{"id":"https://openalex.org/W2080963611","doi":"https://doi.org/10.1109/vts.2010.5469569","title":"Board-level fault diagnosis using Bayesian inference","display_name":"Board-level fault diagnosis using Bayesian inference","publication_year":2010,"publication_date":"2010-04-01","ids":{"openalex":"https://openalex.org/W2080963611","doi":"https://doi.org/10.1109/vts.2010.5469569","mag":"2080963611"},"language":"en","primary_location":{"is_oa":false,"landing_page_url":"https://doi.org/10.1109/vts.2010.5469569","pdf_url":null,"source":null,"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false},"type":"article","type_crossref":"proceedings-article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5101914137","display_name":"Zhaobo Zhang","orcid":"https://orcid.org/0000-0003-3449-796X"},"institutions":[{"id":"https://openalex.org/I170897317","display_name":"Duke University","ror":"https://ror.org/00py81415","country_code":"US","type":"funder","lineage":["https://openalex.org/I170897317"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Zhaobo Zhang","raw_affiliation_strings":["ECE Department, Duke University, Durham, NC"],"affiliations":[{"raw_affiliation_string":"ECE Department, Duke University, Durham, NC","institution_ids":["https://openalex.org/I170897317"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100376569","display_name":"Zhong Lin Wang","orcid":"https://orcid.org/0000-0002-5530-0380"},"institutions":[{"id":"https://openalex.org/I151281966","display_name":"Cisco Systems (China)","ror":"https://ror.org/02qy75381","country_code":"HK","type":"company","lineage":["https://openalex.org/I135428043","https://openalex.org/I151281966"]}],"countries":["HK"],"is_corresponding":false,"raw_author_name":"Zhanglei Wang","raw_affiliation_strings":["Cisco Systems, Incorporated (San Jose, CA)"],"affiliations":[{"raw_affiliation_string":"Cisco Systems, Incorporated (San Jose, CA)","institution_ids":["https://openalex.org/I151281966"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5014106133","display_name":"Xinli Gu","orcid":null},"institutions":[{"id":"https://openalex.org/I151281966","display_name":"Cisco Systems (China)","ror":"https://ror.org/02qy75381","country_code":"HK","type":"company","lineage":["https://openalex.org/I135428043","https://openalex.org/I151281966"]}],"countries":["HK"],"is_corresponding":false,"raw_author_name":"Xinli Gu","raw_affiliation_strings":["Cisco Systems, Incorporated (San Jose, CA)"],"affiliations":[{"raw_affiliation_string":"Cisco Systems, Incorporated (San Jose, CA)","institution_ids":["https://openalex.org/I151281966"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5033880864","display_name":"Krishnendu Chakrabarty","orcid":"https://orcid.org/0000-0003-4475-6435"},"institutions":[{"id":"https://openalex.org/I170897317","display_name":"Duke University","ror":"https://ror.org/00py81415","country_code":"US","type":"funder","lineage":["https://openalex.org/I170897317"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Krishnendu Chakrabarty","raw_affiliation_strings":["ECE Department, Duke University, Durham, NC"],"affiliations":[{"raw_affiliation_string":"ECE Department, Duke University, Durham, NC","institution_ids":["https://openalex.org/I170897317"]}]}],"institution_assertions":[],"countries_distinct_count":2,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":2.409,"has_fulltext":true,"fulltext_origin":"ngrams","cited_by_count":34,"citation_normalized_percentile":{"value":0.933639,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":92,"max":93},"biblio":{"volume":null,"issue":null,"first_page":"244","last_page":"249"},"is_retracted":false,"is_paratext":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9997,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9997,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9984,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13293","display_name":"Engineering and Test Systems","score":0.9968,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[],"concepts":[{"id":"https://openalex.org/C55439883","wikidata":"https://www.wikidata.org/wiki/Q360812","display_name":"Correctness","level":2,"score":0.7215482},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.68575525},{"id":"https://openalex.org/C2776214188","wikidata":"https://www.wikidata.org/wiki/Q408386","display_name":"Inference","level":2,"score":0.64852875},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.54975843},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.5445403},{"id":"https://openalex.org/C160234255","wikidata":"https://www.wikidata.org/wiki/Q812535","display_name":"Bayesian