{"id":"https://openalex.org/W1999484948","doi":"https://doi.org/10.1145/307988.307992","title":"BIFEST","display_name":"BIFEST","publication_year":1999,"publication_date":"1999-04-01","ids":{"openalex":"https://openalex.org/W1999484948","doi":"https://doi.org/10.1145/307988.307992","mag":"1999484948"},"language":"en","primary_location":{"is_oa":true,"landing_page_url":"https://doi.org/10.1145/307988.307992","pdf_url":"https://dl.acm.org/doi/pdf/10.1145/307988.307992","source":{"id":"https://openalex.org/S105046310","display_name":"ACM Transactions on Design Automation of Electronic Systems","issn_l":"1084-4309","issn":["1084-4309","1557-7309"],"is_oa":false,"is_in_doaj":false,"is_indexed_in_scopus":true,"is_core":true,"host_organization":"https://openalex.org/P4310319798","host_organization_name":"Association for Computing Machinery","host_organization_lineage":["https://openalex.org/P4310319798"],"host_organization_lineage_names":["Association for Computing Machinery"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true},"type":"article","type_crossref":"journal-article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"bronze","oa_url":"https://dl.acm.org/doi/pdf/10.1145/307988.307992","any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5079657769","display_name":"Kuen-Jong Lee","orcid":"https://orcid.org/0000-0002-6690-0074"},"institutions":[{"id":"https://openalex.org/I91807558","display_name":"National Cheng Kung University","ror":"https://ror.org/01b8kcc49","country_code":"TW","type":"funder","lineage":["https://openalex.org/I91807558"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Kuen-Jong Lee","raw_affiliation_strings":["National Cheng Kung University, Tainan, Taiwan"],"affiliations":[{"raw_affiliation_string":"National Cheng Kung University, Tainan, Taiwan","institution_ids":["https://openalex.org/I91807558"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102183737","display_name":"Jing-Jou Tang","orcid":null},"institutions":[],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Jing-Jou Tang","raw_affiliation_strings":["Nan-Tai Institute of Technology, Tainan, Taiwan"],"affiliations":[{"raw_affiliation_string":"Nan-Tai Institute of Technology, Tainan, Taiwan","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5111502914","display_name":"Tsung\u2010Chu Huang","orcid":null},"institutions":[{"id":"https://openalex.org/I91807558","display_name":"National Cheng Kung University","ror":"https://ror.org/01b8kcc49","country_code":"TW","type":"funder","lineage":["https://openalex.org/I91807558"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Tsung-Chu Huang","raw_affiliation_strings":["National Cheng Kung University, Tainan, Taiwan"],"affiliations":[{"raw_affiliation_string":"National Cheng Kung University, Tainan, Taiwan","institution_ids":["https://openalex.org/I91807558"]}]}],"institution_assertions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":1.092,"has_fulltext":true,"fulltext_origin":"pdf","cited_by_count":4,"citation_normalized_percentile":{"value":0.640185,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":70,"max":72},"biblio":{"volume":"4","issue":"2","first_page":"194","last_page":"218"},"is_retracted":false,"is_paratext":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9917,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/resistive-touchscreen","display_name":"Resistive touchscreen","score":0.59787434}],"concepts":[{"id":"https://openalex.org/C174348530","wikidata":"https://www.wikidata.org/wiki/Q188635","display_name":"Bridging (networking)","level":2,"score":0.85720253},{"id":"https://openalex.org/C17626397","wikidata":"https://www.wikidata.org/wiki/Q837455","display_name":"Automatic test pattern generation","level":3,"score":0.78628445},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7476154},{"id":"https://openalex.org/C6899612","wikidata":"https://www.wikidata.org/wiki/Q852911","display_name":"Resistive touchscreen","level":2,"score":0.59787434},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.55413073},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.5152305},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.5057204},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.475793},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.44789538},{"id":"https://openalex.org/C131017901","wikidata":"https://www.wikidata.org/wiki/Q170451","display_name":"Logic gate","level":2,"score":0.44682378},{"id":"https://openalex.org/C13625343","wikidata":"https://www.wikidata.org/wiki/Q7627418","display_name":"Stuck-at fault","level":4,"score":0.433265},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3736912},{"id":"https://openalex.org/C113775141","wikidata":"https://www.wikidata.org/wiki/Q428691","display_name":"Computer