乐胖代购免代理版

{"id":"https://openalex.org/W2008338328","doi":"https://doi.org/10.1109/tvlsi.2012.2220792","title":"Timing Yield Slack for Timing Yield-Constrained Optimization and Its Application to Statistical Leakage Minimization","display_name":"Timing Yield Slack for Timing Yield-Constrained Optimization and Its Application to Statistical Leakage Minimization","publication_year":2012,"publication_date":"2012-10-26","ids":{"openalex":"https://openalex.org/W2008338328","doi":"https://doi.org/10.1109/tvlsi.2012.2220792","mag":"2008338328"},"language":"en","primary_location":{"is_oa":false,"landing_page_url":"https://doi.org/10.1109/tvlsi.2012.2220792","pdf_url":null,"source":{"id":"https://openalex.org/S37538908","display_name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","issn_l":"1063-8210","issn":["1063-8210","1557-9999"],"is_oa":false,"is_in_doaj":false,"is_indexed_in_scopus":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false},"type":"article","type_crossref":"journal-article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5110453549","display_name":"Eun Ju Hwang","orcid":null},"institutions":[{"id":"https://openalex.org/I123900574","display_name":"Pohang University of Science and Technology","ror":"https://ror.org/04xysgw12","country_code":"KR","type":"funder","lineage":["https://openalex.org/I123900574"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Eun Ju Hwang","raw_affiliation_strings":["Pohang University of Science and Technology; Pohang South Korea"],"affiliations":[{"raw_affiliation_string":"Pohang University of Science and Technology; Pohang South Korea","institution_ids":["https://openalex.org/I123900574"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100662249","display_name":"Wook Kim","orcid":"https://orcid.org/0000-0003-3409-6672"},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"funder","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Wook Kim","raw_affiliation_strings":["Infrastruct. Dev. Center, Samsung Electron. Co. Ltd., Yongin, South Korea"],"affiliations":[{"raw_affiliation_string":"Infrastruct. Dev. Center, Samsung Electron. Co. Ltd., Yongin, South Korea","institution_ids":["https://openalex.org/I2250650973"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100617710","display_name":"Young Hwan Kim","orcid":"https://orcid.org/0000-0002-5532-610X"},"institutions":[{"id":"https://openalex.org/I123900574","display_name":"Pohang University of Science and Technology","ror":"https://ror.org/04xysgw12","country_code":"KR","type":"funder","lineage":["https://openalex.org/I123900574"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Young Hwan Kim","raw_affiliation_strings":["Pohang University of Science and Technology; Pohang South Korea"],"affiliations":[{"raw_affiliation_string":"Pohang University of Science and Technology; Pohang South Korea","institution_ids":["https://openalex.org/I123900574"]}]}],"institution_assertions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.391,"has_fulltext":true,"fulltext_origin":"ngrams","cited_by_count":10,"citation_normalized_percentile":{"value":0.723696,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":85,"max":86},"biblio":{"volume":"21","issue":"10","first_page":"1783","last_page":"1796"},"is_retracted":false,"is_paratext":false,"primary_topic":{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11522","display_name":"VLSI and FPGA Design Techniques","score":0.9998,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9996,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/minification","display_name":"Minification","score":0.745059},{"id":"https://openalex.org/keywords/benchmark","display_name":"Benchmark (surveying)","score":0.7371838},{"id":"https://openalex.org/keywords/leakage","display_name":"Leakage (economics)","score":0.5459844},{"id":"https://openalex.org/keywords/performance-metric","display_name":"Performance metric","score":0.4904444}],"concepts":[{"id":"https://openalex.org/C147764199","wikidata":"https://www.wikidata.org/wiki/Q6865248","display_name":"Minification","level":2,"score":0.745059},{"id":"https://openalex.org/C185798385","wikidata":"https://www.wikidata.org/wiki/Q1161707","display_name":"Benchmark (surveying)","level":2,"score":0.7371838},{"id":"https://openalex.org/C2777042071","wikidata":"https://www.wikidata.org/wiki/Q6509304","display_name":"Leakage (economics)","level":2,"score":0.5459844},{"id":"https://openalex.org/C176217482","wikidata":"https://www.wikidata.org/wiki/Q860554","display_name":"Metric (unit)","level":2,"score":0.5405383},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5202145},{"id":"https://openalex.org/C2780898871","wikidata":"https://www.wikidata.org/wiki/Q860554","display_name":"Performance metric","level":2,"score":0.4904444},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.45761767},{"id":"https://openalex.org/C137836250","wikidata":"https://www.wikidata.org/wiki/Q984063","display_name":"Optimization problem","level":2,"score":0.41159743},{"id":"https://openalex.org/C126255220","wikidata":"https://www.wikidata.org/wiki/Q141495","display_name":"Mathematical optimization","level":1,"score":0.40219605},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.24385938},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2403763},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.18412355},{"id":"https://openalex.org/C21547014","wikidata":"https://www.wikidata.org/wiki/Q1423657","display_name":"Operations