{"id":"https://openalex.org/W2025789045","doi":"https://doi.org/10.1145/2451916.2451960","title":"TAU 2013 variation aware timing analysis contest","display_name":"TAU 2013 variation aware timing analysis contest","publication_year":2013,"publication_date":"2013-03-24","ids":{"openalex":"https://openalex.org/W2025789045","doi":"https://doi.org/10.1145/2451916.2451960","mag":"2025789045"},"language":"en","primary_location":{"is_oa":false,"landing_page_url":"https://doi.org/10.1145/2451916.2451960","pdf_url":null,"source":null,"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false},"type":"article","type_crossref":"proceedings-article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5013933522","display_name":"Debjit Sinha","orcid":null},"institutions":[{"id":"https://openalex.org/I1341412227","display_name":"IBM (United States)","ror":"https://ror.org/05hh8d621","country_code":"US","type":"company","lineage":["https://openalex.org/I1341412227"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Debjit Sinha","raw_affiliation_strings":["IBM Systems and Technology Group, Hopewell Junction, New York, USA#TAB#"],"affiliations":[{"raw_affiliation_string":"IBM Systems and Technology Group, Hopewell Junction, New York, USA#TAB#","institution_ids":["https://openalex.org/I1341412227"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5074463063","display_name":"Lu\u00eds Guerra e Silva","orcid":"https://orcid.org/0000-0001-5761-0131"},"institutions":[{"id":"https://openalex.org/I121345201","display_name":"Instituto de Engenharia de Sistemas e Computadores Investiga\u00e7\u00e3o e Desenvolvimento","ror":"https://ror.org/04mqy3p58","country_code":"PT","type":"nonprofit","lineage":["https://openalex.org/I121345201","https://openalex.org/I4210125590"]}],"countries":["PT"],"is_corresponding":false,"raw_author_name":"Luis Guerra e Silva","raw_affiliation_strings":["INESC-ID / IST - TU, Lisbon, Portugal"],"affiliations":[{"raw_affiliation_string":"INESC-ID / IST - TU, Lisbon, Portugal","institution_ids":["https://openalex.org/I121345201"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100404656","display_name":"Jia Wang","orcid":"https://orcid.org/0000-0002-6159-6085"},"institutions":[{"id":"https://openalex.org/I180949307","display_name":"Illinois Institute of Technology","ror":"https://ror.org/037t3ry66","country_code":"US","type":"education","lineage":["https://openalex.org/I180949307"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Jia Wang","raw_affiliation_strings":["Illinois Institute of Technology, Chicago, Illinois, USA"],"affiliations":[{"raw_affiliation_string":"Illinois Institute of Technology, Chicago, Illinois, USA","institution_ids":["https://openalex.org/I180949307"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5025038855","display_name":"Shesha Raghunathan","orcid":null},"institutions":[{"id":"https://openalex.org/I1341412227","display_name":"IBM (United States)","ror":"https://ror.org/05hh8d621","country_code":"US","type":"company","lineage":["https://openalex.org/I1341412227"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Shesha Raghunathan","raw_affiliation_strings":["IBM Systems and Technoloy Group, Bangalore, India#TAB#"],"affiliations":[{"raw_affiliation_string":"IBM Systems and Technoloy Group, Bangalore, India#TAB#","institution_ids":["https://openalex.org/I1341412227"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5083566344","display_name":"Dileep Netrabile","orcid":null},"institutions":[],"countries":["US"],"is_corresponding":false,"raw_author_name":"Dileep Netrabile","raw_affiliation_strings":["IBM Systems and Technology Group, Burlington, Vermont, USA"],"affiliations":[{"raw_affiliation_string":"IBM Systems and Technology Group, Burlington, Vermont, USA","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5049836523","display_name":"Ahmed Shebaita","orcid":null},"institutions":[{"id":"https://openalex.org/I4210088951","display_name":"Synopsys (United States)","ror":"https://ror.org/013by2m91","country_code":"US","type":"company","lineage":["https://openalex.org/I4210088951"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Ahmed Shebaita","raw_affiliation_strings":["Synopsys, Sunnyvale, California, USA"],"affiliations":[{"raw_affiliation_string":"Synopsys, Sunnyvale, California, USA","institution_ids":["https://openalex.org/I4210088951"]}]}],"institution_assertions":[],"countries_distinct_count":2,"institutions_distinct_count":4,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":1.578,"has_fulltext":true,"fulltext_origin":"ngrams","cited_by_count":11,"citation_normalized_percentile":{"value":0.546685,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":86,"max":87},"biblio":{"volume":null,"issue":null,"first_page":"171","last_page":"178"},"is_retracted":false,"is_paratext":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9999,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9999,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9999,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11522","display_name":"VLSI and FPGA Design Techniques","score":0.9998,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/static-timing-analysis","display_name":"Static timing