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Yumi Kakuhara

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2000 – 2009

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2007
[j2]
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  dblp key:
  - journals/ieicet/OdaIKTKSOYKSHU07
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  persistent URL:
  - https://dblp.org/rec/journals/ieicet/OdaIKTKSOYKSHU07
Noriaki Oda, Hironori Imura, Naoyoshi Kawahara, Masayoshi Tagami, Hiroyuki Kunishima, Shuji Sone, Sadayuki Ohnishi, Kenta Yamada, Yumi Kakuhara, Makoto Sekine, Yoshihiro Hayashi, Kazuyoshi Ueno:
Chip-Level Performance Maximization Using ASIS (Application-Specific Interconnect Structure) Wiring Design Concept for 45 nm CMOS Generation. IEICE Trans. Electron. 90-C(4): 848-855 (2007)
2001
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Shinji Yokogawa, Norio Okada, Yumi Kakuhara, Hideyuki Takizawa:
Electromigration Performance of Multi-level Damascene Copper Interconnects. Microelectron. Reliab. 41(9-10): 1409-1416 (2001)

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