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ORCIDDipak Kumar Kole
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2020 – today
- 2024
[j6]Dhiman Mondal
, Purbayan Kar, Kusal Roy, Dipak Kumar Kole, Swalpa Kumar Roy:
X-ResFormer: A Model to Detect Infestation of Pest and Diseases on Crops. SN Comput. Sci. 5(1): 86 (2024)- 2022
- [j5]Joyati Mondal, Dipak Kumar Kole, Hafizur Rahaman, Debesh Kumar Das, Bhargab B. Bhattacharya:
DFT with Universal Test Set for All Missing Gate Faults in Reversible Circuits. J. Circuits Syst. Comput. 31(10): 2250128:1-2250128:24 (2022) - [j4]Dhiman Mondal, Kusal Roy, Dibyarup Pal, Dipak Kumar Kole:
Deep Learning-Based Approach to Detect and Classify Signs of Crop Leaf Diseases and Pest Damage. SN Comput. Sci. 3(6): 433 (2022)
2010 – 2019
- 2019
- [j3]Joyati Mondal, Bappaditya Mondal, Dipak Kumar Kole, Hafizur Rahaman, Debesh Kumar Das:
Boolean Difference Technique for Detecting All Missing Gate and Stuck-at Faults in Reversible Circuits. J. Circuits Syst. Comput. 28(12): 1950212:1-1950212:18 (2019) - 2016
- [c15]Dipak Kumar Kole, Jhuma Dutta, Arpita Kundu, Suravi Chatterjee, Suravi Agarwal, Tanushri Kisku:
Generalized construction of quantum multiplexers and de-multiplexers using a proposed novel algorithm based on universal Fredkin gate. ISED 2016: 82-86 - 2015
- [c14]Joyati Mondal, Bappaditya Mondal, Dipak Kumar Kole, Hafizur Rahaman, Debesh K. Das:
Boolean Difference Technique for Detecting All Missing Gate Faults in Reversible Circuits. DDECS 2015: 95-98 - [c13]Diptesh Majumdar, Dipak Kumar Kole, Aruna Chakraborty, Dwijesh Dutta Majumder:
An Integrated Digital Image Analysis System for Detection, Recognition and Diagnosis of Disease in Wheat Leaves. WCI 2015: 400-405 - 2014
- [c12]Bappaditya Mondal, Dipak Kumar Kole, Debesh Kumar Das, Hafizur Rahaman:
Generator for Test Set Construction of SMGF in Reversible Circuit by Boolean Difference Method. ATS 2014: 68-73 - [c11]Diptesh Majumdar, Arya Ghosh, Dipak Kumar Kole, Aruna Chakraborty, Dwijesh Dutta Majumder:
Application of Fuzzy C-Means Clustering Method to Classify Wheat Leaf Images Based on the Presence of Rust Disease. FICTA (1) 2014: 277-284 - [c10]Bappaditya Mondal, Chandan Bandyopadhyay, Dipak Kumar Kole, Jimson Mathew, Hafizur Rahaman:
Diagnosis of SMGF in ESOP Based Reversible Logic Circuit. ISED 2014: 89-93 - [i1]Dipak Kumar Kole, Subhadip Basu:
An Automated Group Key Authentication System Using Secret Image Sharing Scheme. CoRR abs/1410.4019 (2014) - 2013
- [j2]Dipak Kumar Kole, Hafizur Rahaman, Debesh K. Das, Bhargab B. Bhattacharya:
Derivation of test set for detecting multiple missing-gate faults in reversible circuits. Comput. Electr. Eng. 39(2): 225-236 (2013) - [c9]Joyati Mondal, Debesh K. Das, Dipak Kumar Kole, Hafizur Rahaman:
A design for testability technique for quantum reversible circuits. EWDTS 2013: 1-4 - [c8]Chandan Bandyopadhyay, Debashri Roy, Dipak Kumar Kole, Kamalika Datta, Hafizur Rahaman:
ESOP-Based Synthesis of Reversible Circuit Using Improved Cube List. ISED 2013: 26-30 - [c7]Joyati Mondal, Debesh Kumar Das, Dipak Kumar Kole, Hafizur Rahaman, Bhargab B. Bhattacharya:
On Designing Testable Reversible Circuits Using Gate Duplication. VDAT 2013: 322-329 - 2012
- [c6]Ujan Mukhopadhyay, Souptik Sinha, Poulomi Ghosh, Rilok Ghosh, Dipak Kumar Kole, Aruna Chakraborty:
Enhancing the security of digital Video Watermarking using watermark encryption. CCSEIT 2012: 145-150 - [c5]Papia Manna, Dipak Kumar Kole, Hafizur Rahaman, Debesh K. Das, Bhargab B. Bhattacharya:
Reversible Logic Circuit Synthesis Using Genetic Algorithm and Particle Swarm Optimization. ISED 2012: 246-250 - 2011
- [j1]Hafizur Rahaman, Dipak Kumar Kole, Debesh K. Das, Bhargab B. Bhattacharya:
Fault diagnosis in reversible circuits under missing-gate fault model. Comput. Electr. Eng. 37(4): 475-485 (2011) - [c4]Dipak Kumar Kole, Hafizur Rahaman, Debesh K. Das, Bhargab B. Bhattacharya:
Derivation of Automatic Test Set for Detection of Missing Gate Faults in Reversible Circuits. ISED 2011: 200-205 - 2010
- [c3]Dipak Kumar Kole, Hafizur Rahaman, Debesh K. Das, Bhargab B. Bhattacharya:
Derivation of Optimal Test Set for Detection of Multiple Missing-Gate Faults in Reversible Circuits. Asian Test Symposium 2010: 33-38
2000 – 2009
- 2008
- [c2]Hafizur Rahaman, Dipak Kumar Kole, Debesh Kumar Das, Bhargab B. Bhattacharya:
On the Detection of Missing-Gate Faults in Reversible Circuits by a Universal Test Set. VLSI Design 2008: 163-168 - 2007
- [c1]Hafizur Rahaman, Dipak Kumar Kole, Debesh K. Das, Bhargab B. Bhattacharya:
Optimum Test Set for Bridging Fault Detection in Reversible Circuits. ATS 2007: 125-128
Coauthor Index
aka: Debesh K. Das
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