乐胖代购免代理版

{"id":"https://openalex.org/W2750871018","doi":"https://doi.org/10.20965/ijat.2017.p0761","title":"Cutting Tool Edge and Textured Surface Measurements with a Point Autofocus Probe","display_name":"Cutting Tool Edge and Textured Surface Measurements with a Point Autofocus Probe","publication_year":2017,"publication_date":"2017-08-30","ids":{"openalex":"https://openalex.org/W2750871018","doi":"https://doi.org/10.20965/ijat.2017.p0761","mag":"2750871018"},"language":"en","primary_location":{"is_oa":true,"landing_page_url":"https://doi.org/10.20965/ijat.2017.p0761","pdf_url":null,"source":{"id":"https://openalex.org/S2764525154","display_name":"International Journal of Automation Technology","issn_l":"1881-7629","issn":["1881-7629","1883-8022"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4324309662","host_organization_name":"Fuji Technology Press Ltd.","host_organization_lineage":["https://openalex.org/P4324309662"],"host_organization_lineage_names":["Fuji Technology Press Ltd."],"type":"journal"},"license":"cc-by-nd","license_id":"https://openalex.org/licenses/cc-by-nd","version":"publishedVersion","is_accepted":true,"is_published":true},"type":"article","type_crossref":"journal-article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"diamond","oa_url":"https://doi.org/10.20965/ijat.2017.p0761","any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5106228063","display_name":"Katsuhiro Miura","orcid":"https://orcid.org/0000-0002-1952-1370"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Katsuhiro Miura","raw_affiliation_strings":[],"affiliations":[]},{"author_position":"middle","author":{"id":"https://openalex.org/A5064519452","display_name":"Atsuko Nose","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Atsuko Nose","raw_affiliation_strings":[],"affiliations":[]},{"author_position":"middle","author":{"id":"https://openalex.org/A5054054935","display_name":"Hirofumi Suzuki","orcid":"https://orcid.org/0000-0003-0002-9105"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Hirofumi Suzuki","raw_affiliation_strings":[],"affiliations":[]},{"author_position":"last","author":{"id":"https://openalex.org/A5052073779","display_name":"Mutsumi Okada","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Mutsumi Okada","raw_affiliation_strings":[],"affiliations":[]}],"institution_assertions":[],"countries_distinct_count":0,"institutions_distinct_count":0,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":{"value":0,"currency":"USD","value_usd":0,"provenance":"doaj"},"apc_paid":null,"fwci":0.36,"has_fulltext":false,"cited_by_count":9,"citation_normalized_percentile":{"value":0.723271,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":84,"max":85},"biblio":{"volume":"11","issue":"5","first_page":"761","last_page":"765"},"is_retracted":false,"is_paratext":false,"primary_topic":{"id":"https://openalex.org/T11583","display_name":"Advanced Measurement and Metrology Techniques","score":0.9957,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11583","display_name":"Advanced Measurement and Metrology Techniques","score":0.9957,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13049","display_name":"Surface Roughness and Optical Measurements","score":0.9954,"subfield":{"id":"https://openalex.org/subfields/2206","display_name":"Computational Mechanics"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10638","display_name":"Optical measurement and interference techniques","score":0.9948,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/stylus","display_name":"Stylus","score":0.9447899},{"id":"https://openalex.org/keywords/autofocus","display_name":"Autofocus","score":0.61531746},{"id":"https://openalex.org/keywords/cutting-tool","display_name":"Cutting tool","score":0.49763897},{"id":"https://openalex.org/keywords/surface-metrology","display_name":"Surface Metrology","score":0.42821357}],"concepts":[{"id":"https://openalex.org/C164086593","wikidata":"https://www.wikidata.org/wiki/Q1227035","display_name":"Stylus","level":2,"score":0.9447899},{"id":"https://openalex.org/C162307627","wikidata":"https://www.wikidata.org/wiki/Q204833","display_name":"Enhanced Data Rates for GSM Evolution","level":2,"score":0.6881592},{"id":"https://openalex.org/C523214423","wikidata":"https://www.wikidata.org/wiki/Q192047","display_name":"Machining","level":2,"score":0.6617412},{"id":"https://openalex.org/C107365816","wikidata":"https://www.wikidata.org/wiki/Q114817","display_name":"Surface roughness","level":2,"score":0.6158954},{"id":"https://openalex.org/C103764139","wikidata":"https://www.wikidata.org/wiki/Q210008","display_name":"Autofocus","level":3,"score":0.61531746},{"id":"https://openalex.org/C71039073","wikidata":"https://www.wikidata.org/wiki/Q3439090","display_name":"Surface finish","level":2,"score":0.56903523},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.5198946},{"id":"https://openalex.org/C2780383046","wikidata":"https://www.wikidata.org/wiki/Q1760958","display_name":"Cutting