{"id":"https://openalex.org/W2888013597","doi":"https://doi.org/10.1109/tim.2018.2861078","title":"Nondestructive Evaluation of Microwave-Penetrable Pipes by Synthetic Aperture Imaging Enhanced by Full-Wave Field Propagation Model","display_name":"Nondestructive Evaluation of Microwave-Penetrable Pipes by Synthetic Aperture Imaging Enhanced by Full-Wave Field Propagation Model","publication_year":2018,"publication_date":"2018-08-20","ids":{"openalex":"https://openalex.org/W2888013597","doi":"https://doi.org/10.1109/tim.2018.2861078","mag":"2888013597"},"language":"en","primary_location":{"is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2018.2861078","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_indexed_in_scopus":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false},"type":"article","type_crossref":"journal-article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"https://digibuo.uniovi.es/dspace/bitstream/10651/49865/1/Nondestructive.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5036664118","display_name":"Jaime Laviada","orcid":"https://orcid.org/0000-0002-6501-4353"},"institutions":[{"id":"https://openalex.org/I165339363","display_name":"Universidad de Oviedo","ror":"https://ror.org/006gksa02","country_code":"ES","type":"education","lineage":["https://openalex.org/I165339363"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"Jaime Laviada","raw_affiliation_strings":["Department of Electrical Engineering, University of Oviedo, Oviedo, Spain"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, University of Oviedo, Oviedo, Spain","institution_ids":["https://openalex.org/I165339363"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5033070561","display_name":"Baolong Wu","orcid":"https://orcid.org/0000-0003-1644-0716"},"institutions":[{"id":"https://openalex.org/I20382870","display_name":"Missouri University of Science and Technology","ror":"https://ror.org/00scwqd12","country_code":"US","type":"education","lineage":["https://openalex.org/I20382870"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Baolong Wu","raw_affiliation_strings":["Department of Electrical Engineering, Missouri University of Science and Technology, Rolla, MO, USA"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Missouri University of Science and Technology, Rolla, MO, USA","institution_ids":["https://openalex.org/I20382870"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5110664538","display_name":"Mohammad Tayeb Ghasr","orcid":null},"institutions":[{"id":"https://openalex.org/I20382870","display_name":"Missouri University of Science and Technology","ror":"https://ror.org/00scwqd12","country_code":"US","type":"education","lineage":["https://openalex.org/I20382870"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Mohammad Tayeb Ghasr","raw_affiliation_strings":["Applied Microwave Nondestructive Testing Laboratory, Missouri University of Science and Technology, Rolla, MO, USA"],"affiliations":[{"raw_affiliation_string":"Applied Microwave Nondestructive Testing Laboratory, Missouri University of Science and Technology, Rolla, MO, USA","institution_ids":["https://openalex.org/I20382870"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5088505165","display_name":"Reza Zoughi","orcid":"https://orcid.org/0000-0001-9421-1551"},"institutions":[{"id":"https://openalex.org/I20382870","display_name":"Missouri University of Science and Technology","ror":"https://ror.org/00scwqd12","country_code":"US","type":"education","lineage":["https://openalex.org/I20382870"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Reza Zoughi","raw_affiliation_strings":["Applied Microwave Nondestructive Testing Laboratory, Missouri University of Science and Technology, Rolla, MO, USA"],"affiliations":[{"raw_affiliation_string":"Applied Microwave Nondestructive Testing Laboratory, Missouri University of Science and Technology, Rolla, MO, USA","institution_ids":["https://openalex.org/I20382870"]}]}],"institution_assertions":[],"countries_distinct_count":2,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":1.728,"has_fulltext":true,"fulltext_origin":"pdf","cited_by_count":39,"citation_normalized_percentile":{"value":0.847564,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":95,"max":96},"biblio":{"volume":"68","issue":"4","first_page":"1112","last_page":"1119"},"is_retracted":false,"is_paratext":false,"primary_topic":{"id":"https://openalex.org/T11739","display_name":"Microwave