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Yan-Xiang Luo

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2010 – 2019

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2015
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Wei Chang, Chun-Hsing Shih, Yan-Xiang Luo, Wen-Fa Wu, Chen-Hsin Lien:
Reliability impacts of high-speed 3-bit/cell Schottky barrier nanowire charge-trapping memories. Microelectron. Reliab. 55(1): 74-80 (2015)
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Yu-Hsuan Chen, Jr-Jie Tsai, Yan-Xiang Luo, Chun-Hsing Shih:
Iterative programming analysis of dopant-segregated multibit/cell Schottky barrier charge-trapping memories. NVMTS 2015: 1-3

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