engineering","level":1,"score":0.3447269},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.33831173},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.32685578},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.26999444},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.23939607},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.09917781},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.09488189},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.07585785},{"id":"https://openalex.org/C31258907","wikidata":"https://www.wikidata.org/wiki/Q1301371","display_name":"Computer network","level":1,"score":0.0},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.0},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"is_oa":true,"landing_page_url":"https://doi.org/10.1145/307988.307992","pdf_url":"https://dl.acm.org/doi/pdf/10.1145/307988.307992","source":{"id":"https://openalex.org/S105046310","display_name":"ACM Transactions on Design Automation of Electronic Systems","issn_l":"1084-4309","issn":["1084-4309","1557-7309"],"is_oa":false,"is_in_doaj":false,"is_indexed_in_scopus":true,"is_core":true,"host_organization":"https://openalex.org/P4310319798","host_organization_name":"Association for Computing Machinery","host_organization_lineage":["https://openalex.org/P4310319798"],"host_organization_lineage_names":["Association for Computing Machinery"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true}],"best_oa_location":{"is_oa":true,"landing_page_url":"https://doi.org/10.1145/307988.307992","pdf_url":"https://dl.acm.org/doi/pdf/10.1145/307988.307992","source":{"id":"https://openalex.org/S105046310","display_name":"ACM Transactions on Design Automation of Electronic Systems","issn_l":"1084-4309","issn":["1084-4309","1557-7309"],"is_oa":false,"is_in_doaj":false,"is_indexed_in_scopus":true,"is_core":true,"host_organization":"https://openalex.org/P4310319798","host_organization_name":"Association for Computing Machinery","host_organization_lineage":["https://openalex.org/P4310319798"],"host_organization_lineage_names":["Association for Computing Machinery"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true},"sustainable_development_goals":[],"grants":[],"datasets":[],"versions":[],"referenced_works_count":36,"referenced_works":["https://openalex.org/W1555575363","https://openalex.org/W1652447308","https://openalex.org/W1913711070","https://openalex.org/W1917662355","https://openalex.org/W1961775031","https://openalex.org/W1976140238","https://openalex.org/W1979502538","https://openalex.org/W2011039300","https://openalex.org/W2028249537","https://openalex.org/W2058400500","https://openalex.org/W2096462688","https://openalex.org/W2098112833","https://openalex.org/W2104479091","https://openalex.org/W2115729533","https://openalex.org/W2119241964","https://openalex.org/W2119779484","https://openalex.org/W2121983692","https://openalex.org/W2126322530","https://openalex.org/W2129866418","https://openalex.org/W2130475334","https://openalex.org/W2141968761","https://openalex.org/W2142030290","https://openalex.org/W2146509701","https://openalex.org/W2152870025","https://openalex.org/W2154418718","https://openalex.org/W2154446644","https://openalex.org/W2156443301","https://openalex.org/W2160444875","https://openalex.org/W2161343773","https://openalex.org/W2163233368","https://openalex.org/W2173124859","https://openalex.org/W2537465918","https://openalex.org/W2543005286","https://openalex.org/W2546479237","https://openalex.org/W3139599180","https://openalex.org/W4214626551"],"related_works":["https://openalex.org/W3147038789","https://openalex.org/W2952274626","https://openalex.org/W2913077774","https://openalex.org/W2340957901","https://openalex.org/W2147400189","https://openalex.org/W2115005577","https://openalex.org/W2092357065","https://openalex.org/W2068571131","https://openalex.org/W1896809008","https://openalex.org/W1555400249"],"abstract_inverted_index":{"This":[0],"paper":[1],"presents":[2],"BIFEST,":[3],"an":[4,16],"ATPG":[5,18,52],"system":[6],"that":[7,62,91],"employs":[8],"the":[9,31,36,86],"built-in":[10,77],"intermediate":[11,32,78],"voltage":[12,79],"test":[13,58],"technique":[14],"in":[15],"efficient":[17],"process":[19,53],"to":[20,56],"deal":[21],"with":[22,72,99],"CMOS":[23],"bridging":[24,33,44],"faults.":[25],"Fast":[26],"and":[27,35],"accurate":[28],"calculations":[29],"of":[30],"voltages":[34],"variant":[37],"threshold":[38],"tolerance":[39],"margins":[40],"on":[41],"a":[42],"resistive":[43],"fault":[45,88],"model":[46],"are":[47,63,69],"presented.":[48],"A":[49],"PODEM-like,":[50],"PPSFP-based":[51],"is":[54],"developed":[55],"generate":[57],"patterns":[59],"for":[60],"faults":[61,68],"conventionally":[64],"logic-testable.":[65],"The":[66],"remaining":[67],"then":[70],"dealt":[71],"by":[73],"special":[74],"circuits,":[75],"called":[76],"sensors":[80],"(BIVSs).":[81],"By":[82],"this":[83],"methodology,":[84],"almost":[85],"same":[87],"coverage":[89],"as":[90],"employing":[92],"I":[93],"DDQ":[94],"testing":[95],"can":[96],"be":[97],"achieved":[98],"only":[100],"logic":[101],"monitoring":[102],"required.":[103]},"abstract_inverted_index_v3":null,"cited_by_api_url":"https://api.openalex.org/works?filter=cites:W1999484948","counts_by_year":[],"updated_date":"2025-03-21T16:58:38.711688","created_date":"2016-06-24"}