management","level":1,"score":0.0},{"id":"https://openalex.org/C187736073","wikidata":"https://www.wikidata.org/wiki/Q2920921","display_name":"Management","level":1,"score":0.0},{"id":"https://openalex.org/C13280743","wikidata":"https://www.wikidata.org/wiki/Q131089","display_name":"Geodesy","level":1,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C162324750","wikidata":"https://www.wikidata.org/wiki/Q8134","display_name":"Economics","level":0,"score":0.0},{"id":"https://openalex.org/C139719470","wikidata":"https://www.wikidata.org/wiki/Q39680","display_name":"Macroeconomics","level":1,"score":0.0},{"id":"https://openalex.org/C205649164","wikidata":"https://www.wikidata.org/wiki/Q1071","display_name":"Geography","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"is_oa":false,"landing_page_url":"https://doi.org/10.1109/tvlsi.2012.2220792","pdf_url":null,"source":{"id":"https://openalex.org/S37538908","display_name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","issn_l":"1063-8210","issn":["1063-8210","1557-9999"],"is_oa":false,"is_in_doaj":false,"is_indexed_in_scopus":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false}],"best_oa_location":null,"sustainable_development_goals":[],"grants":[],"datasets":[],"versions":[],"referenced_works_count":45,"referenced_works":["https://openalex.org/W1479818569","https://openalex.org/W1569550779","https://openalex.org/W1572287951","https://openalex.org/W1966741973","https://openalex.org/W1967709031","https://openalex.org/W1970580065","https://openalex.org/W1990306616","https://openalex.org/W2022917746","https://openalex.org/W2035096102","https://openalex.org/W2058932750","https://openalex.org/W2059941121","https://openalex.org/W2083451059","https://openalex.org/W2095804030","https://openalex.org/W2103546353","https://openalex.org/W2105407012","https://openalex.org/W2115674461","https://openalex.org/W2118955652","https://openalex.org/W2119821681","https://openalex.org/W2122330963","https://openalex.org/W2126079204","https://openalex.org/W2129192249","https://openalex.org/W2130512258","https://openalex.org/W2132389735","https://openalex.org/W2132554587","https://openalex.org/W2136328167","https://openalex.org/W2142726556","https://openalex.org/W2147742057","https://openalex.org/W2148575734","https://openalex.org/W2156920388","https://openalex.org/W2159801533","https://openalex.org/W2162935501","https://openalex.org/W2163430596","https://openalex.org/W2167077570","https://openalex.org/W2172291058","https://openalex.org/W2319890895","https://openalex.org/W2949464251","https://openalex.org/W4239192425","https://openalex.org/W4240704676","https://openalex.org/W4246922879","https://openalex.org/W4247788806","https://openalex.org/W4249223601","https://openalex.org/W4251291498","https://openalex.org/W4253623754","https://openalex.org/W4254323093","https://openalex.org/W4254506919"],"related_works":["https://openalex.org/W4361804730","https://openalex.org/W4247159817","https://openalex.org/W2752178021","https://openalex.org/W2334467465","https://openalex.org/W2162534555","https://openalex.org/W2143024819","https://openalex.org/W2142113611","https://openalex.org/W2087870008","https://openalex.org/W2045629210","https://openalex.org/W2018387840"],"abstract_inverted_index":{"This":[0,69],"paper":[1,70],"focuses":[2],"on":[3,111,158],"statistical":[4,61,82,108,118,141,175],"optimization":[5,150],"and,":[6],"more":[7],"specifically,":[8],"timing":[9,29,36,44,104],"yield":[10],"(TY)-constrained":[11],"optimization.":[12,83,109],"For":[13],"cell":[14],"replacement":[15],"in":[16,60],"timing-constrained":[17],"optimization,":[18,42,62],"we":[19,87,114],"need":[20],"an":[21,54,72,89],"indicator":[22],"that":[23,102,122,137,144,163],"examines":[24],"whether":[25],"or":[26],"not":[27,65],"a":[28,38,100,116,128,148,153,183],"violation":[30],"occurs":[31],"and":[32,99],"gives":[33],"the":[34,43,77,94,124,164,174,187],"available":[35],"for":[37,48,80,106,127,140],"gate.":[39],"In":[40,178],"deterministic":[41],"slack":[45,59,79,126],"is":[46,53,191],"used":[47],"this":[49,112],"indicator.":[50],"Although":[51],"there":[52],"analogous":[55],"concept":[56],"of":[57,97,134,189],"TY":[58,78,95,125],"it":[63],"has":[64,147,182],"been":[66],"well":[67],"utilized.":[68],"proposes":[71],"effective":[73,107],"way":[74],"to":[75,92,173],"use":[76,133],"successful":[81],"To":[84],"achieve":[85],"this,":[86],"present":[88],"efficient":[90],"method":[91,121,146,167,181],"calculate":[93],"slacks":[96],"gates":[98,190],"strategy":[101],"uses":[103,123],"resources":[105],"Based":[110],"work,":[113],"propose":[115],"novel":[117],"leakage":[119,165,169],"minimization":[120,166],"gate":[129],"change":[130],"metric.":[131],"The":[132],"TY-based":[135],"metrics":[136],"are":[138],"appropriate":[139],"design":[142],"ensures":[143],"our":[145,180],"better":[149,184],"performance":[151],"at":[152],"higher":[154],"speed.":[155],"Experimental":[156],"results":[157],"ISCAS-85":[159],"benchmark":[160,176],"circuits":[161],"show":[162],"reduces":[168],"by":[170],"25.2%":[171],"compared":[172],"method.":[177],"addition,":[179],"runtime":[185],"when":[186],"number":[188],"high.":[192]},"abstract_inverted_index_v3":null,"cited_by_api_url":"https://api.openalex.org/works?filter=cites:W2008338328","counts_by_year":[{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":2},{"year":2018,"cited_by_count":1},{"year":2017,"cited_by_count":1},{"year":2016,"cited_by_count":3},{"year":2015,"cited_by_count":2}],"updated_date":"2025-03-18T11:36:00.760986","created_date":"2016-06-24"}