:
Investigation into the effectiveness of white-box T-way testing. IET Softw. 13(6): 610-616 (2019) - [c9]Arpita Dutta, Samit Biswas:
CNN Based Extraction of Panels/Characters from Bengali Comic Book Page Images. GREC@ICDAR 2019: 38-43 - [c8]Arpita Dutta, Shubham Kumar, Sangharatna Godboley:
Enhancing Test Cases generated by Concolic Testing. ISEC 2019: 11:1-11:11 - [c7]Arpita Dutta, Rohit Sahay, Pabitra Mitra, Rajib Mall:
Predicate Proximity in Failure: An MLP based Fault Localization approach. TENCON 2019: 936-941 - [i1]Arpita Dutta, Samit Biswas:
CNN based Extraction of Panels/Characters from Bengali Comic Book Page Images. CoRR abs/1910.09233 (2019) - 2018
- [j7]Sangharatna Godboley, Arpita Dutta, Durga Prasad Mohapatra, Rajib Mall:
GECOJAP: A novel source-code preprocessing technique to improve code coverage. Comput. Stand. Interfaces 55: 27-46 (2018) - [j6]Sangharatna Godboley, Arpita Dutta, Durga Prasad Mohapatra, Rajib Mall:
Scaling modified condition/decision coverage using distributed concolic testing for Java programs. Comput. Stand. Interfaces 59: 61-86 (2018) - [j5]Sangharatna Godboley, Arpita Dutta, Durga Prasad Mohapatra:
Reduced energy consumption for MC/DC testing. Int. J. Bus. Inf. Syst. 28(4): 447-467 (2018) - 2017
- [j4]Sangharatna Godboley, Arpita Dutta, Durga Prasad Mohapatra, Rajib Mall:
J3 Model: A novel framework for improved Modified Condition/Decision Coverage analysis. Comput. Stand. Interfaces 50: 1-17 (2017) - [j3]Sangharatna Godboley, Arpita Dutta, Durga Prasad Mohapatra:
Green DRCT: Measuring Energy Consumption of an Enhanced Branch Coverage and Modified Condition/Decision Coverage Technique. Int. J. Knowl. Discov. Bioinform. 7(1): 14-29 (2017) - [j2]Srijan Das, Arpita Dutta, Saurav Sharma, Sangharatna Godboley:
A Comparative Analysis of a Novel Anomaly Detection Algorithm with Neural Networks. Int. J. Rough Sets Data Anal. 4(4): 1-16 (2017) - 2016
- [j1]Sangharatna Godboley, Arpita Dutta, Durga Prasad Mohapatra, Avijit Das, Rajib Mall:
Making a concolic tester achieve increased MC/DC. Innov. Syst. Softw. Eng. 12(4): 319-332 (2016) - [c6]Sangharatna Godboley, Arpita Dutta, Durga Prasad Mohapatra:
Java-HCT: An approach to increase MC/DC using Hybrid Concolic Testing for Java programs. FedCSIS 2016: 1709-1713 - [c5]Arpita Dutta, Sangharatna Godboley, Durga Prasad Mohapatra:
Measuring Branch Coverage for the SOA Based Application Using Concolic Testing. ICACDS 2016: 165-172 - 2015
- [c4]Arpita Dutta, Subhadip Kundu, Santanu Chattopadhyay, Bijit Kumar Das:
A hardware based low temperature solution for VLSI testing using decompressor side masking. ISCAS 2015: 637-640 - [c3]Arpita Dutta, Santanu Chattopadhyay:
Particle swarm optimization approach for low temperature BIST. VDAT 2015: 1-6 - 2013
- [c2]Arpita Dutta, Subhadip Kundu, Santanu Chattopadhyay:
Thermal Aware Don't Care Filling to Reduce Peak Temperature and Thermal Variance during Testing. Asian Test Symposium 2013: 25-30 - 2012
- [c1]Tapas Kumar Maiti, Subhadip Kundu, Arpita Dutta, Santanu Chattopadhyay:
Confidence Based Power Aware Testing. ISED 2012: 62-66
Coauthor Index
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