{"id":"https://openalex.org/W2525213432","doi":"https://doi.org/10.1587/transele.e99.c.1219","title":"Power Supply Voltage Control for Eliminating Overkills and Underkills in Delay Fault Testing","display_name":"Power Supply Voltage Control for Eliminating Overkills and Underkills in Delay Fault Testing","publication_year":2016,"publication_date":"2016-01-01","ids":{"openalex":"https://openalex.org/W2525213432","doi":"https://doi.org/10.1587/transele.e99.c.1219","mag":"2525213432"},"language":"en","primary_location":{"is_oa":false,"landing_page_url":"https://doi.org/10.1587/transele.e99.c.1219","pdf_url":null,"source":{"id":"https://openalex.org/S2489501747","display_name":"IEICE Transactions on Electronics","issn_l":"0916-8524","issn":["0916-8524","1745-1353"],"is_oa":false,"is_in_doaj":false,"is_indexed_in_scopus":true,"is_core":true,"host_organization":"https://openalex.org/P4320800604","host_organization_name":"Institute of Electronics, Information and Communication Engineers","host_organization_lineage":["https://openalex.org/P4320800604"],"host_organization_lineage_names":["Institute of Electronics, Information and Communication Engineers"],"type":"journal"},"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false},"type":"article","type_crossref":"journal-article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5109203606","display_name":"Masahiro Ishida","orcid":null},"institutions":[{"id":"https://openalex.org/I177844149","display_name":"Advantest (Singapore)","ror":"https://ror.org/04dyk5z88","country_code":"SG","type":"company","lineage":["https://openalex.org/I177844149","https://openalex.org/I4210103901"]}],"countries":["SG"],"is_corresponding":false,"raw_author_name":"Masahiro ISHIDA","raw_affiliation_strings":["ADVANTEST Corporation"],"affiliations":[{"raw_affiliation_string":"ADVANTEST Corporation","institution_ids":["https://openalex.org/I177844149"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5071803491","display_name":"Toru Nakura","orcid":"https://orcid.org/0000-0001-5945-3918"},"institutions":[{"id":"https://openalex.org/I74801974","display_name":"The University of Tokyo","ror":"https://ror.org/057zh3y96","country_code":"JP","type":"funder","lineage":["https://openalex.org/I74801974"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Toru NAKURA","raw_affiliation_strings":["The The University of Tokyo"],"affiliations":[{"raw_affiliation_string":"The The University of Tokyo","institution_ids":["https://openalex.org/I74801974"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5012141183","display_name":"Takashi Kusaka","orcid":"https://orcid.org/0000-0002-2963-3245"},"institutions":[{"id":"https://openalex.org/I177844149","display_name":"Advantest (Singapore)","ror":"https://ror.org/04dyk5z88","country_code":"SG","type":"company","lineage":["https://openalex.org/I177844149","https://openalex.org/I4210103901"]}],"countries":["SG"],"is_corresponding":false,"raw_author_name":"Takashi KUSAKA","raw_affiliation_strings":["ADVANTEST Corporation"],"affiliations":[{"raw_affiliation_string":"ADVANTEST Corporation","institution_ids":["https://openalex.org/I177844149"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5103025045","display_name":"Satoshi Komatsu","orcid":"https://orcid.org/0000-0002-9180-9053"},"institutions":[{"id":"https://openalex.org/I165522056","display_name":"Tokyo Denki University","ror":"https://ror.org/01pa62v70","country_code":"JP","type":"funder","lineage":["https://openalex.org/I165522056"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Satoshi KOMATSU","raw_affiliation_strings":["Tokyo Denki University"],"affiliations":[{"raw_affiliation_string":"Tokyo Denki University","institution_ids":["https://openalex.org/I165522056"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5028680447","display_name":"Kunihiro Asada","orcid":"https://orcid.org/0000-0002-1150-0241"},"institutions":[{"id":"https://openalex.org/I74801974","display_name":"The University of Tokyo","ror":"https://ror.org/057zh3y96","country_code":"JP","type":"funder","lineage":["https://openalex.org/I74801974"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Kunihiro