乐胖代购免代理版

{"id":"https://openalex.org/W2097429211","doi":"https://doi.org/10.1504/ijcat.2006.009391","title":"Distributed sensor system for fault detection and isolation in multistage manufacturing systems","display_name":"Distributed sensor system for fault detection and isolation in multistage manufacturing systems","publication_year":2006,"publication_date":"2006-01-01","ids":{"openalex":"https://openalex.org/W2097429211","doi":"https://doi.org/10.1504/ijcat.2006.009391","mag":"2097429211"},"language":"en","primary_location":{"is_oa":false,"landing_page_url":"https://doi.org/10.1504/ijcat.2006.009391","pdf_url":null,"source":{"id":"https://openalex.org/S4210207686","display_name":"International Journal of Computer Applications in Technology","issn_l":"0952-8091","issn":["0952-8091","1741-5047"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310317825","host_organization_name":"Inderscience Publishers","host_organization_lineage":["https://openalex.org/P4310317825"],"host_organization_lineage_names":["Inderscience Publishers"],"type":"journal"},"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false},"type":"article","type_crossref":"journal-article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5054008223","display_name":"Shichang Du","orcid":"https://orcid.org/0000-0003-2408-722X"},"institutions":[{"id":"https://openalex.org/I183067930","display_name":"Shanghai Jiao Tong University","ror":"https://ror.org/0220qvk04","country_code":"CN","type":"education","lineage":["https://openalex.org/I183067930"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Du Shi-Chang","raw_affiliation_strings":["Department of Industrial Engineering and Management, School of Mechanical Engineering, Shanghai Jiaotong University, Shanghai, PR China.#TAB#"],"affiliations":[{"raw_affiliation_string":"Department of Industrial Engineering and Management, School of Mechanical Engineering, Shanghai Jiaotong University, Shanghai, PR China.#TAB#","institution_ids":["https://openalex.org/I183067930"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5109209610","display_name":"Xi Li-Feng","orcid":null},"institutions":[{"id":"https://openalex.org/I183067930","display_name":"Shanghai Jiao Tong University","ror":"https://ror.org/0220qvk04","country_code":"CN","type":"education","lineage":["https://openalex.org/I183067930"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xi Li-Feng","raw_affiliation_strings":["Department of Industrial Engineering and Management, School of Mechanical Engineering, Shanghai Jiaotong University, Shanghai, PR China.#TAB#"],"affiliations":[{"raw_affiliation_string":"Department of Industrial Engineering and Management, School of Mechanical Engineering, Shanghai Jiaotong University, Shanghai, PR China.#TAB#","institution_ids":["https://openalex.org/I183067930"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100517334","display_name":"Shi Jian-Jun","orcid":null},"institutions":[{"id":"https://openalex.org/I27837315","display_name":"University of Michigan\u2013Ann Arbor","ror":"https://ror.org/00jmfr291","country_code":"US","type":"education","lineage":["https://openalex.org/I27837315"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Shi Jian-Jun","raw_affiliation_strings":["Department of Industrial and Operations Engineering, The University of Michigan Ann Arbor, MI 48109, USA"],"affiliations":[{"raw_affiliation_string":"Department of Industrial and Operations Engineering, The University of Michigan Ann Arbor, MI 48109, USA","institution_ids":["https://openalex.org/I27837315"]}]}],"institution_assertions":[],"countries_distinct_count":2,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":7.234,"has_fulltext":true,"fulltext_origin":"ngrams","cited_by_count":9,"citation_normalized_percentile":{"value":0.899216,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":81,"max":82},"biblio":{"volume":"25","issue":"4","first_page":"182","last_page":"182"},"is_retracted":false,"is_paratext":false,"primary_topic":{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.9982,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.9982,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9868,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11443","display_name":"Advanced Statistical Process Monitoring","score":0.975,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/isolation","display_name":"Isolation","score":0.7115767},{"id":"https://openalex.org/keywords/distributed-manufacturing","display_name":"Distributed manufacturing","score":0.4866053}],"concepts":[{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.7221391},{"id":"https://openalex.org/C24590314","wikidata":"https://www.wikidata.org/wiki/Q336038","display_name":"Wireless sensor network","level":2,"score":0.7126456},{"id":"https://openalex.org/C2775941552","wikidata":"https://www.wikidata.org/wiki/Q25212305","display_name":"Isolation (microbiology)","level":2,"score":0.7115767},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5407877},{"id":"https://openalex.org/C120314980","wikidata":"https://www.wikidata.org/wiki/Q180634","display_name":"Distributed