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{"id":"https://openalex.org/W2086633051","doi":"https://doi.org/10.1166/jolpe.2010.1109","title":"On-Chip Process Variability Monitoring Flow","display_name":"On-Chip Process Variability Monitoring Flow","publication_year":2010,"publication_date":"2010-12-01","ids":{"openalex":"https://openalex.org/W2086633051","doi":"https://doi.org/10.1166/jolpe.2010.1109","mag":"2086633051"},"language":"en","primary_location":{"is_oa":false,"landing_page_url":"https://doi.org/10.1166/jolpe.2010.1109","pdf_url":null,"source":{"id":"https://openalex.org/S19681352","display_name":"Journal of Low Power Electronics","issn_l":"1546-1998","issn":["1546-1998","1546-2005"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310321646","host_organization_name":"American Scientific Publishers","host_organization_lineage":["https://openalex.org/P4310321646"],"host_organization_lineage_names":["American Scientific Publishers"],"type":"journal"},"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false},"type":"article","type_crossref":"journal-article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5024156598","display_name":"Nabila Moubdi","orcid":null},"institutions":[{"id":"https://openalex.org/I4210094169","display_name":"STMicroelectronics (India)","ror":"https://ror.org/00ft7bw25","country_code":"IN","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210094169"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Nabila Moubdi","raw_affiliation_strings":["STMicroelectronics, Crolles"],"affiliations":[{"raw_affiliation_string":"STMicroelectronics, Crolles","institution_ids":["https://openalex.org/I4210094169"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5015351510","display_name":"Philippe Maurine","orcid":"https://orcid.org/0000-0002-9706-5710"},"institutions":[{"id":"https://openalex.org/I4210145979","display_name":"Laboratoire de Conception et d'Int\u00e9gration des Syst\u00e8mes","ror":"https://ror.org/04eg25g76","country_code":"FR","type":"facility","lineage":["https://openalex.org/I106785703","https://openalex.org/I4210145979","https://openalex.org/I899635006"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Philippe Maurine","raw_affiliation_strings":["Conception et Test de Syst\u00e8mes MICro\u00e9lectroniques"],"affiliations":[{"raw_affiliation_string":"Conception et Test de Syst\u00e8mes MICro\u00e9lectroniques","institution_ids":["https://openalex.org/I4210145979"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5103334240","display_name":"Robin Wilson","orcid":null},"institutions":[{"id":"https://openalex.org/I4210094169","display_name":"STMicroelectronics (India)","ror":"https://ror.org/00ft7bw25","country_code":"IN","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210094169"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Robin Wilson","raw_affiliation_strings":["STMicroelectronics, Crolles"],"affiliations":[{"raw_affiliation_string":"STMicroelectronics, Crolles","institution_ids":["https://openalex.org/I4210094169"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5113676180","display_name":"Sylvain Engels","orcid":null},"institutions":[{"id":"https://openalex.org/I4210094169","display_name":"STMicroelectronics (India)","ror":"https://ror.org/00ft7bw25","country_code":"IN","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210094169"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Sylvain Engels","raw_affiliation_strings":["STMicroelectronics, Crolles"],"affiliations":[{"raw_affiliation_string":"STMicroelectronics, Crolles","institution_ids":["https://openalex.org/I4210094169"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5108376202","display_name":"Nadine Az\u00e9mard","orcid":null},"institutions":[{"id":"https://openalex.org/I4210145979","display_name":"Laboratoire de Conception et d'Int\u00e9gration des Syst\u00e8mes","ror":"https://ror.org/04eg25g76","country_code":"FR","type":"facility","lineage":["https://openalex.org/I106785703","https://openalex.org/I4210145979","https://openalex.org/I899635006"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Nadine Azemard","raw_affiliation_strings":["Conception et Test de Syst\u00e8mes MICro\u00e9lectroniques"],"affiliations":[{"raw_affiliation_string":"Conception et Test de Syst\u00e8mes MICro\u00e9lectroniques","institution_ids":["https://openalex.org/I4210145979"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5001872218","display_name":"Vincent Dumettier","orcid":null},"institutions":[{"id":"https://openalex.org/I4210094169","display_name":"STMicroelectronics (India)","ror":"https://ror.org/00ft7bw25","country_code":"IN","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210094169"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Vincent Dumettier","raw_affiliation_strings":["STMicroelectronics, Crolles"],"affiliations":[{"raw_affiliation_string":"STMicroelectronics, Crolles","institution_ids":["https://openalex.org/I4210094169"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5103540124","display_name":"Pierre Busson","orcid":null},"institutions":[{"id":"https://openalex.org/I4210094169","display_name":"STMicroelectronics (India)","ror":"https://ror.org/00ft7bw25","country_code":"IN","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210094169"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Pierre Busson","raw_affiliation_strings":["STMicroelectronics, Crolles"],"affiliations":[{"raw_affiliation_string":"STMicroelectronics, Crolles","institution_ids":["https://openalex.org/I4210094169"]}]}],"institution_assertions":[],"countries_distinct_count":2,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.0,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":0,"max":64},"biblio":{"volume":"6","issue":"4","first_page":"601","last_page":"606"},"is_retracted":false,"is_paratext":false,"primary_topic":{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9985,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9985,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11522","display_name":"VLSI and FPGA Design Techniques","score":0.9971,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9969,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[],"concepts":[{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.6303532},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.5409092},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.45405912},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.117628306},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.06341535}],"mesh":[],"locations_count":1,"locations":[{"is_oa":false,"landing_page_url":"https://doi.org/10.1166/jolpe.2010.1109","pdf_url":null,"source":{"id":"https://openalex.org/S19681352","display_name":"Journal of Low Power Electronics","issn_l":"1546-1998","issn":["1546-1998","1546-2005"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310321646","host_organization_name":"American Scientific Publishers","host_organization_lineage":["https://openalex.org/P4310321646"],"host_organization_lineage_names":["American Scientific Publishers"],"type":"journal"},"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","score":0.88,"display_name":"Affordable and clean energy"}],"grants":[],"datasets":[],"versions":[],"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W2899084033","https://openalex.org/W2748952813","https://openalex.org/W2530322880","https://openalex.org/W2390279801","https://openalex.org/W2382290278","https://openalex.org/W2376932109","https://openalex.org/W2358668433","https://openalex.org/W2350741829","https://openalex.org/W2130043461","https://openalex.org/W2001405890"],"abstract_inverted_index":{"This":[0],"paper":[1,85],"aims":[2,30],"at":[3,31,73],"presenting":[4],"the":[5,9,12,22,27,33,48,88],"benefits":[6],"obtained":[7],"from":[8,110],"implementation":[10],"of":[11,36,91],"on-chip":[13,62],"process":[14,24,54,63],"monitoring":[15,25,55],"techniques":[16],"on":[17,114],"industrial":[18],"integrated":[19,23],"systems.":[20],"Among":[21],"techniques,":[26],"main":[28],"one":[29],"reducing":[32],"supply":[34],"voltage":[35],"fast":[37,115],"circuits":[38],"in":[39,83],"order":[40],"to":[41,60,86,104,112],"reduce":[42],"their":[43],"power":[44],"consumption":[45],"while":[46],"maintaining":[47],"specified":[49],"operating":[50],"frequency.":[51],"The":[52],"proposed":[53],"flow":[56],"includes":[57],"efficient":[58],"methodologies":[59],"gather/sort":[61],"data":[64],"but":[65],"also":[66],"post-silicon":[67],"tuning":[68],"strategies":[69],"and":[70,76],"validation":[71],"methods":[72],"both":[74],"design":[75],"test":[77],"steps.":[78],"Concrete":[79],"results":[80],"are":[81],"introduced":[82],"this":[84],"demonstrate":[87],"added":[89],"value":[90],"such":[92],"a":[93],"methodology.":[94],"More":[95],"precisely,":[96],"it":[97],"is":[98],"shown":[99],"that":[100],"its":[101],"application":[102],"leads":[103],"an":[105],"overall":[106],"energy":[107],"reduction":[108],"ranging":[109],"10%":[111],"20%":[113],"chips.":[116]},"cited_by_api_url":"https://api.openalex.org/works?filter=cites:W2086633051","counts_by_year":[],"updated_date":"2024-12-11T02:36:51.059326","created_date":"2016-06-24"}