乐胖代购免代理版

{"id":"https://openalex.org/W2122230150","doi":"https://doi.org/10.1109/tim.2010.2047126","title":"Evaluation of Low-Frequency Characteristic of a Thermal Converter Using Programmable Josephson Voltage Standard","display_name":"Evaluation of Low-Frequency Characteristic of a Thermal Converter Using Programmable Josephson Voltage Standard","publication_year":2010,"publication_date":"2010-05-26","ids":{"openalex":"https://openalex.org/W2122230150","doi":"https://doi.org/10.1109/tim.2010.2047126","mag":"2122230150"},"language":"en","primary_location":{"is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2010.2047126","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false},"type":"article","type_crossref":"journal-article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5101703306","display_name":"Hitoshi Sasaki","orcid":"https://orcid.org/0000-0003-1410-4217"},"institutions":[{"id":"https://openalex.org/I73613424","display_name":"National Institute of Advanced Industrial Science and Technology","ror":"https://ror.org/01703db54","country_code":"JP","type":"government","lineage":["https://openalex.org/I73613424"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Hitoshi Sasaki","raw_affiliation_strings":["Nat. Inst. of Adv. Ind. Sci. & Technol., Tsukuba, Japan"],"affiliations":[{"raw_affiliation_string":"Nat. Inst. of Adv. Ind. Sci. & Technol., Tsukuba, Japan","institution_ids":["https://openalex.org/I73613424"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5028740407","display_name":"Hirotake Yamamori","orcid":"https://orcid.org/0000-0002-7296-711X"},"institutions":[{"id":"https://openalex.org/I73613424","display_name":"National Institute of Advanced Industrial Science and Technology","ror":"https://ror.org/01703db54","country_code":"JP","type":"government","lineage":["https://openalex.org/I73613424"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Hirotake Yamamori","raw_affiliation_strings":["Nat. Inst. of Adv. Ind. Sci. & Technol., Tsukuba, Japan"],"affiliations":[{"raw_affiliation_string":"Nat. Inst. of Adv. Ind. Sci. & Technol., Tsukuba, Japan","institution_ids":["https://openalex.org/I73613424"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5103431466","display_name":"Takahiro Yamada","orcid":"https://orcid.org/0000-0002-6827-2016"},"institutions":[{"id":"https://openalex.org/I73613424","display_name":"National Institute of Advanced Industrial Science and Technology","ror":"https://ror.org/01703db54","country_code":"JP","type":"government","lineage":["https://openalex.org/I73613424"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Takahiro Yamada","raw_affiliation_strings":["Nat. Inst. of Adv. Ind. Sci. & Technol., Tsukuba, Japan"],"affiliations":[{"raw_affiliation_string":"Nat. Inst. of Adv. Ind. Sci. & Technol., Tsukuba, Japan","institution_ids":["https://openalex.org/I73613424"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5001971007","display_name":"Hiroyuki FUJIKI","orcid":null},"institutions":[{"id":"https://openalex.org/I73613424","display_name":"National Institute of Advanced Industrial Science and Technology","ror":"https://ror.org/01703db54","country_code":"JP","type":"government","lineage":["https://openalex.org/I73613424"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Hiroyuki Fujiki","raw_affiliation_strings":["Nat. Inst. of Adv. Ind. Sci. & Technol., Tsukuba, Japan"],"affiliations":[{"raw_affiliation_string":"Nat. Inst. of Adv. Ind. Sci. & Technol., Tsukuba, Japan","institution_ids":["https://openalex.org/I73613424"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5108771346","display_name":"Akira Shoji","orcid":null},"institutions":[{"id":"https://openalex.org/I73613424","display_name":"National Institute of Advanced Industrial Science and Technology","ror":"https://ror.org/01703db54","country_code":"JP","type":"government","lineage":["https://openalex.org/I73613424"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Akira Shoji","raw_affiliation_strings":["Nat. Inst. of Adv. Ind. Sci. & Technol., Tsukuba, Japan"],"affiliations":[{"raw_affiliation_string":"Nat. Inst. of Adv. Ind. Sci. & Technol., Tsukuba, Japan","institution_ids":["https://openalex.org/I73613424"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5082546349","display_name":"Ilya Budovsky","orcid":"https://orcid.org/0000-0003-1456-1784"},"institutions":[{"id":"https://openalex.org/I1319171921","display_name":"National Measurement Institute","ror":"https://ror.org/03be3fb73","country_code":"AU","type":"government","lineage":["https://openalex.org/I1319171921","https://openalex.org/I2801453606","https://openalex.org/I4387156119"]}],"countries":["AU"],"is_corresponding":false,"raw_author_name":"Ilya Budovsky","raw_affiliation_strings":["Nat. Meas. Inst., Lindfield, NSW, Australia"],"affiliations":[{"raw_affiliation_string":"Nat. Meas. Inst., Lindfield, NSW, Australia","institution_ids":["https://openalex.org/I1319171921"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5076082725","display_name":"Koji Shimizume","orcid":null},"institutions":[],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Koji Shimizume","raw_affiliation_strings":["Nikkohm Co., Ltd., Aomori, Japan"],"affiliations":[{"raw_affiliation_string":"Nikkohm