Imaging and Scattering Analysis","score":0.9999,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11739","display_name":"Microwave Imaging and Scattering Analysis","score":0.9999,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11609","display_name":"Geophysical Methods and Applications","score":0.9998,"subfield":{"id":"https://openalex.org/subfields/2212","display_name":"Ocean Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10662","display_name":"Ultrasonics and Acoustic Wave Propagation","score":0.9994,"subfield":{"id":"https://openalex.org/subfields/2211","display_name":"Mechanics of Materials"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/microwave-imaging","display_name":"Microwave Imaging","score":0.6808444},{"id":"https://openalex.org/keywords/aperture","display_name":"Aperture (computer memory)","score":0.5707083}],"concepts":[{"id":"https://openalex.org/C2779885931","wikidata":"https://www.wikidata.org/wiki/Q17010029","display_name":"Microwave imaging","level":3,"score":0.6808444},{"id":"https://openalex.org/C44838205","wikidata":"https://www.wikidata.org/wiki/Q127995","display_name":"Microwave","level":2,"score":0.60430086},{"id":"https://openalex.org/C78336883","wikidata":"https://www.wikidata.org/wiki/Q4779385","display_name":"Aperture (computer memory)","level":2,"score":0.5707083},{"id":"https://openalex.org/C87360688","wikidata":"https://www.wikidata.org/wiki/Q740686","display_name":"Synthetic aperture radar","level":2,"score":0.518914},{"id":"https://openalex.org/C102519508","wikidata":"https://www.wikidata.org/wiki/Q6520159","display_name":"Fourier transform","level":2,"score":0.5183738},{"id":"https://openalex.org/C140779682","wikidata":"https://www.wikidata.org/wiki/Q210868","display_name":"Sampling (signal processing)","level":3,"score":0.5120483},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.5071149},{"id":"https://openalex.org/C205372480","wikidata":"https://www.wikidata.org/wiki/Q210521","display_name":"Image resolution","level":2,"score":0.4855363},{"id":"https://openalex.org/C133386390","wikidata":"https://www.wikidata.org/wiki/Q184996","display_name":"Dielectric","level":2,"score":0.48207265},{"id":"https://openalex.org/C24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","level":1,"score":0.47650138},{"id":"https://openalex.org/C56529433","wikidata":"https://www.wikidata.org/wiki/Q626700","display_name":"Nondestructive testing","level":2,"score":0.47111797},{"id":"https://openalex.org/C138268822","wikidata":"https://www.wikidata.org/wiki/Q1051925","display_name":"Resolution (logic)","level":2,"score":0.4669135},{"id":"https://openalex.org/C106131492","wikidata":"https://www.wikidata.org/wiki/Q3072260","display_name":"Filter (signal processing)","level":2,"score":0.46672857},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.36490864},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.2765348},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.23891869},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.14936444},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.12291703},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.11267263},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2018.2861078","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_indexed_in_scopus":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false},{"is_oa":true,"landing_page_url":"http://hdl.handle.net/10651/49865","pdf_url":"https://digibuo.uniovi.es/dspace/bitstream/10651/49865/1/Nondestructive.pdf","source":{"id":"https://openalex.org/S4306402641","display_name":"LA Referencia (Red Federada de Repositorios Institucionales de Publicaciones Cient\u00edficas)","issn_l":null,"issn":null,"is_oa":true,"is_in_doaj":false,"is_indexed_in_scopus":false,"is_core":false,"host_organization":"https://openalex.org/I4383465926","host_organization_name":"LA Referencia","host_organization_lineage":["https://openalex.org/I4383465926"],"host_organization_lineage_names":["LA Referencia"],"type":"repository"},"license":"cc-by-nc-nd","license_id":"https://openalex.org/licenses/cc-by-nc-nd","version":"submittedVersion","is_accepted":false,"is_published":false}],"best_oa_location":{"is_oa":true,"landing_page_url":"http://hdl.handle.net/10651/49865","pdf_url":"https://digibuo.uniovi.es/dspace/bitstream/10651/49865/1/Nondestructive.pdf","source":{"id":"https://openalex.org/S4306402641","display_name":"LA