{"id":"https://openalex.org/W2978210282","doi":"https://doi.org/10.1145/3386164.3386167","title":"Protection of Memory Using Code Redundancies","display_name":"Protection of Memory Using Code Redundancies","publication_year":2019,"publication_date":"2019-09-25","ids":{"openalex":"https://openalex.org/W2978210282","doi":"https://doi.org/10.1145/3386164.3386167","mag":"2978210282"},"language":"en","primary_location":{"is_oa":false,"landing_page_url":"https://doi.org/10.1145/3386164.3386167","pdf_url":null,"source":null,"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false},"type":"article","type_crossref":"proceedings-article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5074771262","display_name":"Raghad Zenki","orcid":null},"institutions":[{"id":"https://openalex.org/I35870678","display_name":"University of Northampton","ror":"https://ror.org/04jp2hx10","country_code":"GB","type":"education","lineage":["https://openalex.org/I35870678"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"Raghad Zenki","raw_affiliation_strings":["Department of Computing, University of Northampton, Northampton, UK"],"affiliations":[{"raw_affiliation_string":"Department of Computing, University of Northampton, Northampton, UK","institution_ids":["https://openalex.org/I35870678"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5033231796","display_name":"Ola Challabi","orcid":null},"institutions":[{"id":"https://openalex.org/I35870678","display_name":"University of Northampton","ror":"https://ror.org/04jp2hx10","country_code":"GB","type":"education","lineage":["https://openalex.org/I35870678"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"Ola Challabi","raw_affiliation_strings":["Department of Computing, University of Northampton, Northampton, UK"],"affiliations":[{"raw_affiliation_string":"Department of Computing, University of Northampton, Northampton, UK","institution_ids":["https://openalex.org/I35870678"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5035218478","display_name":"Michael Opoku Agyeman","orcid":"https://orcid.org/0000-0002-3734-4451"},"institutions":[{"id":"https://openalex.org/I35870678","display_name":"University of Northampton","ror":"https://ror.org/04jp2hx10","country_code":"GB","type":"education","lineage":["https://openalex.org/I35870678"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"Michael Opoku Agyeman","raw_affiliation_strings":["Department of Computing, University of Northampton, Northampton, UK"],"affiliations":[{"raw_affiliation_string":"Department of Computing, University of Northampton, Northampton, UK","institution_ids":["https://openalex.org/I35870678"]}]}],"institution_assertions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.0,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":0,"max":61},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9999,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9999,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9983,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9939,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/parity-check-matrix","display_name":"Parity-check matrix","score":0.5718598},{"id":"https://openalex.org/keywords/memory-protection","display_name":"Memory Protection","score":0.4317557},{"id":"https://openalex.org/keywords/upset","display_name":"Upset","score":0.4130882}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7349513},{"id":"https://openalex.org/C95925971","wikidata":"https://www.wikidata.org/wiki/Q3100414","display_name":"Parity-check matrix","level":4,"score":0.5718598},{"id":"https://openalex.org/C73150493","wikidata":"https://www.wikidata.org/wiki/Q853922","display_name":"Hamming code","level":4,"score":0.5617422},{"id":"https://openalex.org/C103088060","wikidata":"https://www.wikidata.org/wiki/Q1062839","display_name":"Error detection and correction","level":2,"score":0.5290184},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.49685982},{"id":"https://openalex.org/C206588197","wikidata":"https://www.wikidata.org/wiki/Q846574","display_name":"Reuse","level":2,"score":0.43257058},{"id":"https://openalex.org/C18131444","wikidata":"https://www.wikidata.org/wiki/Q163585","display_name":"Memory protection","level":5,"score":0.4317557},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.4272296},{"id":"https://openalex.org/C2778002589","wikidata":"https://www.wikidata.org/wiki/Q2406791","display_name":"Upset","level":2,"score":0.4130882},{"id":"https://openalex.org/C113775141","wikidata":"https://www.wikidata.org/wiki/Q428691","display_name":"Computer