computing","level":1,"score":0.5262001},{"id":"https://openalex.org/C2780530572","wikidata":"https://www.wikidata.org/wiki/Q17010810","display_name":"Distributed manufacturing","level":2,"score":0.4866053},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.44181576},{"id":"https://openalex.org/C555944384","wikidata":"https://www.wikidata.org/wiki/Q249","display_name":"Wireless","level":2,"score":0.4270021},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3827888},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.3775028},{"id":"https://openalex.org/C79403827","wikidata":"https://www.wikidata.org/wiki/Q3988","display_name":"Real-time computing","level":1,"score":0.34061307},{"id":"https://openalex.org/C201995342","wikidata":"https://www.wikidata.org/wiki/Q682496","display_name":"Systems engineering","level":1,"score":0.32560748},{"id":"https://openalex.org/C31258907","wikidata":"https://www.wikidata.org/wiki/Q1301371","display_name":"Computer network","level":1,"score":0.21349022},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.18311766},{"id":"https://openalex.org/C117671659","wikidata":"https://www.wikidata.org/wiki/Q11049265","display_name":"Manufacturing engineering","level":1,"score":0.17143112},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0},{"id":"https://openalex.org/C89423630","wikidata":"https://www.wikidata.org/wiki/Q7193","display_name":"Microbiology","level":1,"score":0.0},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"is_oa":false,"landing_page_url":"https://doi.org/10.1504/ijcat.2006.009391","pdf_url":null,"source":{"id":"https://openalex.org/S4210207686","display_name":"International Journal of Computer Applications in Technology","issn_l":"0952-8091","issn":["0952-8091","1741-5047"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310317825","host_organization_name":"Inderscience Publishers","host_organization_lineage":["https://openalex.org/P4310317825"],"host_organization_lineage_names":["Inderscience Publishers"],"type":"journal"},"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/9","display_name":"Industry, innovation and infrastructure","score":0.62}],"grants":[],"datasets":[],"versions":[],"referenced_works_count":27,"referenced_works":["https://openalex.org/W152145192","https://openalex.org/W1746712591","https://openalex.org/W1991296187","https://openalex.org/W2003274998","https://openalex.org/W2003506352","https://openalex.org/W2004026437","https://openalex.org/W2017334578","https://openalex.org/W2019952623","https://openalex.org/W2029866075","https://openalex.org/W2055921252","https://openalex.org/W2062024414","https://openalex.org/W2071309271","https://openalex.org/W2075628905","https://openalex.org/W2114001875","https://openalex.org/W2115758294","https://openalex.org/W2118395565","https://openalex.org/W2143022286","https://openalex.org/W2145816995","https://openalex.org/W2152820192","https://openalex.org/W2155728063","https://openalex.org/W2155867868","https://openalex.org/W2163496225","https://openalex.org/W2168452204","https://openalex.org/W2571446175","https://openalex.org/W2573715514","https://openalex.org/W2797948216","https://openalex.org/W3097925195"],"related_works":["https://openalex.org/W2989915292","https://openalex.org/W2890570089","https://openalex.org/W2487222174","https://openalex.org/W2415102733","https://openalex.org/W2394779770","https://openalex.org/W2123050621","https://openalex.org/W2073793005","https://openalex.org/W2072346427","https://openalex.org/W2068583297","https://openalex.org/W1975451135"],"abstract_inverted_index":{"With":[0],"rapid":[1],"innovations":[2],"in":[3,10,32],"sensing":[4],"technology":[5],"and":[6,16,30,54,65,91],"the":[7,60,96],"rising":[8],"complexity":[9],"manufacturing":[11],"processes,":[12],"increasingly":[13],"less":[14],"expensive":[15],"smart":[17],"devices":[18],"with":[19],"multiple":[20],"heterogeneous":[21],"on-board":[22],"sensors,":[23],"networked":[24],"through":[25],"wired":[26],"or":[27],"wireless":[28],"links":[29],"deployable":[31],"large":[33],"numbers,":[34],"are":[35,77,100],"distributed":[36,74],"throughout":[37],"complex":[38],"Multistage":[39],"Manufacturing":[40],"Systems":[41],"(MMSs).":[42],"The":[43,56],"Distributed":[44],"Sensor":[45],"System":[46],"(DSS)":[47],"provides":[48],"unprecedented":[49],"opportunities":[50],"for":[51],"fault":[52],"detection":[53],"isolation.":[55],"related":[57,68],"issues":[58],"of":[59,72,83],"state-of-the-art":[61],"practice,":[62],"research":[63,98],"challenges":[64],"future":[66],"directions":[67],"to":[69],"software":[70],"infrastructure":[71],"a":[73],"sensor":[75],"network":[76],"discussed,":[78],"which":[79],"include":[80],"optimal":[81],"design":[82,85],"DSSs,":[84],"criteria,":[86],"data":[87],"management,":[88],"information":[89],"processing":[90],"decision-making.":[92],"Applications":[93],"based":[94],"on":[95],"authors'":[97],"experiences":[99],"also":[101],"given.":[102]},"cited_by_api_url":"https://api.openalex.org/works?filter=cites:W2097429211","counts_by_year":[{"year":2016,"cited_by_count":1}],"updated_date":"2024-12-10T20:23:39.033995","created_date":"2016-06-24"}