analysis","score":0.8669372},{"id":"https://openalex.org/keywords/design-flow","display_name":"Design flow","score":0.5709851},{"id":"https://openalex.org/keywords/integrated-circuit-design","display_name":"Integrated circuit design","score":0.55802876},{"id":"https://openalex.org/keywords/variation","display_name":"Variation (astronomy)","score":0.5421726},{"id":"https://openalex.org/keywords/contest","display_name":"CONTEST","score":0.48972657},{"id":"https://openalex.org/keywords/process-variation","display_name":"Process Variation","score":0.47274172}],"concepts":[{"id":"https://openalex.org/C93682380","wikidata":"https://www.wikidata.org/wiki/Q2025226","display_name":"Static timing analysis","level":2,"score":0.8669372},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.63075936},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.62909794},{"id":"https://openalex.org/C37135326","wikidata":"https://www.wikidata.org/wiki/Q931942","display_name":"Design flow","level":2,"score":0.5709851},{"id":"https://openalex.org/C74524168","wikidata":"https://www.wikidata.org/wiki/Q1074539","display_name":"Integrated circuit design","level":2,"score":0.55802876},{"id":"https://openalex.org/C2778334786","wikidata":"https://www.wikidata.org/wiki/Q1586270","display_name":"Variation (astronomy)","level":2,"score":0.5421726},{"id":"https://openalex.org/C2777582232","wikidata":"https://www.wikidata.org/wiki/Q5013414","display_name":"CONTEST","level":2,"score":0.48972657},{"id":"https://openalex.org/C93389723","wikidata":"https://www.wikidata.org/wiki/Q7247313","display_name":"Process variation","level":3,"score":0.47274172},{"id":"https://openalex.org/C188817802","wikidata":"https://www.wikidata.org/wiki/Q13426855","display_name":"Physical design","level":3,"score":0.44779113},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.40030974},{"id":"https://openalex.org/C79403827","wikidata":"https://www.wikidata.org/wiki/Q3988","display_name":"Real-time computing","level":1,"score":0.33536106},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.33031952},{"id":"https://openalex.org/C190560348","wikidata":"https://www.wikidata.org/wiki/Q3245116","display_name":"Circuit design","level":2,"score":0.3210177},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.08087364},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C44870925","wikidata":"https://www.wikidata.org/wiki/Q37547","display_name":"Astrophysics","level":1,"score":0.0},{"id":"https://openalex.org/C17744445","wikidata":"https://www.wikidata.org/wiki/Q36442","display_name":"Political science","level":0,"score":0.0},{"id":"https://openalex.org/C199539241","wikidata":"https://www.wikidata.org/wiki/Q7748","display_name":"Law","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"is_oa":false,"landing_page_url":"https://doi.org/10.1145/2451916.2451960","pdf_url":null,"source":null,"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/14","display_name":"Life below water","score":0.68}],"grants":[],"datasets":[],"versions":[],"referenced_works_count":10,"referenced_works":["https://openalex.org/W1967709031","https://openalex.org/W1984588379","https://openalex.org/W2126564504","https://openalex.org/W2135742364","https://openalex.org/W2143847170","https://openalex.org/W2153558271","https://openalex.org/W2158750015","https://openalex.org/W2163262735","https://openalex.org/W2164759949","https://openalex.org/W2170454255"],"related_works":["https://openalex.org/W4391382037","https://openalex.org/W4309227549","https://openalex.org/W4253195573","https://openalex.org/W2908947570","https://openalex.org/W2743305891","https://openalex.org/W2409361203","https://openalex.org/W2374651972","https://openalex.org/W2151657833","https://openalex.org/W2070693700","https://openalex.org/W2020934033"],"abstract_inverted_index":{"Timing":[0],"analysis":[1,33,40,90,95],"is":[2,15,34,41],"a":[3],"key":[4],"component":[5],"of":[6,20,38,55,66,80],"any":[7],"integrated":[8],"circuit":[9],"(IC)":[10],"chip":[11,46,70,88],"design-closure":[12],"flow,":[13],"and":[14,27,49],"employed":[16],"at":[17],"various":[18],"stages":[19],"the":[21,36,39,63,69,94],"flow":[22],"including":[23],"pre/post-route":[24],"timing":[25,28,32,89],"optimization":[26],"signoff.":[29],"While":[30],"accurate":[31],"important,":[35],"run-time":[37],"equally":[42],"critical":[43],"with":[44],"growing":[45],"design":[47],"sizes":[48],"complexity":[50],"(for":[51],"example,":[52],"increasing":[53,64],"number":[54],"clocks":[56],"domains,":[57],"voltage":[58],"islands,":[59],"etc.).":[60],"In":[61],"addition,":[62],"significance":[65],"variability":[67,77],"in":[68],"manufacturing":[71],"process":[72],"as":[73,75],"well":[74],"environmental":[76],"necessitates":[78],"use":[79],"variation":[81],"aware":[82],"techniques":[83],"(e.g.":[84],"statistical,":[85],"multi-corner)":[86],"for":[87],"which":[91],"significantly":[92],"impacts":[93],"run-time.":[96]},"cited_by_api_url":"https://api.openalex.org/works?filter=cites:W2025789045","counts_by_year":[{"year":2017,"cited_by_count":1},{"year":2016,"cited_by_count":2},{"year":2015,"cited_by_count":4},{"year":2014,"cited_by_count":4}],"updated_date":"2024-12-24T15:21:26.254473","created_date":"2016-06-24"}