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4th ISSRE 1993: Denver, CO, USA
- Fourth International Symposium on Software Reliability Engineering, ISSRE 1993, Denver, CO, USA, November 3-6, 1993. IEEE Computer Society 1993, ISBN 0-8186-4010-3
Invited Speakers
- Koji Torii:
Current trends of the software reliability in Japan and needs of future related activities. 2-3
Testing and Validation
- Anneliese von Mayrhauser, Stew Crawford-Hines:
Automated testing support for a robot tape library. 6-14 - Anna Stuparu, Patrick Ozello, François Baranowski:
INRETS experience of the highly critical software validation of the MAGGALY subway. 15-24 - Michael R. Lyu, Joseph R. Horgan, Saul London:
A coverage analysis tool for the effectiveness of software testing. 25-34
Practice and Process I
- Claes Wohlin:
Engineering reliable software. 36-43 - John C. Munson, Ruth H. Ravenel:
Designing reliable software. 45-54 - Gerald W. Baumann:
Controlling software reliability during development. 55-59
Models
- R. Follenweider, Richard M. Karcich, George J. Knafl:
A systematic approach to software reliability modeling. 62-70 - Michael Naixin Li, Yashwant K. Malaiya:
Enhancing accuracy of software reliability prediction. 71-79 - Kang Wu, Yashwant K. Malaiya:
The effect of correlated faults on software reliability. 80-89
Fault-Tolerant Software I
- Frederick T. Sheldon, Hsing Mei, Seung-Min Yang:
Reliability prediction of distributed embedded fault-tolerant systems. 92-102 - Joanne Bechta Dugan, Michael R. Lyu:
System reliability analysis of an N-version programming application. 103-111 - Katerina Goseva-Popstojanova, Aksenti Grnarov:
Dependability modeling and evaluation of recovery block systems. 112-120
Panel
- Ram Chillarege, Ravishankar K. Iyer, Jean-Claude Laprie, John D. Musa:
Panel: Field Failures And Reliability In Operation. 122-126
Data and Metrics
- Jingde Cheng:
Complexity metrics for distributed programs. 132-141 - Norman F. Schneidewind:
Optimal selection of failure data for predicting failure counts. 142-149 - Ram Chillarege, Bonnie K. Ray, Al Garrigan, Dave Ruth:
Software recreate problems estimated to range 10-20 percent: A case study on two operating system products. 150-158
Systems
- Ing-Ray Chen, Ta-Wei Tsao, Farokh B. Bastani:
Reliability of uniprocessor and multiprocessor real-time artificial intelligence planning systems. 160-167 - Sanjay Krishna, Travis Diamond, V. S. S. Nair:
A hierarchical object-oriented approach to fault tolerance in distributed systems. 168-177
Fault-Tolerant Software II
- Nasser A. Kanawati, Ghani A. Kanawati, Jacob A. Abraham:
Adding capability checks enhances error detection and isolation in object-based systems. 182-191 - Kazuyuki Shima, Ken-ichi Matsumoto, Koji Torii:
A mathematical comparison of Software Breeding and Community Error Recovery in multiversion software. 192-201 - Srinivasan Chandrasekar, Pradip K. Srimani:
A new fault tolerant distributed algorithm for longest paths in a DAG. 202-206
Testing
- Shin'ichi Uryu, Mariko Shimizu:
System simulation testing: Pre-delivery testing to ensure system dependability. 208-217 - Ming Zhao, Min Xie:
Robustness of optimum software release policies. 218-225 - Kurt M. Olender, James M. Bieman:
Using algebraic specifications to find sequencing defects. 226-232
Practice and Process II
- Karama Kanoun, Mohamed Kaâniche, Jean-Claude Laprie:
Experience in software reliability: From data collection to quantitative evaluation. 234-245 - Alice T. Lee, Todd R. Gunn:
A quantitative risk assessment method for space flight software systems. 246-252 - Jeff Tian, Peng Lu:
Software reliability measurement and modeling for multiple releases of commercial software. 253-260
Simulation
- Anneliese von Mayrhauser, Yashwant K. Malaiya, Pradip K. Srimani, James Keables:
On the need for simulation for better characterization of software reliability. 264-273 - Mei-Hwa Chen, Michael K. Jones, Aditya P. Mathur, Vernon Rego:
TERSE: A tool for evaluating software reliability models. 274-283 - Wendell D. Jones, David Gregory:
Infinite failure models for a finite world: A simulation study of the fault discovery process. 284-293
Panel
- Ted W. Keller, John C. Munson, Norman F. Schneidewind, George E. Stark:
Panel: Achieving Success in Measurement and Reliability Modeling. 296-300
New Approaches
- Taghi M. Khoshgoftaar, David L. Lanning, Abhijit S. Pandya:
A neural network modeling methodology for the detection of high-risk programs. 302-309 - Nachimuthu Karunanithi:
A neural network approach for software reliability growth modeling in the presence of code churn. 310-317 - Alireza Azem, Fevzi Belli, Oliver Jack, Piotr Jedrzejowicz:
Testing and reliability of logic programs. 318-327
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