Referencia (Red Federada de Repositorios Institucionales de Publicaciones Cient\u00edficas)","issn_l":null,"issn":null,"is_oa":true,"is_in_doaj":false,"is_indexed_in_scopus":false,"is_core":false,"host_organization":"https://openalex.org/I4383465926","host_organization_name":"LA Referencia","host_organization_lineage":["https://openalex.org/I4383465926"],"host_organization_lineage_names":["LA Referencia"],"type":"repository"},"license":"cc-by-nc-nd","license_id":"https://openalex.org/licenses/cc-by-nc-nd","version":"submittedVersion","is_accepted":false,"is_published":false},"sustainable_development_goals":[],"grants":[{"funder":"https://openalex.org/F4320322930","funder_display_name":"Ministerio de Ciencia e Innovaci\u00f3n","award_id":"TEC2014-55290-JIN"}],"datasets":[],"versions":[],"referenced_works_count":33,"referenced_works":["https://openalex.org/W1520664314","https://openalex.org/W1968175153","https://openalex.org/W1986401287","https://openalex.org/W1989896884","https://openalex.org/W1990112477","https://openalex.org/W2031151030","https://openalex.org/W2035209279","https://openalex.org/W2048609580","https://openalex.org/W2053439269","https://openalex.org/W2072982993","https://openalex.org/W2077253027","https://openalex.org/W2078940259","https://openalex.org/W2082205811","https://openalex.org/W2082246398","https://openalex.org/W2086521824","https://openalex.org/W2089458193","https://openalex.org/W2090478622","https://openalex.org/W2096183784","https://openalex.org/W2124784826","https://openalex.org/W2135896044","https://openalex.org/W2146914409","https://openalex.org/W2147373126","https://openalex.org/W2151187453","https://openalex.org/W2155684415","https://openalex.org/W2158162544","https://openalex.org/W2169970830","https://openalex.org/W2171647728","https://openalex.org/W2478138006","https://openalex.org/W2559152504","https://openalex.org/W2790410577","https://openalex.org/W3159137032","https://openalex.org/W4241986569","https://openalex.org/W599284720"],"related_works":["https://openalex.org/W3212166813","https://openalex.org/W3002438267","https://openalex.org/W2967842629","https://openalex.org/W2902671820","https://openalex.org/W2349790901","https://openalex.org/W2332954643","https://openalex.org/W2152662390","https://openalex.org/W2088219304","https://openalex.org/W2043230455","https://openalex.org/W2008518276"],"abstract_inverted_index":{"A":[0],"qualitative":[1],"approach":[2,18,67],"for":[3,35,68],"microwave":[4],"imaging":[5,26,116],"multilayered":[6],"cylindrical":[7],"structures":[8,75],"(e.g.,":[9],"dielectric":[10,125],"pipes)":[11],"is":[12,76,110],"proposed":[13],"in":[14,56],"this":[15,72],"paper.":[16],"This":[17],"relies":[19],"on":[20],"a":[21,52,63],"modified":[22],"circular":[23],"synthetic":[24],"aperture":[25],"technique":[27,92,102],"that":[28],"exploits":[29],"closed-form":[30],"Green's":[31],"function":[32],"to":[33,82],"account":[34],"the":[36,69,79,84,91,101,108],"different":[37,122],"propagation":[38],"delays,":[39],"internal":[40],"reflections,":[41],"and":[42,65,98,119],"refractions.":[43],"The":[44,105],"image":[45],"can":[46],"then":[47],"be":[48],"computed":[49],"by":[50],"employing":[51],"matched":[53],"filter":[54],"expressed":[55],"terms":[57],"of":[58,71,74,90,100,107,117,124],"efficient":[59],"Fourier":[60],"Transforms.":[61],"Consequently,":[62],"high-resolution":[64],"contactless":[66],"inspection":[70],"kind":[73],"achieved.":[77],"Moreover,":[78],"computational":[80],"resources":[81],"render":[83],"images":[85],"are":[86,103],"negligible.":[87],"Practical":[88],"aspects":[89],"such":[93],"as":[94],"sampling":[95],"criteria,":[96],"resolution,":[97],"limitations":[99],"discussed.":[104],"efficacy":[106],"method":[109],"illustrated":[111],"via":[112],"several":[113],"examples":[114],"including":[115],"objects":[118],"anomalies":[120],"inside":[121],"types":[123],"pipes.":[126]},"cited_by_api_url":"https://api.openalex.org/works?filter=cites:W2888013597","counts_by_year":[{"year":2024,"cited_by_count":11},{"year":2023,"cited_by_count":6},{"year":2022,"cited_by_count":5},{"year":2021,"cited_by_count":3},{"year":2020,"cited_by_count":9},{"year":2019,"cited_by_count":4},{"year":2018,"cited_by_count":1}],"updated_date":"2025-01-19T21:54:12.458227","created_date":"2018-08-31"}