tool","level":2,"score":0.49763897},{"id":"https://openalex.org/C28719098","wikidata":"https://www.wikidata.org/wiki/Q44946","display_name":"Point (geometry)","level":2,"score":0.47043583},{"id":"https://openalex.org/C2777625669","wikidata":"https://www.wikidata.org/wiki/Q7645991","display_name":"Surface metrology","level":4,"score":0.42821357},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.4177634},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.2602411},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.25014102},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.21323007},{"id":"https://openalex.org/C192209626","wikidata":"https://www.wikidata.org/wiki/Q190909","display_name":"Focus (optics)","level":2,"score":0.19683602},{"id":"https://openalex.org/C79261456","wikidata":"https://www.wikidata.org/wiki/Q443756","display_name":"Profilometer","level":3,"score":0.191567},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.12676013},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.081293344},{"id":"https://openalex.org/C191897082","wikidata":"https://www.wikidata.org/wiki/Q11467","display_name":"Metallurgy","level":1,"score":0.07365918},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.056408674}],"mesh":[],"locations_count":1,"locations":[{"is_oa":true,"landing_page_url":"https://doi.org/10.20965/ijat.2017.p0761","pdf_url":null,"source":{"id":"https://openalex.org/S2764525154","display_name":"International Journal of Automation Technology","issn_l":"1881-7629","issn":["1881-7629","1883-8022"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4324309662","host_organization_name":"Fuji Technology Press Ltd.","host_organization_lineage":["https://openalex.org/P4324309662"],"host_organization_lineage_names":["Fuji Technology Press Ltd."],"type":"journal"},"license":"cc-by-nd","license_id":"https://openalex.org/licenses/cc-by-nd","version":"publishedVersion","is_accepted":true,"is_published":true}],"best_oa_location":{"is_oa":true,"landing_page_url":"https://doi.org/10.20965/ijat.2017.p0761","pdf_url":null,"source":{"id":"https://openalex.org/S2764525154","display_name":"International Journal of Automation Technology","issn_l":"1881-7629","issn":["1881-7629","1883-8022"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4324309662","host_organization_name":"Fuji Technology Press Ltd.","host_organization_lineage":["https://openalex.org/P4324309662"],"host_organization_lineage_names":["Fuji Technology Press Ltd."],"type":"journal"},"license":"cc-by-nd","license_id":"https://openalex.org/licenses/cc-by-nd","version":"publishedVersion","is_accepted":true,"is_published":true},"sustainable_development_goals":[],"grants":[],"datasets":[],"versions":[],"referenced_works_count":6,"referenced_works":["https://openalex.org/W2096252275","https://openalex.org/W2270117251","https://openalex.org/W2341541933","https://openalex.org/W2527148877","https://openalex.org/W2575070506","https://openalex.org/W2576521355"],"related_works":["https://openalex.org/W3191625532","https://openalex.org/W2997520000","https://openalex.org/W2902962182","https://openalex.org/W2750871018","https://openalex.org/W2382214133","https://openalex.org/W2132532992","https://openalex.org/W2078237365","https://openalex.org/W2000963316","https://openalex.org/W1987027856","https://openalex.org/W1966848192"],"abstract_inverted_index":{"To":[0],"improve":[1],"surface":[2,133],"roughness,":[3],"machining":[4,83],"efficiency,":[5],"and":[6,14,40,55,77,106,122,131],"accuracy":[7],"of":[8,16,42,80,92,126],"a":[9,17,30,43,89,94,98,107,113],"workpiece,":[10],"measuring":[11,93],"the":[12,38,52,63,75,123,127],"roughness":[13,39,76,124],"contours":[15,41],"cutting":[18,95,114,128],"tool":[19,96,115,129],"edge":[20,45,116,130],"is":[21,71],"crucial.":[22],"However,":[23],"it":[24],"has":[25],"not":[26],"been":[27],"easy":[28],"for":[29,46,62,74,117],"contact":[31,53],"stylus":[32,54],"or":[33],"non-contact":[34,64],"methods":[35],"to":[36],"measure":[37],"sharp":[44],"two":[47],"reasons:":[48],"doing":[49],"so":[50],"damages":[51],"steep":[56],"angles":[57],"produce":[58],"poor":[59],"reflected":[60],"rays":[61],"method.":[65],"A":[66],"point":[67],"autofocus":[68],"probe":[69],"(PAP)":[70],"widely":[72],"used":[73],"contour":[78],"measurements":[79],"various":[81],"precision":[82],"surfaces.":[84],"The":[85],"authors":[86],"have":[87],"developed":[88],"new":[90],"method":[91,99],"edge,":[97],"using":[100],"PAP":[101],"with":[102],"three-axis":[103],"liner":[104],"stages":[105],"rotary":[108],"stage.":[109],"In":[110],"this":[111],"study,":[112],"micro-fabrication":[118],"was":[119],"precisely":[120],"measured,":[121],"relationships":[125],"workpiece":[132],"were":[134],"quantitatively":[135],"evaluated.":[136]},"cited_by_api_url":"https://api.openalex.org/works?filter=cites:W2750871018","counts_by_year":[{"year":2024,"cited_by_count":2},{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":3},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":1}],"updated_date":"2025-01-16T01:56:28.369468","created_date":"2017-09-15"}