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ORCID7th LATW 2006: Buenos Aires, Argentina
- 7th Latin American Test Workshop, LATW 2006, Buenos Aires, Argentina, March 26-29, 2006. IEEE 2006
- Rodrigo Picos, Oscar Calvo, Miquel Roca, Eugenio García-Moreno:
Improved Fault Detection Using a Charge Monitor. LATW 2006: 19-24 - Carlos E. F. Savioli, Claudio E. C. Szendrodi, José Vicente Calvano, Antonio Carneiro de Mesquita Filho:
Using Swarm Intelligence to Solve Some Analog Test Issues. LATW 2006: 25-29 - Romanelli Lodron Zuim, José T. Souza, Claudionor José Nunes Coelho Jr.:
Cube Subtraction in SAT Solvers. LATW 2006: 33-38 - Gabriela Peretti, Eduardo Romero, Carlos A. Marqués:
Oscillation-based Test in Digital IIR Filters. LATW 2006: 41-46 - Santosh Biswas, Amit Patra, Siddhartha Mukhopadhyay:
Concurrent Testing of Digital Circuits for Non-Classical Fault Models: Bridging Faults and n-Detect Test. LATW 2006: 49-54 - Abilio Parreira, Marcelino B. Santos, João Paulo Teixeira:
BIST Architectures and Fault Emulation. LATW 2006: 55-60 - David Hély, Frédéric Bancel, Marie-Lise Flottes, Bruno Rouzeyre:
Scan Pattern Watermarking. LATW 2006: 63-67 - Marta Portela-García, Luca Sterpone, Celia López-Ongil, Matteo Sonza Reorda, Massimo Violante:
A Fault Injection Environment for SoPC's Embedded Microprocessors. LATW 2006: 68-73 - Witold A. Pleskacz, Tomasz Borejko, Andrzej Walkanis, Viera Stopjaková, Artur Jutman, Raimund Ubar:
DefSim: CMOS Defects on Chip for Research and Education. LATW 2006: 74-79 - Lucía Costas, Juan Jose Rodríguez-Andina, Elena Lago:
FPGA-based Stuck-at Fault Emulation in Wavelet-based Image Coding Systems. LATW 2006: 83-87 - Janusz Sosnowski, Marek Poleszak:
Exploring and Interpreting System Event Logs. LATW 2006: 91-96 - Sergei Devadze, Jaan Raik, Artur Jutman, Raimund Ubar:
Fault Simulation with Parallel Critical Path Tracing for Combinatorial Circuits Using Structurally Synthesized BDDs. LATW 2006: 97-102 - Marcial Jesús Rodríguez-Irago, Juan J. Rodríguez-Andina, Fabian Vargas, Isabel C. Teixeira, João Paulo Teixeira:
Using Multiple Clock Schemes and Multi-Temperature Test for Dynamic Fault Detection in Digital Systems. LATW 2006: 103-107 - S. Torrellas, Bogdan Nicolescu, Raul Velazco, Mario García-Valderas, Yvon Savaria:
Validation by Fault Injection of a Software Error Detection Technique Dealing with Critical Single Event Upsets. LATW 2006: 111-116 - Arthur Pereira Frantz, Fernanda Lima Kastensmidt:
SEU Effects Evaluation on a NoC Router Architecture. LATW 2006: 117-122 - Kaushik Roy:
Process Variation: Its Impact on the Design and Test of CMOS Circuits. LATW 2006: 123 - Dirhaj Pradhan:
ATPG-based Techniques for Verification. LATW 2006: 125 - Chuck Hawkins:
Parametric Failures and Detection Strategies. LATW 2006: 126 - Andréa Weber, Elias Procópio Duarte Jr., Keiko V. O. Fonseca:
An Optimal Test Assignment for Monitoring General Topology Networks. LATW 2006: 131-136 - Joana M. F. da Trindade, Gabriela Jacques-Silva, Roberto Jung Drebes, Taisy Silva Weber, Ingrid Jansch-Pôrto:
Off-line Synchronization of Distributed Logs in Fault Injection Test Campaings. LATW 2006: 137-142 - Massimiliano Schillaci, Matteo Sonza Reorda, Massimo Violante:
A New Approach to Cope with Single Event Upsets in Processor-based Systems. LATW 2006: 145-150 - Eduardo Luis Rhod, Carlos Arthur Lang Lisbôa, Luigi Carro:
Using Memory to Cope with Simultaneous Transient Faults. LATW 2006: 151-156 - Karina Kohl Silveira, Taisy Silva Weber:
As Aspect-Oriented Fault Injection Tool to Test Fault Tolerant Mechanisms of Dependable Java-based Network Applications. LATW 2006: 159-164 - Gustavo A. de Souza, Silvia Regina Vergilio:
Modeling Software Reliability Growth with Artificial Neural Networks. LATW 2006: 165-170 - Jorge Correa de Oliveira, Cidinha Costa Gouveia, Romulo Quidute Filho:
Test Automation Viability Analysis Method. LATW 2006: 173-178 - Erik Schüler, Luigi Carro:
Increasing Reliability in Future Technologies Systems. LATW 2006: 181-185 - Lorena Anghel, Cristiano Lazzari, Michael Nicolaidis:
Multiple Defect Tolerant Devices for Unreliable Future Nanotechnologies. LATW 2006: 186-191 - Maryam Ashouei, Soumendu Bhattacharya, Abhijit Chatterjee:
Probabilistic Error Correction in Linear Digital Filters Using Checksum Codes. LATW 2006: 192-197 - Fabian Vargas, Juliano Benfica, Augusto Farina, Eduardo Bezerra, Edmundo Gatti, Luis Garcia, Daniel Lupi, Fernando Hernandez:
Observing SRAM-based FPGA Robustness in EMI-exposed Environments. LATW 2006: 201-206
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