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Sai Raghuram Durbha

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2000 – 2009

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2009
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Amit Laknaur, Rui Xiao, Sai Raghuram Durbha, Haibo Wang:
Design of a window comparator with adaptive error threshold for online testing applications. Microelectron. J. 40(9): 1257-1263 (2009)
2007
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Amit Laknaur, Rui Xiao, Sai Raghuram Durbha, Haibo Wang:
Design of a Window Comparator with Adaptive Error Threshold for Online Testing Applications. ISQED 2007: 501-506
2006
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Amit Laknaur, Sai Raghuram Durbha, Haibo Wang:
Built-In-Self-Testing Techniques for Programmable Capacitor Arrays. J. Electron. Test. 22(4-6): 449-462 (2006)
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Sai Raghuram Durbha, Amit Laknaur, Haibo Wang:
Investigating the Efficiency of Integrator-Based Capacitor Array Testing Techniques. VTS 2006: 320-325

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