ASADA","raw_affiliation_strings":["The The University of Tokyo"],"affiliations":[{"raw_affiliation_string":"The The University of Tokyo","institution_ids":["https://openalex.org/I74801974"]}]}],"institution_assertions":[],"countries_distinct_count":2,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.0,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":0,"max":66},"biblio":{"volume":"E99.C","issue":"10","first_page":"1219","last_page":"1225"},"is_retracted":false,"is_paratext":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13293","display_name":"Engineering and Test Systems","score":0.9988,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[],"concepts":[{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.66245},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.647268},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.6075338},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.59735376},{"id":"https://openalex.org/C151799858","wikidata":"https://www.wikidata.org/wiki/Q587008","display_name":"Switched-mode power supply","level":3,"score":0.5195975},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4687175},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3972961},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.32052943},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"is_oa":false,"landing_page_url":"https://doi.org/10.1587/transele.e99.c.1219","pdf_url":null,"source":{"id":"https://openalex.org/S2489501747","display_name":"IEICE Transactions on Electronics","issn_l":"0916-8524","issn":["0916-8524","1745-1353"],"is_oa":false,"is_in_doaj":false,"is_indexed_in_scopus":true,"is_core":true,"host_organization":"https://openalex.org/P4320800604","host_organization_name":"Institute of Electronics, Information and Communication Engineers","host_organization_lineage":["https://openalex.org/P4320800604"],"host_organization_lineage_names":["Institute of Electronics, Information and Communication Engineers"],"type":"journal"},"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false}],"best_oa_location":null,"sustainable_development_goals":[],"grants":[],"datasets":[],"versions":[],"referenced_works_count":6,"referenced_works":["https://openalex.org/W2002510178","https://openalex.org/W2033090586","https://openalex.org/W2071783517","https://openalex.org/W2144026847","https://openalex.org/W2162547872","https://openalex.org/W3151751772"],"related_works":["https://openalex.org/W4376453582","https://openalex.org/W4205240067","https://openalex.org/W318913410","https://openalex.org/W3147033875","https://openalex.org/W2764722704","https://openalex.org/W2740815748","https://openalex.org/W2374901194","https://openalex.org/W2355543518","https://openalex.org/W2131832954","https://openalex.org/W1568390478"],"abstract_inverted_index":{"This":[0],"paper":[1],"proposes":[2],"a":[3,33],"power":[4,22,46,73],"supply":[5,23,47,74],"voltage":[6,48,75],"control":[7],"technique,":[8],"and":[9,17,32,91],"demonstrates":[10],"its":[11],"effectiveness":[12],"for":[13,60,70],"eliminating":[14],"the":[15,21,38,44,50,55,61,66,72,83,104],"overkills":[16,90],"underkills":[18,92],"due":[19],"to":[20],"characteristic":[24],"difference":[25],"between":[26],"an":[27],"automatic":[28],"test":[29],"equipment":[30],"(ATE)":[31],"practical":[34],"operating":[35],"environment":[36],"of":[37,65,89,103],"DUT.":[39,67],"The":[40,68],"proposed":[41,84,105],"method":[42,69,85,106],"controls":[43],"static":[45],"on":[49],"ATE":[51,56],"system,":[52],"so":[53],"that":[54,82],"can":[57,86],"eliminate":[58,87],"misjudges":[59],"Pass":[62],"or":[63],"Fail":[64],"calculating":[71],"is":[76],"also":[77,108],"described.":[78],"Experimental":[79],"results":[80],"show":[81],"89%":[88],"in":[93],"delay":[94],"fault":[95],"testing":[96],"with":[97],"105":[98],"real":[99],"silicon":[100],"devices.":[101],"Limitations":[102],"are":[107],"discussed.":[109]},"abstract_inverted_index_v3":null,"cited_by_api_url":"https://api.openalex.org/works?filter=cites:W2525213432","counts_by_year":[],"updated_date":"2025-01-24T11:44:10.934944","created_date":"2016-10-07"}