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{"id":"https://openalex.org/W2131085918","doi":"https://doi.org/10.1587/transfun.e94.a.2537","title":"Extracting Device-Parameter Variations with RO-Based Sensors","display_name":"Extracting Device-Parameter Variations with RO-Based Sensors","publication_year":2011,"publication_date":"2011-01-01","ids":{"openalex":"https://openalex.org/W2131085918","doi":"https://doi.org/10.1587/transfun.e94.a.2537","mag":"2131085918"},"language":"en","primary_location":{"is_oa":false,"landing_page_url":"https://doi.org/10.1587/transfun.e94.a.2537","pdf_url":null,"source":{"id":"https://openalex.org/S166990724","display_name":"IEICE Transactions on Fundamentals of Electronics Communications and Computer Sciences","issn_l":"0916-8508","issn":["0916-8508","1745-1337"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4320800604","host_organization_name":"Institute of Electronics, Information and Communication Engineers","host_organization_lineage":["https://openalex.org/P4320800604"],"host_organization_lineage_names":["Institute of Electronics, Information and Communication Engineers"],"type":"journal"},"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false},"type":"article","type_crossref":"journal-article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5045069101","display_name":"Ken-ichi Shinkai","orcid":null},"institutions":[{"id":"https://openalex.org/I98285908","display_name":"Osaka University","ror":"https://ror.org/035t8zc32","country_code":"JP","type":"education","lineage":["https://openalex.org/I98285908"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Ken-ichi SHINKAI","raw_affiliation_strings":["Department of Information Systems Engineering, Osaka University"],"affiliations":[{"raw_affiliation_string":"Department of Information Systems Engineering, Osaka University","institution_ids":["https://openalex.org/I98285908"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5002405139","display_name":"Masanori Hashimoto","orcid":"https://orcid.org/0000-0002-0377-2108"},"institutions":[{"id":"https://openalex.org/I98285908","display_name":"Osaka University","ror":"https://ror.org/035t8zc32","country_code":"JP","type":"education","lineage":["https://openalex.org/I98285908"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Masanori HASHIMOTO","raw_affiliation_strings":["Department of Information Systems Engineering, Osaka University"],"affiliations":[{"raw_affiliation_string":"Department of Information Systems Engineering, Osaka University","institution_ids":["https://openalex.org/I98285908"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5061693379","display_name":"Takao Onoye","orcid":"https://orcid.org/0000-0002-1894-2448"},"institutions":[{"id":"https://openalex.org/I98285908","display_name":"Osaka University","ror":"https://ror.org/035t8zc32","country_code":"JP","type":"education","lineage":["https://openalex.org/I98285908"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Takao ONOYE","raw_affiliation_strings":["Department of Information Systems Engineering, Osaka University"],"affiliations":[{"raw_affiliation_string":"Department of Information Systems Engineering, Osaka University","institution_ids":["https://openalex.org/I98285908"]}]}],"institution_assertions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.313,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.504194,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":65,"max":72},"biblio":{"volume":"E94-A","issue":"12","first_page":"2537","last_page":"2544"},"is_retracted":false,"is_paratext":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9999,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9999,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.9999,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9997,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/variation","display_name":"Variation (astronomy)","score":0.52970177}],"concepts":[{"id":"https://openalex.org/C167928553","wikidata":"https://www.wikidata.org/wiki/Q1376021","display_name":"Estimation theory","level":2,"score":0.6100177},{"id":"https://openalex.org/C2778334786","wikidata":"https://www.wikidata.org/wiki/Q1586270","display_name":"Variation (astronomy)","level":2,"score":0.52970177},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.5096564},{"id":"https://openalex.org/C22679943","wikidata":"https://www.wikidata.org/wiki/Q159375","display_name":"Standard deviation","level":2,"score":0.5008292},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5003691},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.46554148},{"id":"https://openalex.org/C96250715","wikidata":"https://www.wikidata.org/wiki/Q965330","display_name":"Estimation","level":2,"score":0.41773835},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.30991513},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.2986102},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1776337},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.12418604},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.06673053},{"id":"https://openalex.org/C201995342","wikidata":"https://www.wikidata.org/wiki/Q682496","display_name":"Systems engineering","level":1,"score":0.0},{"id":"https://openalex.org/C44870925","wikidata":"https://www.wikidata.org/wiki/Q37547","display_name":"Astrophysics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"is_oa":false,"landing_page_url":"https://doi.org/10.1587/transfun.e94.a.2537","pdf_url":null,"source":{"id":"https://openalex.org/S166990724","display_name":"IEICE Transactions on Fundamentals of Electronics Communications and Computer Sciences","issn_l":"0916-8508","issn":["0916-8508","1745-1337"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4320800604","host_organization_name":"Institute of Electronics, Information and Communication Engineers","host_organization_lineage":["https://openalex.org/P4320800604"],"host_organization_lineage_names":["Institute of Electronics, Information and Communication Engineers"],"type":"journal"},"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false}],"best_oa_location":null,"sustainable_development_goals":[],"grants":[],"datasets":[],"versions":[],"referenced_works_count":12,"referenced_works":["https://openalex.org/W1967709031","https://openalex.org/W1990845788","https://openalex.org/W1991421648","https://openalex.org/W2012062489","https://openalex.org/W2099273140","https://openalex.org/W2099320289","https://openalex.org/W2105524902","https://openalex.org/W2140823559","https://openalex.org/W2150526221","https://openalex.org/W2153292994","https://openalex.org/W2154802582","https://openalex.org/W2171086277"],"related_works":["https://openalex.org/W3196905815","https://openalex.org/W3181247111","https://openalex.org/W3001063351","https://openalex.org/W2386430105","https://openalex.org/W2384358604","https://openalex.org/W2356521405","https://openalex.org/W2351370765","https://openalex.org/W2321594810","https://openalex.org/W2038534795","https://openalex.org/W1567829292"],"abstract_inverted_index":{"Device-parameter":[0],"estimation":[1,21,53,62,105],"sensors":[2,37,67],"inside":[3],"a":[4,17,60],"chip":[5],"are":[6,38],"gaining":[7],"its":[8],"importance":[9],"as":[10],"the":[11,33,49,52,76,81,85,89,97,101,112],"post-fabrication":[12],"tuning":[13],"is":[14,29],"becoming":[15],"of":[16,22,35,51,84,103],"practical":[18],"use.":[19],"In":[20,55],"variational":[23],"parameters":[24,79],"using":[25,88],"on-chip":[26,65],"sensors,":[27],"it":[28],"often":[30],"assumed":[31],"that":[32,96,115],"outputs":[34],"variation":[36,66,78],"not":[39],"affected":[40],"by":[41,106],"random":[42,45,70,86,117],"variations.":[43,118],"However,":[44],"variations":[46],"can":[47],"deteriorate":[48],"accuracy":[50,102],"result.":[54],"this":[56],"paper,":[57],"we":[58],"propose":[59],"device-parameter":[61,104],"method":[63,74,99,114],"with":[64],"explicitly":[68],"considering":[69],"variability.":[71],"The":[72],"proposed":[73,98],"derives":[75],"global":[77],"and":[80],"standard":[82],"deviation":[83],"variability":[87],"maximum":[90],"likelihood":[91],"estimation.":[92],"We":[93],"experimentally":[94],"verified":[95],"improves":[100],"11.1":[107],"to":[108,111],"73.4%":[109],"compared":[110],"conventional":[113],"neglects":[116]},"cited_by_api_url":"https://api.openalex.org/works?filter=cites:W2131085918","counts_by_year":[{"year":2013,"cited_by_count":1}],"updated_date":"2024-12-09T10:34:24.492553","created_date":"2016-06-24"}