乐胖代购免代理版

{"id":"https://openalex.org/W2117570404","doi":"https://doi.org/10.1109/vlsid.2007.113","title":"Modified Stability Checking for On-line Error Detection","display_name":"Modified Stability Checking for On-line Error Detection","publication_year":2007,"publication_date":"2007-01-01","ids":{"openalex":"https://openalex.org/W2117570404","doi":"https://doi.org/10.1109/vlsid.2007.113","mag":"2117570404"},"language":"en","primary_location":{"is_oa":false,"landing_page_url":"https://doi.org/10.1109/vlsid.2007.113","pdf_url":null,"source":null,"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false},"type":"article","type_crossref":"proceedings-article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5098373233","display_name":"Satish Yada","orcid":null},"institutions":[{"id":"https://openalex.org/I59270414","display_name":"Indian Institute of Science Bangalore","ror":"https://ror.org/04dese585","country_code":"IN","type":"education","lineage":["https://openalex.org/I59270414"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Satish Yada","raw_affiliation_strings":["Dept. of Electr. Commun. Eng., Indian Inst. of Sci., Bangalore"],"affiliations":[{"raw_affiliation_string":"Dept. of Electr. Commun. Eng., Indian Inst. of Sci., Bangalore","institution_ids":["https://openalex.org/I59270414"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5091221053","display_name":"Bharadwaj Amrutur","orcid":"https://orcid.org/0009-0007-5062-6174"},"institutions":[{"id":"https://openalex.org/I59270414","display_name":"Indian Institute of Science Bangalore","ror":"https://ror.org/04dese585","country_code":"IN","type":"education","lineage":["https://openalex.org/I59270414"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Bharadwaj Amrutur","raw_affiliation_strings":["Dept. of Electr. Commun. Eng., Indian Inst. of Sci., Bangalore"],"affiliations":[{"raw_affiliation_string":"Dept. of Electr. Commun. Eng., Indian Inst. of Sci., Bangalore","institution_ids":["https://openalex.org/I59270414"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5028519358","display_name":"Rubin Parekhji","orcid":"https://orcid.org/0009-0000-6625-2786"},"institutions":[{"id":"https://openalex.org/I4210109535","display_name":"Texas Instruments (India)","ror":"https://ror.org/01t305n31","country_code":"IN","type":"company","lineage":["https://openalex.org/I4210109535","https://openalex.org/I74760111"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Rubin Parekhji","raw_affiliation_strings":["Texas Instruments (India) Pvt Ltd, Bangalore, India"],"affiliations":[{"raw_affiliation_string":"Texas Instruments (India) Pvt Ltd, Bangalore, India","institution_ids":["https://openalex.org/I4210109535"]}]}],"institution_assertions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":1.169,"has_fulltext":true,"fulltext_origin":"ngrams","cited_by_count":8,"citation_normalized_percentile":{"value":0.75836,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":81,"max":82},"biblio":{"volume":null,"issue":null,"first_page":null,"last_page":null},"is_retracted":false,"is_paratext":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9999,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9996,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/transient","display_name":"Transient (computer programming)","score":0.44542283},{"id":"https://openalex.org/keywords/crosstalk","display_name":"Crosstalk","score":0.43723536}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7466527},{"id":"https://openalex.org/C110251889","wikidata":"https://www.wikidata.org/wiki/Q1569697","display_name":"Model checking","level":2,"score":0.67614937},{"id":"https://openalex.org/C103088060","wikidata":"https://www.wikidata.org/wiki/Q1062839","display_name":"Error detection and correction","level":2,"score":0.5001795},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.46034527},{"id":"https://openalex.org/C2780799671","wikidata":"https://www.wikidata.org/wiki/Q17087362","display_name":"Transient (computer programming)","level":2,"score":0.44542283},{"id":"https://openalex.org/C169822122","wikidata":"https://www.wikidata.org/wiki/Q230187","display_name":"Crosstalk","level":2,"score":0.43723536},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.43317205},{"id":"https://openalex.org/C112972136","wikidata":"https://www.wikidata.org/wiki/Q7595718","display_name":"Stability (learning theory)","level":2,"score":0.4325343},{"id":"https://openalex.org/C177264268","wikidata":"https://www.wikidata.org/wiki/Q1514741","display_name":"Set (abstract data type)","level":2,"score":0.42866522},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.22284332},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.13584664},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.10830292},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.08555871},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"is_oa":false,"landing_page_url":"https://doi.org/10.1109/vlsid.2007.113","pdf_url":null,"source":null,"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false}],"best_oa_location":null,"sustainable_development_goals":[],"grants":[],"datasets":[],"versions":[],"referenced_works_count":12,"referenced_works":["https://openalex.org/W1541483005","https://openalex.org/W2061868201","https://openalex.org/W2080147108","https://openalex.org/W2097596884","https://openalex.org/W2108090050","https://openalex.org/W2111607338","https://openalex.org/W2113099907","https://openalex.org/W2118002293","https://openalex.org/W2121618685","https://openalex.org/W2136272218","https://openalex.org/W2147458209","https://openalex.org/W2162465831"],"related_works":["https://openalex.org/W4388636991","https://openalex.org/W4298625141","https://openalex.org/W4280525841","https://openalex.org/W2972114982","https://openalex.org/W2807571008","https://openalex.org/W2622826586","https://openalex.org/W2560789951","https://openalex.org/W2492758367","https://openalex.org/W2167472940","https://openalex.org/W1975375876"],"abstract_inverted_index":{"The":[0,29,46,58],"paper":[1,47],"propose":[2],"a":[3,50,63,89,101],"unified":[4],"error":[5],"detection":[6,14],"technique,":[7],"based":[8],"on":[9],"stability":[10,34,43],"checking,":[11],"for":[12,62,88],"on-line":[13],"of":[15,40,66],"delay,":[16],"crosstalk":[17],"and":[18,24],"transient":[19,71],"faults":[20,69],"in":[21,26,100],"combinational":[22],"circuits":[23],"SEUs":[25],"sequential":[27],"elements.":[28],"proposed":[30,49],"method,":[31],"called":[32],"modified":[33],"checking":[35,44],"(MSC),":[36],"overcomes":[37],"the":[38,41,81],"limitations":[39],"earlier":[42],"methods.":[45],"also":[48],"novel":[51],"checker":[52,59,82,86],"circuit":[53,74,87],"to":[54,79],"realize":[55],"this":[56],"scheme.":[57],"is":[60],"self-checking":[61],"wide":[64],"set":[65],"realistic":[67],"internal":[68],"including":[70],"faults.":[72],"Extensive":[73],"simulations":[75],"have":[76],"been":[77,98],"done":[78],"characterize":[80],"circuit.":[83],"A":[84],"prototype":[85],"1mm":[90],"2":[93],"standard":[94],"cell":[95],"array":[96],"has":[97],"implemented":[99],"0.13mum":[102],"process":[103]},"cited_by_api_url":"https://api.openalex.org/works?filter=cites:W2117570404","counts_by_year":[{"year":2018,"cited_by_count":1},{"year":2015,"cited_by_count":1}],"updated_date":"2024-12-12T23:36:58.412150","created_date":"2016-06-24"}