{"id":"https://openalex.org/W2125453829","doi":"https://doi.org/10.1109/tvlsi.2009.2020594","title":"Transistor Variability Modeling and its Validation With Ring-Oscillation Frequencies for Body-Biased Subthreshold Circuits","display_name":"Transistor Variability Modeling and its Validation With Ring-Oscillation Frequencies for Body-Biased Subthreshold Circuits","publication_year":2009,"publication_date":"2009-08-21","ids":{"openalex":"https://openalex.org/W2125453829","doi":"https://doi.org/10.1109/tvlsi.2009.2020594","mag":"2125453829"},"language":"en","primary_location":{"is_oa":false,"landing_page_url":"https://doi.org/10.1109/tvlsi.2009.2020594","pdf_url":null,"source":{"id":"https://openalex.org/S37538908","display_name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","issn_l":"1063-8210","issn":["1063-8210","1557-9999"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false},"type":"article","type_crossref":"journal-article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5004321250","display_name":"Hiroshi Fuketa","orcid":"https://orcid.org/0000-0003-0171-6679"},"institutions":[{"id":"https://openalex.org/I4210086780","display_name":"Japan Science and Technology Agency","ror":"https://ror.org/00097mb19","country_code":"JP","type":"government","lineage":["https://openalex.org/I4210086780"]},{"id":"https://openalex.org/I98285908","display_name":"Osaka University","ror":"https://ror.org/035t8zc32","country_code":"JP","type":"education","lineage":["https://openalex.org/I98285908"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Hiroshi Fuketa","raw_affiliation_strings":["Department of Information Systems Engineering, Osaka University, Osaka, Japan","JST, Japan Science and Technology Agency-CREST, Tokyo, Japan"],"affiliations":[{"raw_affiliation_string":"JST, Japan Science and Technology Agency-CREST, Tokyo, Japan","institution_ids":["https://openalex.org/I4210086780"]},{"raw_affiliation_string":"Department of Information Systems Engineering, Osaka University, Osaka, Japan","institution_ids":["https://openalex.org/I98285908"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5002405139","display_name":"Masanori Hashimoto","orcid":"https://orcid.org/0000-0002-0377-2108"},"institutions":[{"id":"https://openalex.org/I4210086780","display_name":"Japan Science and Technology Agency","ror":"https://ror.org/00097mb19","country_code":"JP","type":"government","lineage":["https://openalex.org/I4210086780"]},{"id":"https://openalex.org/I98285908","display_name":"Osaka University","ror":"https://ror.org/035t8zc32","country_code":"JP","type":"education","lineage":["https://openalex.org/I98285908"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Masanori Hashimoto","raw_affiliation_strings":["Department of Information Systems Engineering, Osaka University, Osaka, Japan","JST, Japan Science and Technology Agency-CREST, Tokyo, Japan"],"affiliations":[{"raw_affiliation_string":"JST, Japan Science and Technology Agency-CREST, Tokyo, Japan","institution_ids":["https://openalex.org/I4210086780"]},{"raw_affiliation_string":"Department of Information Systems Engineering, Osaka University, Osaka, Japan","institution_ids":["https://openalex.org/I98285908"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5015621925","display_name":"Yukio Mitsuyama","orcid":"https://orcid.org/0000-0001-8151-0085"},"institutions":[{"id":"https://openalex.org/I4210086780","display_name":"Japan Science and Technology Agency","ror":"https://ror.org/00097mb19","country_code":"JP","type":"government","lineage":["https://openalex.org/I4210086780"]},{"id":"https://openalex.org/I98285908","display_name":"Osaka University","ror":"https://ror.org/035t8zc32","country_code":"JP","type":"education","lineage":["https://openalex.org/I98285908"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Yukio Mitsuyama","raw_affiliation_strings":["Department of Information Systems Engineering, Osaka University, Osaka, Japan","JST, Japan Science and Technology Agency-CREST, Tokyo, Japan"],"affiliations":[{"raw_affiliation_string":"JST, Japan Science and Technology Agency-CREST, Tokyo, Japan","institution_ids":["https://openalex.org/I4210086780"]},{"raw_affiliation_string":"Department of Information Systems Engineering, Osaka University, Osaka, Japan","institution_ids":["https://openalex.org/I98285908"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5061693379","display_name":"Takao Onoye","orcid":"https://orcid.org/0000-0002-1894-2448"},"institutions":[{"id":"https://openalex.org/I4210086780","display_name":"Japan Science and Technology Agency","ror":"https://ror.org/00097mb19","country_code":"JP","type":"government","lineage":["https://openalex.org/I4210086780"]},{"id":"https://openalex.org/I98285908","display_name":"Osaka University","ror":"https://ror.org/035t8zc32","country_code":"JP","type":"education","lineage":["https://openalex.org/I98285908"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Takao Onoye","raw_affiliation_strings":["Department of Information Systems Engineering, Osaka University, Osaka, Japan","JST, Japan Science and Technology Agency-CREST, Tokyo, Japan"],"affiliations":[{"raw_affiliation_string":"JST, Japan Science and Technology Agency-CREST, Tokyo, Japan","institution_ids":["https://openalex.org/I4210086780"]},{"raw_affiliation_string":"Department of Information Systems Engineering, Osaka University, Osaka, Japan","institution_ids":["https://openalex.org/I98285908"]}]}],"institution_assertions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.962,"has_fulltext":true,"fulltext_origin":"ngrams","cited_by_count":14,"citation_normalized_percentile":{"value":0.740841,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":86,"max":87},"biblio":{"volume":"18","issue":"7","first_page":"1118","last_page":"1129"},"is_retracted":false,"is_paratext":false,"primary_topic":{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/subthreshold-conduction","display_name":"Subthreshold