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2020 – today
- 2025
[j16]Wenjuan Lu, Chuang Wang, Wei Hu, Chenghu Dai, Chunyu Peng, Zhiting Lin, Xiulong Wu
:
Hybrid MOSFET-TFET 11T SRAM cell with high write speed and free half-selected disturbance. Microelectron. J. 156: 106498 (2025)- [j15]Wei Hu, Qizhong Zhang, Chenghu Dai, Chunyu Peng, Wenjuan Lu, Xiulong Wu:
Low-power 12T TFET-MOSFET hybrid SRAM bitcell and hybrid 8T SRAM array based on multiplexing strategy. Microelectron. J. 157: 106569 (2025) - 2024
- [j14]Chenghu Dai, Zihua Ren, Lijun Guan, Haitao Liu, Mengya Gao, Wenjuan Lu, Zhiyong Pang, Chunyu Peng, Xiulong Wu:
A 9T-SRAM in-memory computing macro for Boolean logic and multiply-and-accumulate operations. Microelectron. J. 144: 106087 (2024) - [j13]Xin Li, Mengya Gao, Zihua Ren, Kefeng Yu, Wenjuan Lu, Chenghu Dai, Wei Hu, Chunyu Peng, Xiulong Wu:
A 9T-SRAM based computing-in-memory with redundant unit and digital operation for boolean logic and MAC. Microelectron. J. 145: 106124 (2024) - [j12]Zhiting Lin, Changxin Yue, Ke Li, Qiushi Feng, Siyan Li, Yue Zhao, Yuanyang Wang, Jiaqi Chen, Wenjuan Lu, Chunyu Peng, Qiang Zhao, Chenghu Dai, Licai Hao, Xiulong Wu:
Cross-coupled 4T2R multi-logic in-memory computing circuit design. Microelectron. J. 147: 106179 (2024) - [j11]Chunyu Peng, Shengyuan Yan, Huayi Ding, Yana Wang, Wenjuan Lu, Chenghu Dai, Xin Li, Wei Hu, Xiulong Wu:
High energy efficient and configurable CIM macro for image processing. Microelectron. J. 148: 106212 (2024) - [j10]Zhiting Lin, Runru Yu, Da Huo, Qingchuan Zhu, Miao Long, Yongqi Qin, Yanchun Liu, Lintao Chen, Simin Wang, Ting Wang, Yousheng Xing, Zeshi Wen, Yu Liu, Xin Li, Chenghu Dai, Qiang Zhao, Chunyu Peng, Xiulong Wu:
A 28-nm 9T SRAM-based CIM macro with capacitance weighting module and redundant array-assisted ADC. Microelectron. J. 153: 106397 (2024) - [j9]Xin Li, Mengya Gao, Zihua Ren, Kefeng Yu, Wenjuan Lu, Chenghu Dai, Wei Hu, Chunyu Peng, Xiulong Wu:
Corrigendum to "A 9T-SRAM based computing-in-memory with redundant unit and digital operation for boolean logic and MAC" [145, March 2024, 106124. Microelectron. J. 154: 106473 (2024) - [j8]Chunyu Peng, Lang Tian, Licai Hao, Qiang Zhao, Chenghu Dai, Zhiting Lin, Xiulong Wu:
High-Performance Latch Designs of Double-Node-Upset Self-Recovery and Triple-Node-Upset Tolerance for Aerospace Applications. IEEE Trans. Aerosp. Electron. Syst. 60(5): 6550-6561 (2024) - [j7]Yongliang Zhou, Zixuan Zhou, Yiming Wei, Zhen Yang, Xiao Lin, Chenghu Dai, Licai Hao, Chunyu Peng, Hao Cai, Xiulong Wu:
A CFMB STT-MRAM-Based Computing-in-Memory Proposal With Cascade Computing Unit for Edge AI Devices. IEEE Trans. Circuits Syst. I Regul. Pap. 71(1): 187-200 (2024) - [j6]Li Liu, Dele Tai, Bin Qiang, Lijun Guan, Chunyu Peng, Chenghu Dai, Licai Hao, Wenjuan Lu, Zhiting Lin, Qiang Zhao, Xiulong Wu:
Flip Point Offset-Compensation Sense Amplifier With Sensing-Margin-Enhancement for Dynamic Random-Access Memory. IEEE Trans. Circuits Syst. II Express Briefs 71(4): 1759-1763 (2024) - [j5]Licai Hao, Xinyi Zhang, Chenghu Dai, Qiang Zhao, Wenjuan Lu, Chunyu Peng, Yongliang Zhou, Zhiting Lin, Xiulong Wu:
Soft-Error-Immune Quadruple-Node-Upset Tolerant Latch Based on Polarity Design and Source-Isolation Technologies. IEEE Trans. Very Large Scale Integr. Syst. 32(4): 597-608 (2024) - [j4]Licai Hao, Yaling Wang, Yunlong Liu, Shiyu Zhao, Xinyi Zhang, Yang Li, Wenjuan Lu, Chunyu Peng, Qiang Zhao, Yongliang Zhou, Chenghu Dai, Zhiting Lin, Xiulong Wu:
Low-Cost and Highly Robust Quadruple Node Upset Tolerant Latch Design. IEEE Trans. Very Large Scale Integr. Syst. 32(5): 883-896 (2024) - 2023
- [j3]Licai Hao, Bin Qiang, Chenghu Dai, Chunyu Peng, Wenjuan Lu, Zhiting Lin, Li Liu, Qiang Zhao, Xiulong Wu, Fei Sun:
Radiation-hardened 14T SRAM cell by polar design for space applications. IEICE Electron. Express 20(13): 20230083 (2023) - [j2]Licai Hao, Li Liu, Qi Shi, Bin Qiang, Zhengya Li, Nianlong Liu, Chenghu Dai, Qiang Zhao, Chunyu Peng, Wenjuan Lu, Zhiting Lin, Xiulong Wu:
Design of radiation-hardened memory cell by polar design for space applications. Microelectron. J. 132: 105691 (2023) - [j1]Chenghu Dai, Yuanyuan Du, Qi Shi, Ruixuan Wang, Hao Zheng, Wenjuan Lu, Chunyu Peng, Licai Hao, Zhiting Lin, Xiulong Wu:
Bit-line leakage current tracking and self-compensation circuit for SRAM reliability design. Microelectron. J. 132: 105699 (2023)
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