engineering","level":1,"score":0.3748676},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.35704237},{"id":"https://openalex.org/C57273362","wikidata":"https://www.wikidata.org/wiki/Q576722","display_name":"Decoding methods","level":2,"score":0.33964175},{"id":"https://openalex.org/C176649486","wikidata":"https://www.wikidata.org/wiki/Q2308807","display_name":"Memory management","level":3,"score":0.24892142},{"id":"https://openalex.org/C98986596","wikidata":"https://www.wikidata.org/wiki/Q1143031","display_name":"Semiconductor memory","level":2,"score":0.22338152},{"id":"https://openalex.org/C157125643","wikidata":"https://www.wikidata.org/wiki/Q884707","display_name":"Block code","level":3,"score":0.19716805},{"id":"https://openalex.org/C76399640","wikidata":"https://www.wikidata.org/wiki/Q189401","display_name":"Virtual memory","level":4,"score":0.18377125},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.17583293},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.12541005},{"id":"https://openalex.org/C153207627","wikidata":"https://www.wikidata.org/wiki/Q863873","display_name":"Code word","level":3,"score":0.12290987},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C548081761","wikidata":"https://www.wikidata.org/wiki/Q180388","display_name":"Waste management","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"is_oa":false,"landing_page_url":"https://doi.org/10.1145/3386164.3386167","pdf_url":null,"source":null,"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy","score":0.42}],"grants":[],"datasets":[],"versions":[],"referenced_works_count":12,"referenced_works":["https://openalex.org/W1564617507","https://openalex.org/W2011824410","https://openalex.org/W2025761671","https://openalex.org/W2047276574","https://openalex.org/W2103415152","https://openalex.org/W2342222639","https://openalex.org/W2579018459","https://openalex.org/W2784117024","https://openalex.org/W2885777127","https://openalex.org/W2886819036","https://openalex.org/W4285719527","https://openalex.org/W981863319"],"related_works":["https://openalex.org/W4400983058","https://openalex.org/W3131618665","https://openalex.org/W2565077356","https://openalex.org/W2366313859","https://openalex.org/W2333533828","https://openalex.org/W2160128449","https://openalex.org/W2142218589","https://openalex.org/W2061935696","https://openalex.org/W2057936276","https://openalex.org/W205132508"],"abstract_inverted_index":{"Experimental":[0],"results":[1],"have":[2,69],"shown":[3],"that":[4,49,95],"the":[5,12,17,29,75,89],"Neutron":[6],"and":[7,36,43,65,72,104],"proton":[8],"induced":[9],"upset":[10],"is":[11,94],"root":[13],"cause":[14],"of":[15,19,91],"increasing":[16],"sensitivity":[18],"microelectronics":[20],"to":[21,32,53],"soft":[22],"errors.":[23],"Thus":[24],"eliminating":[25],"these":[26,92],"errors":[27],"are":[28,46,82],"main":[30],"challenge":[31],"overcome":[33],"while":[34],"designing":[35],"implementing":[37],"any":[38],"microelectronic":[39],"device,":[40],"error":[41],"detection":[42],"correction":[44],"technologies":[45],"practical":[47],"ways":[48],"could":[50],"be":[51],"applied":[52],"fulfill":[54],"such":[55],"a":[56],"purpose.":[57],"Hamming":[58],"code,":[59],"Reed-Solomon":[60],"codes,":[61,64],"Parity":[62],"Matrix":[63],"many":[66],"more":[67,98],"techniques,":[68],"been":[70],"developed":[71],"used":[73],"over":[74],"last":[76],"decades":[77],"targeting":[78],"memory":[79,100,112],"protection.":[80],"Which":[81],"still":[83],"delivering":[84],"qualified":[85],"performance":[86],"measures;":[87],"however,":[88],"downside":[90],"approaches":[93],"they":[96],"necessitate":[97],"redundant":[99],"space,":[101],"transmission":[102],"delay,":[103],"sophisticated":[105],"reliability":[106],"architecture.":[107],"This":[108],"paper":[109],"highlights":[110],"various":[111],"protection":[113],"technologies,":[114],"particularly":[115],"emphasizing":[116],"on":[117],"The":[118],"Decimal":[119],"matrix":[120],"code":[121],"(DMC)":[122],"with":[123],"Encoder":[124],"Reuse":[125],"Technique":[126],"(ERT).":[127]},"cited_by_api_url":"https://api.openalex.org/works?filter=cites:W2978210282","counts_by_year":[],"updated_date":"2024-12-07T09:52:57.081033","created_date":"2019-10-10"}