inference","level":3,"score":0.51054823},{"id":"https://openalex.org/C107673813","wikidata":"https://www.wikidata.org/wiki/Q812534","display_name":"Bayesian probability","level":2,"score":0.49130598},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.45572582},{"id":"https://openalex.org/C49937458","wikidata":"https://www.wikidata.org/wiki/Q2599292","display_name":"Probabilistic logic","level":2,"score":0.4529225},{"id":"https://openalex.org/C17626397","wikidata":"https://www.wikidata.org/wiki/Q837455","display_name":"Automatic test pattern generation","level":3,"score":0.41434819},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.37986556},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.37860605},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.2367762},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.19867581},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"is_oa":false,"landing_page_url":"https://doi.org/10.1109/vts.2010.5469569","pdf_url":null,"source":null,"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false}],"best_oa_location":null,"sustainable_development_goals":[],"grants":[],"datasets":[],"versions":[],"referenced_works_count":14,"referenced_works":["https://openalex.org/W1520077640","https://openalex.org/W1572113325","https://openalex.org/W1821229299","https://openalex.org/W2024681686","https://openalex.org/W2096193492","https://openalex.org/W2101395364","https://openalex.org/W2122349997","https://openalex.org/W2128469382","https://openalex.org/W2134790417","https://openalex.org/W2136658262","https://openalex.org/W2144453356","https://openalex.org/W2167069171","https://openalex.org/W2170132164","https://openalex.org/W2171346697"],"related_works":["https://openalex.org/W4303857162","https://openalex.org/W4288266653","https://openalex.org/W3015855446","https://openalex.org/W2969189870","https://openalex.org/W2965643117","https://openalex.org/W2950975704","https://openalex.org/W2585791450","https://openalex.org/W2505726097","https://openalex.org/W2407375987","https://openalex.org/W2372267530"],"abstract_inverted_index":{"Increasing":[0],"integration":[1],"densities":[2],"and":[3,35,47,58,112,143,187],"high":[4,99],"operating":[5],"speeds":[6],"are":[7],"leading":[8],"to":[9,54,63,74,84,158],"subtle":[10],"manifestations":[11],"of":[12,29,127,154,178,184,189],"defects":[13],"at":[14,134],"the":[15,36,135,150,160,176,179],"board":[16,97,157],"level.":[17],"Board-level":[18],"functional":[19,30],"test":[20,133],"is":[21,32,42,52],"therefore":[22],"necessary":[23],"for":[24,108],"product":[25,65],"qualification.":[26],"The":[27],"diagnosis":[28,41,50,79],"failures":[31],"especially":[33],"challenging,":[34],"cost":[37,57],"associated":[38],"with":[39,98,149],"board-level":[40,49,78],"escalating":[43],"rapidly.":[44],"An":[45],"effective":[46],"cost-efficient":[48],"strategy":[51],"needed":[53],"reduce":[55],"manufacturing":[56],"time-to-market,":[59],"as":[60,62],"well":[61],"improve":[64],"quality.":[66],"In":[67],"this":[68,119,146],"paper,":[69],"we":[70],"use":[71,145],"Bayesian":[72,101],"inference":[73,102,120],"develop":[75],"a":[76,92,95,104,125,140,155,167],"new":[77],"framework":[80,181],"that":[81],"allows":[82],"us":[83],"identify":[85],"faulty":[86,89,163],"devices":[87],"or":[88],"modules":[90],"within":[91],"device":[93],"on":[94,139,166],"failing":[96,156],"confidence.":[100],"offers":[103],"powerful":[105],"probabilistic":[106],"method":[107],"pattern":[109],"analysis,":[110],"classification,":[111],"decision":[113],"making":[114],"under":[115],"uncertainty.":[116],"We":[117],"apply":[118],"technique":[121],"by":[122],"first":[123],"generating":[124],"database":[126,147],"fault":[128],"syndromes":[129],"obtained":[130],"using":[131,170],"fault-insertion":[132],"module":[136],"pin":[137],"level":[138],"fault-free":[141],"board,":[142],"then":[144],"along":[148],"observed":[151],"erroneous":[152],"behavior":[153],"infer":[159],"most":[161],"likely":[162],"device.":[164],"Results":[165],"case":[168],"study":[169],"an":[171],"open-source":[172],"RISC":[173],"system-on-chip":[174],"highlight":[175],"effectiveness":[177],"proposed":[180],"in":[182],"terms":[183],"fault-localization":[185],"accuracy":[186],"correctness":[188],"diagnosis.":[190]},"abstract_inverted_index_v3":null,"cited_by_api_url":"https://api.openalex.org/works?filter=cites:W2080963611","counts_by_year":[{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":2},{"year":2019,"cited_by_count":1},{"year":2017,"cited_by_count":1},{"year":2016,"cited_by_count":5},{"year":2015,"cited_by_count":5},{"year":2014,"cited_by_count":3},{"year":2013,"cited_by_count":4},{"year":2012,"cited_by_count":3}],"updated_date":"2025-03-17T16:47:51.743672","created_date":"2016-06-24"}