乐胖代购免代理版

{"id":"https://openalex.org/W286770689","doi":"https://doi.org/10.2312/pe/vmv/vmv11/207-214","title":"A Mathematical Model and Calibration Procedure for Galvanometric Laser Scanning Systems","display_name":"A Mathematical Model and Calibration Procedure for Galvanometric Laser Scanning Systems","publication_year":2011,"publication_date":"2011-01-01","ids":{"openalex":"https://openalex.org/W286770689","doi":"https://doi.org/10.2312/pe/vmv/vmv11/207-214","mag":"286770689"},"language":"en","primary_location":{"is_oa":false,"landing_page_url":"http://dx.doi.org/10.2312/PE/VMV/VMV11/207-214","pdf_url":null,"source":{"id":"https://openalex.org/S4306421152","display_name":"Vision Modeling and Visualization","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false},"type":"article","type_crossref":"proceedings-article","indexed_in":[],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5028215881","display_name":"Alkhazur Manakov","orcid":null},"institutions":[{"id":"https://openalex.org/I91712215","display_name":"Saarland University","ror":"https://ror.org/01jdpyv68","country_code":"DE","type":"education","lineage":["https://openalex.org/I91712215"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Alkhazur Manakov","raw_affiliation_strings":["Saarland University, Saarbr\u00fccken, Germany"],"affiliations":[{"raw_affiliation_string":"Saarland University, Saarbr\u00fccken, Germany","institution_ids":["https://openalex.org/I91712215"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5105697746","display_name":"Hans\u2010Peter Seidel","orcid":null},"institutions":[{"id":"https://openalex.org/I4210109712","display_name":"Max Planck Institute for Informatics","ror":"https://ror.org/01w19ak89","country_code":"DE","type":"facility","lineage":["https://openalex.org/I149899117","https://openalex.org/I4210109712"]},{"id":"https://openalex.org/I149899117","display_name":"Max Planck Society","ror":"https://ror.org/01hhn8329","country_code":"DE","type":"nonprofit","lineage":["https://openalex.org/I149899117"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Hans-Peter Seidel","raw_affiliation_strings":["Computer Graphics, MPI for Informatics, Max Planck Society"],"affiliations":[{"raw_affiliation_string":"Computer Graphics, MPI for Informatics, Max Planck Society","institution_ids":["https://openalex.org/I4210109712","https://openalex.org/I149899117"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5077565642","display_name":"Ivo Ihrke","orcid":"https://orcid.org/0000-0002-1011-3100"},"institutions":[{"id":"https://openalex.org/I4210109712","display_name":"Max Planck Institute for Informatics","ror":"https://ror.org/01w19ak89","country_code":"DE","type":"facility","lineage":["https://openalex.org/I149899117","https://openalex.org/I4210109712"]},{"id":"https://openalex.org/I149899117","display_name":"Max Planck Society","ror":"https://ror.org/01hhn8329","country_code":"DE","type":"nonprofit","lineage":["https://openalex.org/I149899117"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Ivo Ihrke","raw_affiliation_strings":["Computer Graphics, MPI for Informatics, Max Planck Society"],"affiliations":[{"raw_affiliation_string":"Computer Graphics, MPI for Informatics, Max Planck Society","institution_ids":["https://openalex.org/I4210109712","https://openalex.org/I149899117"]}]}],"institution_assertions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.965,"has_fulltext":false,"cited_by_count":31,"citation_normalized_percentile":{"value":0.976526,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":92,"max":93},"biblio":{"volume":null,"issue":null,"first_page":"207","last_page":"214"},"is_retracted":false,"is_paratext":false,"primary_topic":{"id":"https://openalex.org/T13049","display_name":"Surface Roughness and Optical Measurements","score":0.9967,"subfield":{"id":"https://openalex.org/subfields/2206","display_name":"Computational Mechanics"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T13049","display_name":"Surface Roughness and Optical Measurements","score":0.9967,"subfield":{"id":"https://openalex.org/subfields/2206","display_name":"Computational Mechanics"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12153","display_name":"Advanced Optical Sensing Technologies","score":0.9949,"subfield":{"id":"https://openalex.org/subfields/3105","display_name":"Instrumentation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11583","display_name":"Advanced Measurement and Metrology Techniques","score":0.9948,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/laser-scanning","display_name":"Laser Scanning","score":0.506467}],"concepts":[{"id":"https://openalex.org/C165838908","wikidata":"https://www.wikidata.org/wiki/Q736777","display_name":"Calibration","level":2,"score":0.68330145},{"id":"https://openalex.org/C141349535","wikidata":"https://www.wikidata.org/wiki/Q1361664","display_name":"Laser scanning","level":3,"score":0.506467},{"id":"https://openalex.org/C520434653","wikidata":"https://www.wikidata.org/wiki/Q38867","display_name":"Laser","level":2,"score":0.46759126},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.46549448},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.36961526},{"id":"https://openalex.org/C62649853","wikidata":"https://www.wikidata.org/wiki/Q199687","display_name":"Remote sensing","level":1,"score":0.32018828},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.2241984},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.20869535},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.1467995},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.12300795}],"mesh":[],"locations_count":1,"locations":[{"is_oa":false,"landing_page_url":"http://dx.doi.org/10.2312/PE/VMV/VMV11/207-214","pdf_url":null,"source":{"id":"https://openalex.org/S4306421152","display_name":"Vision Modeling and Visualization","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","score":0.45,"display_name":"Affordable and clean energy"}],"grants":[],"datasets":[],"versions":[],"referenced_works_count":10,"referenced_works":["https://openalex.org/W1550475976","https://openalex.org/W1742256689","https://openalex.org/W1970481007","https://openalex.org/W2044483434","https://openalex.org/W2163213698","https://openalex.org/W2265260652","https://openalex.org/W2292442950","https://openalex.org/W2938795446","https://openalex.org/W3101809477","https://openalex.org/W988781260"],"related_works":["https://openalex.org/W995702509","https://openalex.org/W989318130","https://openalex.org/W973303682","https://openalex.org/W959835653","https://openalex.org/W256510078","https://openalex.org/W241227628","https://openalex.org/W2406739642","https://openalex.org/W2057173134","https://openalex.org/W2049234337","https://openalex.org/W1541767376","https://openalex.org/W1534259512","https://openalex.org/W1515311732","https://openalex.org/W1514666115","https://openalex.org/W1506351210","https://openalex.org/W1501354459","https://openalex.org/W1038866230","https://openalex.org/W1032956294","https://openalex.org/W1026642015","https://openalex.org/W1017399758","https://openalex.org/W1003112372"],"abstract_inverted_index":null,"cited_by_api_url":"https://api.openalex.org/works?filter=cites:W286770689","counts_by_year":[{"year":2024,"cited_by_count":5},{"year":2023,"cited_by_count":3},{"year":2022,"cited_by_count":2},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":3},{"year":2019,"cited_by_count":4},{"year":2018,"cited_by_count":4},{"year":2017,"cited_by_count":1},{"year":2016,"cited_by_count":4},{"year":2015,"cited_by_count":1},{"year":2014,"cited_by_count":1},{"year":2013,"cited_by_count":1},{"year":2012,"cited_by_count":1}],"updated_date":"2025-01-05T08:29:26.399940","created_date":"2016-06-24"}