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{"id":"https://openalex.org/W1549717814","doi":"https://doi.org/10.1109/tim.2012.2202183","title":"Measurement Setup for Imaging Applications Using Frequency Scanning Illumination","display_name":"Measurement Setup for Imaging Applications Using Frequency Scanning Illumination","publication_year":2012,"publication_date":"2012-06-20","ids":{"openalex":"https://openalex.org/W1549717814","doi":"https://doi.org/10.1109/tim.2012.2202183","mag":"1549717814"},"language":"en","primary_location":{"is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2012.2202183","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false},"type":"article","type_crossref":"journal-article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5084445588","display_name":"Yuri \u00c1lvarez","orcid":"https://orcid.org/0000-0003-3625-4515"},"institutions":[{"id":"https://openalex.org/I165339363","display_name":"Universidad de Oviedo","ror":"https://ror.org/006gksa02","country_code":"ES","type":"education","lineage":["https://openalex.org/I165339363"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"Yuri Alvarez","raw_affiliation_strings":["Dept. of Electr. Eng., Univ. de Oviedo, Gijo\u0301n, Spain"],"affiliations":[{"raw_affiliation_string":"Dept. of Electr. Eng., Univ. de Oviedo, Gijo\u0301n, Spain","institution_ids":["https://openalex.org/I165339363"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5008019481","display_name":"Cebri\u00e1n Garc\u00eda Gonz\u00e1lez","orcid":null},"institutions":[{"id":"https://openalex.org/I165339363","display_name":"Universidad de Oviedo","ror":"https://ror.org/006gksa02","country_code":"ES","type":"education","lineage":["https://openalex.org/I165339363"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"Cebri\u00e1n Garcia Gonzalez","raw_affiliation_strings":["Dept. of Electr. Eng., Univ. de Oviedo, Gijo\u0301n, Spain"],"affiliations":[{"raw_affiliation_string":"Dept. of Electr. Eng., Univ. de Oviedo, Gijo\u0301n, Spain","institution_ids":["https://openalex.org/I165339363"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5049661943","display_name":"C. V\u00e1zquez","orcid":"https://orcid.org/0000-0003-1023-9464"},"institutions":[{"id":"https://openalex.org/I165339363","display_name":"Universidad de Oviedo","ror":"https://ror.org/006gksa02","country_code":"ES","type":"education","lineage":["https://openalex.org/I165339363"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"Carlos Vazquez Antuna","raw_affiliation_strings":["Dept. of Electr. Eng., Univ. de Oviedo, Gijo\u0301n, Spain"],"affiliations":[{"raw_affiliation_string":"Dept. of Electr. Eng., Univ. de Oviedo, Gijo\u0301n, Spain","institution_ids":["https://openalex.org/I165339363"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5031318165","display_name":"S. Ver Hoeye","orcid":"https://orcid.org/0000-0002-4592-7921"},"institutions":[{"id":"https://openalex.org/I165339363","display_name":"Universidad de Oviedo","ror":"https://ror.org/006gksa02","country_code":"ES","type":"education","lineage":["https://openalex.org/I165339363"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"Samuel Ver-Hoeye","raw_affiliation_strings":["Dept. of Electr. Eng., Univ. de Oviedo, Gijo\u0301n, Spain"],"affiliations":[{"raw_affiliation_string":"Dept. of Electr. Eng., Univ. de Oviedo, Gijo\u0301n, Spain","institution_ids":["https://openalex.org/I165339363"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5037285626","display_name":"Fernando Las\u2010Heras","orcid":"https://orcid.org/0000-0001-7959-2114"},"institutions":[{"id":"https://openalex.org/I165339363","display_name":"Universidad de Oviedo","ror":"https://ror.org/006gksa02","country_code":"ES","type":"education","lineage":["https://openalex.org/I165339363"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"Fernando Las-Heras","raw_affiliation_strings":["Dept. of Electr. Eng., Univ. de Oviedo, Gijo\u0301n, Spain"],"affiliations":[{"raw_affiliation_string":"Dept. of Electr. Eng., Univ. de Oviedo, Gijo\u0301n, Spain","institution_ids":["https://openalex.org/I165339363"]}]}],"institution_assertions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.751,"has_fulltext":true,"fulltext_origin":"ngrams","cited_by_count":10,"citation_normalized_percentile":{"value":0.786784,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":85,"max":86},"biblio":{"volume":"61","issue":"11","first_page":"3014","last_page":"3023"},"is_retracted":false,"is_paratext":false,"primary_topic":{"id":"https://openalex.org/T11739","display_name":"Microwave Imaging and Scattering