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Giorgio Pollaccia
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2020 – today
- 2023
- [j5]Francesco Angione, Davide Appello, Paolo Bernardi, Claudia Bertani, Giovambattista Gallo, Stefano Littardi, Giorgio Pollaccia, Walter Ruggeri, Matteo Sonza Reorda, Vincenzo Tancorre, Roberto Ugioli:
A Low-Cost Burn-In Tester Architecture to Supply Effective Electrical Stress. IEEE Trans. Computers 72(5): 1447-1459 (2023) - 2022
- [j4]Davide Appello, Paolo Bernardi, Andrea Calabrese, Giorgio Pollaccia, Stefano Quer, Vincenzo Tancorre, Roberto Ugioli:
Parallel Multithread Analysis of Extremely Large Simulation Traces. IEEE Access 10: 56440-56457 (2022) - 2021
- [c6]Davide Appello, Paolo Bernardi, Andrea Calabrese, Stefano Littardi, Giorgio Pollaccia, Stefano Quer, Vincenzo Tancorre, Roberto Ugioli:
Accelerated Analysis of Simulation Dumps through Parallelization on Multicore Architectures. DDECS 2021: 69-74 - [c5]Walter Ruggeri, Paolo Bernardi, Stefano Littardi, Matteo Sonza Reorda, Davide Appello, Claudia Bertani, Giorgio Pollaccia, Vincenzo Tancorre, Roberto Ugioli:
Innovative methods for Burn-In related Stress Metrics Computation. DTIS 2021: 1-6
2010 – 2019
- 2019
- [c4]F. Almeida, Paolo Bernardi, D. Calabrese, Marco Restifo, Matteo Sonza Reorda, Davide Appello, Giorgio Pollaccia, Vincenzo Tancorre, Roberto Ugioli, Gulio Zoppi:
Effective Screening of Automotive SoCs by Combining Burn-In and System Level Test. DDECS 2019: 1-6 - 2018
- [j3]Davide Appello, Conrad Bugeja, Giorgio Pollaccia, Paolo Bernardi, Riccardo Cantoro, Marco Restifo, Ernesto Sánchez, Federico Venini:
An Optimized Test During Burn-In for Automotive SoC. IEEE Des. Test 35(3): 46-53 (2018) - [j2]Davide Appello, Paolo Bernardi, Conrad Bugeja, Riccardo Cantoro, Giorgio Pollaccia, Marco Restifo, Federico Venini:
Adaptive Management Techniques for Optimized Burn-in of Safety-Critical SoC. J. Electron. Test. 34(1): 43-52 (2018) - [j1]Davide Appello, Paolo Bernardi, Conrad Bugeja, Riccardo Cantoro, Andrea Colazzo, Alessandro Motta, Alberto Pagani, Giorgio Pollaccia, Marco Restifo, Ernesto Sánchez, Federico Venini:
An Evolutionary Algorithm Approach to Stress Program Generation During Burn-In. J. Low Power Electron. 14(1): 86-98 (2018) - 2017
- [c3]Davide Appello, Paolo Bernardi, G. Giacopelli, Alessandro Motta, Alberto Pagani, Giorgio Pollaccia, C. Rabbi, Marco Restifo, P. Ruberg, Ernesto Sánchez, C. M. Villa, Federico Venini:
A comprehensive methodology for stress procedures evaluation and comparison for Burn-In of automotive SoC. DATE 2017: 646-649
2000 – 2009
- 2006
- [c2]Ferdinando Bedeschi, Chiara Boffino, Edoardo Bonizzoni, Osama Khouri, Giorgio Pollaccia, Claudio Resta, Guido Torelli:
A low-ripple voltage tripler. ISCAS 2006 - 2001
- [c1]Salvatore Vitabile, Giorgio Pollaccia, Giovanni Pilato, Filippo Sorbello:
Road Signs Recognition Using a Dynamic Pixel Aggregation Technique in the HSV Color Space. ICIAP 2001: 572-577
Coauthor Index
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