Co., Ltd., Aomori, Japan","institution_ids":[]}]}],"institution_assertions":[],"countries_distinct_count":2,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":1.172,"has_fulltext":true,"fulltext_origin":"ngrams","cited_by_count":16,"citation_normalized_percentile":{"value":0.830695,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":87,"max":88},"biblio":{"volume":"59","issue":"11","first_page":"2930","last_page":"2935"},"is_retracted":false,"is_paratext":false,"primary_topic":{"id":"https://openalex.org/T12300","display_name":"Frequency Estimation in Electrical Metrology","score":0.9999,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12300","display_name":"Frequency Estimation in Electrical Metrology","score":0.9999,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10573","display_name":"Power Quality Analysis and Mitigation Techniques","score":0.9766,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11890","display_name":"Measurement and Uncertainty Evaluation","score":0.9678,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/josephson-voltage-standards","display_name":"Josephson Voltage Standards","score":0.584651},{"id":"https://openalex.org/keywords/ac-voltage-standards","display_name":"AC Voltage Standards","score":0.547024},{"id":"https://openalex.org/keywords/thermal-transfer","display_name":"Thermal transfer","score":0.42176485}],"concepts":[{"id":"https://openalex.org/C197424946","wikidata":"https://www.wikidata.org/wiki/Q1165717","display_name":"Waveform","level":3,"score":0.6523474},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.6233354},{"id":"https://openalex.org/C4846943","wikidata":"https://www.wikidata.org/wiki/Q4241150","display_name":"Cryocooler","level":2,"score":0.58031374},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.5487429},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.48077387},{"id":"https://openalex.org/C204530211","wikidata":"https://www.wikidata.org/wiki/Q752823","display_name":"Thermal","level":2,"score":0.44279203},{"id":"https://openalex.org/C2779478220","wikidata":"https://www.wikidata.org/wiki/Q3312622","display_name":"Thermal transfer","level":3,"score":0.42176485},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.41740182},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.41650644},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.35347462},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.13164431},{"id":"https://openalex.org/C153294291","wikidata":"https://www.wikidata.org/wiki/Q25261","display_name":"Meteorology","level":1,"score":0.0},{"id":"https://openalex.org/C109693293","wikidata":"https://www.wikidata.org/wiki/Q1496072","display_name":"Inkwell","level":2,"score":0.0},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2010.2047126","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy","score":0.85}],"grants":[],"datasets":[],"versions":[],"referenced_works_count":6,"referenced_works":["https://openalex.org/W1979514275","https://openalex.org/W2069048675","https://openalex.org/W2141490254","https://openalex.org/W2146107278","https://openalex.org/W2167465161","https://openalex.org/W2169046261"],"related_works":["https://openalex.org/W4313678637","https://openalex.org/W3131410704","https://openalex.org/W3111172706","https://openalex.org/W2954046924","https://openalex.org/W2652100805","https://openalex.org/W2315453694","https://openalex.org/W2166518054","https://openalex.org/W2115378283","https://openalex.org/W2071221664","https://openalex.org/W1983766604"],"abstract_inverted_index":{"We":[0],"are":[1],"developing":[2],"a":[3,12,27,50,68,91],"programmable":[4],"Josephson":[5],"voltage":[6,85,94],"standard":[7],"(PJVS)":[8],"system":[9,16],"based":[10],"on":[11],"compact":[13],"cryocooler.":[14],"The":[15,61,104],"is":[17,71],"capable":[18],"of":[19,26,37,49,63,67,72,109,122],"generating":[20],"two":[21],"arbitrary":[22],"waveforms":[23],"by":[24],"use":[25],"dual-output":[28,35],"PJVS":[29,39],"(DO-PJVS)":[30],"device.":[31],"Owing":[32],"to":[33,114],"this":[34,89],"feature":[36],"the":[38,41,45,57,64,110],"system,":[40],"low-frequency":[42,65,99,105],"characteristic":[43,66],"in":[44],"ac-dc":[46,78,106],"transfer":[47,79,107],"difference":[48,108],"thermal":[51,69,93],"converter":[52,70,95],"has":[53,101],"been":[54,102],"investigated":[55],"using":[56],"90\u00b0":[58],"addition":[59],"method.":[60],"evaluation":[62],"great":[73],"importance":[74],"for":[75],"connecting":[76],"conventional":[77],"standards":[80],"and":[81],"new":[82],"Josephson-based":[83],"ac":[84],"standards.":[86],"To":[87],"fulfill":[88],"purpose,":[90],"dual-heater":[92],"(DH-TVC)":[96],"with":[97],"improved":[98],"performance":[100],"developed.":[103],"DH-TVC":[111],"was":[112],"evaluated":[113],"be":[115],"smaller":[116],"than":[117],"1":[118,126],"\u03bcV/V":[119],"at":[120],"frequencies":[121],"as":[123,125],"low":[124],"Hz.":[127]},"cited_by_api_url":"https://api.openalex.org/works?filter=cites:W2122230150","counts_by_year":[{"year":2023,"cited_by_count":1},{"year":2020,"cited_by_count":1},{"year":2018,"cited_by_count":2},{"year":2016,"cited_by_count":1},{"year":2015,"cited_by_count":1},{"year":2014,"cited_by_count":4},{"year":2013,"cited_by_count":1},{"year":2012,"cited_by_count":3}],"updated_date":"2024-11-23T13:40:26.047550","created_date":"2016-06-24"}