Analysis","score":0.9999,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11739","display_name":"Microwave Imaging and Scattering Analysis","score":0.9999,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11609","display_name":"Geophysical Methods and Applications","score":0.999,"subfield":{"id":"https://openalex.org/subfields/2212","display_name":"Ocean Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10662","display_name":"Ultrasonics and Acoustic Wave Propagation","score":0.998,"subfield":{"id":"https://openalex.org/subfields/2211","display_name":"Mechanics of Materials"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.42848653},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.3709746},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.3469431},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.26206744}],"mesh":[],"locations_count":1,"locations":[{"is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2012.2202183","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false}],"best_oa_location":null,"sustainable_development_goals":[],"grants":[],"datasets":[],"versions":[],"referenced_works_count":40,"referenced_works":["https://openalex.org/W1935324113","https://openalex.org/W1980591793","https://openalex.org/W1982216300","https://openalex.org/W1983156504","https://openalex.org/W1983322501","https://openalex.org/W1984600520","https://openalex.org/W2006267409","https://openalex.org/W2016058922","https://openalex.org/W2019015024","https://openalex.org/W2045660410","https://openalex.org/W2067623195","https://openalex.org/W2077732594","https://openalex.org/W2083091586","https://openalex.org/W2089259825","https://openalex.org/W2097755296","https://openalex.org/W2098392198","https://openalex.org/W2105822786","https://openalex.org/W2105912070","https://openalex.org/W2107968935","https://openalex.org/W2108502139","https://openalex.org/W2112311684","https://openalex.org/W2113355502","https://openalex.org/W2113509352","https://openalex.org/W2115305326","https://openalex.org/W2120617573","https://openalex.org/W2130914893","https://openalex.org/W2133144178","https://openalex.org/W2138839718","https://openalex.org/W2141651258","https://openalex.org/W2146071808","https://openalex.org/W2147958867","https://openalex.org/W2150105673","https://openalex.org/W2155678742","https://openalex.org/W2155684415","https://openalex.org/W2162245694","https://openalex.org/W2165299182","https://openalex.org/W2168790535","https://openalex.org/W2171552807","https://openalex.org/W2187989542","https://openalex.org/W2188820828"],"related_works":["https://openalex.org/W4390401159","https://openalex.org/W4388998267","https://openalex.org/W4246450666","https://openalex.org/W4230250635","https://openalex.org/W3120461830","https://openalex.org/W3041790586","https://openalex.org/W2898370298","https://openalex.org/W2748952813","https://openalex.org/W2744391499","https://openalex.org/W2137437058"],"abstract_inverted_index":{"A":[0],"measurement":[1,16],"setup":[2,17,80,113],"for":[3,82],"imaging":[4,21],"applications":[5],"is":[6,10,64],"presented.":[7],"The":[8],"idea":[9],"to":[11,18,66,73,89,109,117],"reuse":[12],"an":[13,57],"existing":[14],"antenna":[15,28],"develop":[19],"the":[20,32,36,52,68,75,78,83,87,111,120],"system":[22],"by":[23,45],"using":[24],"a":[25,48],"frequency":[26,49,121],"scanning":[27,122],"array":[29],"that":[30],"focuses":[31],"incident":[33],"field":[34,55],"on":[35,61],"object":[37],"under":[38],"test":[39,110],"(OUT)":[40],"at":[41],"different":[42],"angular":[43],"positions":[44],"means":[46],"of":[47,77,85],"sweep.":[50],"From":[51],"measured":[53],"total":[54],"data,":[56],"inverse":[58],"technique":[59],"based":[60],"source":[62],"reconstruction":[63],"proposed":[65,79,112],"recover":[67],"OUT":[69],"profile.":[70],"In":[71],"order":[72],"check":[74],"feasibility":[76],"and":[81,103],"sake":[84],"simplicity,":[86],"OUTs":[88],"be":[90],"dealt":[91],"with":[92],"present":[93],"translation":[94],"symmetry":[95],"along":[96],"one":[97],"dimension":[98],"(2-D":[99],"problems).":[100],"Measurement":[101],"results":[102],"full-wave":[104],"method-of-moment":[105],"simulations":[106],"are":[107],"presented":[108],"as":[114,116],"well":[115],"point":[118],"out":[119],"capabilities.":[123]},"cited_by_api_url":"https://api.openalex.org/works?filter=cites:W1549717814","counts_by_year":[{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":1},{"year":2018,"cited_by_count":1},{"year":2017,"cited_by_count":1},{"year":2016,"cited_by_count":1},{"year":2015,"cited_by_count":2},{"year":2013,"cited_by_count":1},{"year":2012,"cited_by_count":1}],"updated_date":"2024-12-13T09:56:48.334165","created_date":"2016-06-24"}