{"id":"https://openalex.org/W2024321164","doi":"https://doi.org/10.1198/tech.2003.s14","title":"Statistical Methods for the Analysis of Repeated Measurements","display_name":"Statistical Methods for the Analysis of Repeated Measurements","publication_year":2003,"publication_date":"2003-02-01","ids":{"openalex":"https://openalex.org/W2024321164","doi":"https://doi.org/10.1198/tech.2003.s14","mag":"2024321164"},"language":"en","primary_location":{"is_oa":false,"landing_page_url":"https://doi.org/10.1198/tech.2003.s14","pdf_url":null,"source":{"id":"https://openalex.org/S985303","display_name":"Technometrics","issn_l":"0040-1706","issn":["0040-1706","1537-2723"],"is_oa":false,"is_in_doaj":false,"is_indexed_in_scopus":true,"is_core":true,"host_organization":"https://openalex.org/P4310320547","host_organization_name":"Taylor & Francis","host_organization_lineage":["https://openalex.org/P4310320547"],"host_organization_lineage_names":["Taylor & Francis"],"type":"journal"},"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false},"type":"article","type_crossref":"journal-article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5066308422","display_name":"James R. Kenyon","orcid":null},"institutions":[{"id":"https://openalex.org/I157075465","display_name":"Bristol-Myers Squibb (Germany)","ror":"https://ror.org/032hfv632","country_code":"DE","type":"company","lineage":["https://openalex.org/I157075465","https://openalex.org/I4210091812"]}],"countries":["DE"],"is_corresponding":true,"raw_author_name":"James R Kenyon","raw_affiliation_strings":["Bristol-Myers Squibb Company"],"affiliations":[{"raw_affiliation_string":"Bristol-Myers Squibb Company","institution_ids":["https://openalex.org/I157075465"]}]}],"institution_assertions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5066308422"],"corresponding_institution_ids":["https://openalex.org/I157075465"],"apc_list":null,"apc_paid":null,"fwci":0.542,"has_fulltext":true,"fulltext_origin":"ngrams","cited_by_count":8,"citation_normalized_percentile":{"value":0.537926,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":78,"max":79},"biblio":{"volume":"45","issue":"1","first_page":"99","last_page":"100"},"is_retracted":false,"is_paratext":false,"primary_topic":{"id":"https://openalex.org/T11871","display_name":"Advanced Statistical Methods and Models","score":0.4624,"subfield":{"id":"https://openalex.org/subfields/2613","display_name":"Statistics and Probability"},"field":{"id":"https://openalex.org/fields/26","display_name":"Mathematics"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11871","display_name":"Advanced Statistical Methods and Models","score":0.4624,"subfield":{"id":"https://openalex.org/subfields/2613","display_name":"Statistics and Probability"},"field":{"id":"https://openalex.org/fields/26","display_name":"Mathematics"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/statistical-analysis","display_name":"Statistical Analysis","score":0.4791319}],"concepts":[{"id":"https://openalex.org/C2986587452","wikidata":"https://www.wikidata.org/wiki/Q938438","display_name":"Statistical analysis","level":2,"score":0.4791319},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.4734687},{"id":"https://openalex.org/C149782125","wikidata":"https://www.wikidata.org/wiki/Q160039","display_name":"Econometrics","level":1,"score":0.42877778},{"id":"https://openalex.org/C99476002","wikidata":"https://www.wikidata.org/wiki/Q42297","display_name":"Analysis of variance","level":2,"score":0.41199613},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3943752},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.3595451}],"mesh":[],"locations_count":1,"locations":[{"is_oa":false,"landing_page_url":"https://doi.org/10.1198/tech.2003.s14","pdf_url":null,"source":{"id":"https://openalex.org/S985303","display_name":"Technometrics","issn_l":"0040-1706","issn":["0040-1706","1537-2723"],"is_oa":false,"is_in_doaj":false,"is_indexed_in_scopus":true,"is_core":true,"host_organization":"https://openalex.org/P4310320547","host_organization_name":"Taylor & Francis","host_organization_lineage":["https://openalex.org/P4310320547"],"host_organization_lineage_names":["Taylor & Francis"],"type":"journal"},"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false}],"best_oa_location":null,"sustainable_development_goals":[],"grants":[],"datasets":[],"versions":[],"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W603619847","https://openalex.org/W564821042","https://openalex.org/W4381305610","https://openalex.org/W4304194915","https://openalex.org/W2197411875","https://openalex.org/W2035726619","https://openalex.org/W2028010445","https://openalex.org/W2020531355","https://openalex.org/W2012555585","https://openalex.org/W1493147895"],"abstract_inverted_index":{"(2003).":[0],"Statistical":[1],"Methods":[2],"for":[3],"the":[4],"Analysis":[5],"of":[6],"Repeated":[7],"Measurements.":[8],"Technometrics:":[9],"Vol.":[10],"45,":[11],"No.":[12],"1,":[13],"pp.":[14],"99-100.":[15]},"cited_by_api_url":"https://api.openalex.org/works?filter=cites:W2024321164","counts_by_year":[{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":1}],"updated_date":"2025-01-22T17:23:07.564737","created_date":"2016-06-24"}