conduction","score":0.8773848},{"id":"https://openalex.org/keywords/oscillation","display_name":"Oscillation (cell signaling)","score":0.5621659},{"id":"https://openalex.org/keywords/biasing","display_name":"Biasing","score":0.47036216},{"id":"https://openalex.org/keywords/ring-oscillator","display_name":"Ring oscillator","score":0.41271946}],"concepts":[{"id":"https://openalex.org/C156465305","wikidata":"https://www.wikidata.org/wiki/Q1658601","display_name":"Subthreshold conduction","level":4,"score":0.8773848},{"id":"https://openalex.org/C197162436","wikidata":"https://www.wikidata.org/wiki/Q83908","display_name":"NMOS logic","level":4,"score":0.83704853},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.7025488},{"id":"https://openalex.org/C195370968","wikidata":"https://www.wikidata.org/wiki/Q1754002","display_name":"Threshold voltage","level":4,"score":0.6766597},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.6476591},{"id":"https://openalex.org/C2778439541","wikidata":"https://www.wikidata.org/wiki/Q7106412","display_name":"Oscillation (cell signaling)","level":2,"score":0.5621659},{"id":"https://openalex.org/C20254490","wikidata":"https://www.wikidata.org/wiki/Q719550","display_name":"Biasing","level":3,"score":0.47036216},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.46656954},{"id":"https://openalex.org/C131017901","wikidata":"https://www.wikidata.org/wiki/Q170451","display_name":"Logic gate","level":2,"score":0.425043},{"id":"https://openalex.org/C104111718","wikidata":"https://www.wikidata.org/wiki/Q2153973","display_name":"Ring oscillator","level":3,"score":0.41271946},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.3740893},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.3519762},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.3445242},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.34145212},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.32813427},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.31444},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.18734935},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C54355233","wikidata":"https://www.wikidata.org/wiki/Q7162","display_name":"Genetics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"is_oa":false,"landing_page_url":"https://doi.org/10.1109/tvlsi.2009.2020594","pdf_url":null,"source":{"id":"https://openalex.org/S37538908","display_name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","issn_l":"1063-8210","issn":["1063-8210","1557-9999"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy","score":0.6}],"grants":[],"datasets":[],"versions":[],"referenced_works_count":24,"referenced_works":["https://openalex.org/W1607087355","https://openalex.org/W1607434217","https://openalex.org/W1968803376","https://openalex.org/W2017216250","https://openalex.org/W2046304309","https://openalex.org/W2101466451","https://openalex.org/W2104010258","https://openalex.org/W2111372718","https://openalex.org/W2118456809","https://openalex.org/W2126811283","https://openalex.org/W2133256259","https://openalex.org/W2137297592","https://openalex.org/W2139746732","https://openalex.org/W2142410062","https://openalex.org/W2150526221","https://openalex.org/W2152154820","https://openalex.org/W2163165699","https://openalex.org/W2171086277","https://openalex.org/W2477509976","https://openalex.org/W2490765418","https://openalex.org/W3147289055","https://openalex.org/W4239145761","https://openalex.org/W4252078645","https://openalex.org/W649475307"],"related_works":["https://openalex.org/W3004587385","https://openalex.org/W2918058197","https://openalex.org/W2802491393","https://openalex.org/W2745127909","https://openalex.org/W2537099411","https://openalex.org/W2521656715","https://openalex.org/W2357026499","https://openalex.org/W2009852498","https://openalex.org/W1991521745","https://openalex.org/W1793154485"],"abstract_inverted_index":{"This":[0],"paper":[1],"presents":[2],"transistor":[3],"variability":[4],"modeling":[5,91],"and":[6,31,36,50,71,89],"its":[7],"validation":[8],"for":[9],"body-biased":[10],"subthreshold":[11,60,72],"circuits":[12,61],"based":[13],"on":[14],"measurements":[15],"of":[16,28],"a":[17,21],"device-array":[18],"circuit":[19],"using":[20],"90-nm":[22],"technology.":[23],"The":[24],"device":[25],"array":[26],"consists":[27],"p/nMOS":[29],"transistors":[30],"ring":[32],"oscillators.":[33],"We":[34,54,75],"examine":[35],"confirm":[37],"the":[38,41],"correlation":[39],"between":[40],"performance":[42],"variation":[43],"model":[44],"extracted":[45],"from":[46],"measured":[47],"I-V":[48],"characteristics":[49],"fabricated":[51],"oscillation":[52],"frequencies.":[53],"demonstrate":[55],"that":[56,78],"delay":[57],"variations":[58],"in":[59],"are":[62],"well":[63],"characterized":[64],"with":[65],"two":[66],"parameters,":[67],"i.e.,":[68],"threshold":[69,79],"voltage":[70,80],"swing":[73],"parameter.":[74],"also":[76],"reveal":[77],"shift":[81],"by":[82],"body":[83],"biasing":[84],"can":[85],"be":[86],"deterministically":[87],"modeled":[88],"statistical":[90],"is":[92],"less":[93],"meaningful.":[94]},"cited_by_api_url":"https://api.openalex.org/works?filter=cites:W2125453829","counts_by_year":[{"year":2017,"cited_by_count":2},{"year":2016,"cited_by_count":3},{"year":2015,"cited_by_count":1},{"year":2014,"cited_by_count":2},{"year":2013,"cited_by_count":1}],"updated_date":"2024-12-12T19:00:40.701733","created_date":"2016-06-24"}