{"id":"https://openalex.org/W2109178853","doi":"https://doi.org/10.1109/tim.2007.899913","title":"Model-Based Segmentation of Surfaces Using Illumination Series","display_name":"Model-Based Segmentation of Surfaces Using Illumination Series","publication_year":2007,"publication_date":"2007-08-01","ids":{"openalex":"https://openalex.org/W2109178853","doi":"https://doi.org/10.1109/tim.2007.899913","mag":"2109178853"},"language":"en","primary_location":{"is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2007.899913","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false},"type":"article","type_crossref":"journal-article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5032542082","display_name":"Christoph Lindner","orcid":"https://orcid.org/0000-0001-5688-3146"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Christoph Lindner","raw_affiliation_strings":["Technische Univ. Munchen, Munchen"],"affiliations":[{"raw_affiliation_string":"Technische Univ. Munchen, Munchen","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5053966999","display_name":"Fernando Puente Le\u00f3n","orcid":"https://orcid.org/0000-0001-6781-1666"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Fernando Puente Leon","raw_affiliation_strings":["Technische Univ. Munchen, Munchen"],"affiliations":[{"raw_affiliation_string":"Technische Univ. Munchen, Munchen","institution_ids":[]}]}],"institution_assertions":[],"countries_distinct_count":0,"institutions_distinct_count":0,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":1.869,"has_fulltext":true,"fulltext_origin":"ngrams","cited_by_count":11,"citation_normalized_percentile":{"value":0.901389,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":83,"max":84},"biblio":{"volume":"56","issue":"4","first_page":"1340","last_page":"1346"},"is_retracted":false,"is_paratext":false,"primary_topic":{"id":"https://openalex.org/T10481","display_name":"Computer Graphics and Visualization Techniques","score":0.9985,"subfield":{"id":"https://openalex.org/subfields/1704","display_name":"Computer Graphics and Computer-Aided Design"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10481","display_name":"Computer Graphics and Visualization Techniques","score":0.9985,"subfield":{"id":"https://openalex.org/subfields/1704","display_name":"Computer Graphics and Computer-Aided Design"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9984,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10638","display_name":"Optical measurement and interference techniques","score":0.9957,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[],"concepts":[{"id":"https://openalex.org/C89600930","wikidata":"https://www.wikidata.org/wiki/Q1423946","display_name":"Segmentation","level":2,"score":0.78469014},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.7227413},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.6678125},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.62224126},{"id":"https://openalex.org/C124504099","wikidata":"https://www.wikidata.org/wiki/Q56933","display_name":"Image segmentation","level":3,"score":0.60456944},{"id":"https://openalex.org/C2779343474","wikidata":"https://www.wikidata.org/wiki/Q3109175","display_name":"Context (archaeology)","level":2,"score":0.5995369},{"id":"https://openalex.org/C143724316","wikidata":"https://www.wikidata.org/wiki/Q312468","display_name":"Series (stratigraphy)","level":2,"score":0.5840161},{"id":"https://openalex.org/C2776799497","wikidata":"https://www.wikidata.org/wiki/Q484298","display_name":"Surface (topology)","level":2,"score":0.5302068},{"id":"https://openalex.org/C28719098","wikidata":"https://www.wikidata.org/wiki/Q44946","display_name":"Point (geometry)","level":2,"score":0.4786526},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.46544158},{"id":"https://openalex.org/C65885262","wikidata":"https://www.wikidata.org/wiki/Q7429708","display_name":"Scale-space segmentation","level":4,"score":0.46247944},{"id":"https://openalex.org/C26517878","wikidata":"https://www.wikidata.org/wiki/Q228039","display_name":"Key (lock)","level":2,"score":0.42930344},{"id":"https://openalex.org/C9417928","wikidata":"https://www.wikidata.org/wiki/Q1070689","display_name":"Image processing","level":3,"score":0.4124606},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.35849345},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.21990812},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.075912744},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C38652104","wikidata":"https://www.wikidata.org/wiki/Q3510521","display_name":"Computer security","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2007.899913","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/9","display_name":"Industry, innovation and infrastructure","score":0.51}],"grants":[],"datasets":[],"versions":[],"referenced_works_count":15,"referenced_works":["https://openalex.org/W1564419782","https://openalex.org/W1948236804","https://openalex.org/W1972943334","https://openalex.org/W1975089519","https://openalex.org/W2005079503","https://openalex.org/W2045932639","https://openalex.org/W2063740614","https://openalex.org/W2129074579","https://openalex.org/W2134313523","https://openalex.org/W2135583860","https://openalex.org/W2149320036","https://openalex.org/W2160203169","https://openalex.org/W2165192967","https://openalex.org/W2167570619","https://openalex.org/W3139826279"],"related_works":["https://openalex.org/W4313052709","https://openalex.org/W4298131179","https://openalex.org/W3199300986","https://openalex.org/W3144569342","https://openalex.org/W3011384228","https://openalex.org/W2945274617","https://openalex.org/W2375430703","https://openalex.org/W2185902295","https://openalex.org/W2103507220","https://openalex.org/W1986655823"],"abstract_inverted_index":{"":[2],"Automated":[3],"visual":[4],"inspection":[5],"of":[6,15,26,31,63,92,97],"surfaces":[7,33],"plays":[8],"an":[9,43,77],"important":[10],"role":[11],"in":[12,23,48,52],"the":[13,61,64,81,88,93],"context":[14],"industrial":[16],"production.":[17],"Segmentation":[18],"is":[19,46,69],"a":[20],"key":[21],"method":[22],"image":[24],"processing":[25],"such":[27],"surfaces.":[28],"The":[29,67,95],"appearance":[30],"structured":[32],"depends":[34],"very":[35],"much":[36],"on":[37,71],"their":[38],"illumination.":[39],"Hence,":[40],"we":[41],"apply":[42],"illumination":[44,65],"that":[45,79],"variable":[47],"its":[49,53],"direction":[50,62],"and":[51,83],"shape.":[54],"Image":[55],"series":[56],"are":[57,100],"taken":[58],"by":[59],"varying":[60],"pattern.":[66],"segmentation":[68],"performed":[70],"this":[72,98],"data":[73],"basis.":[74],"We":[75],"present":[76],"approach":[78],"utilizes":[80],"Torrance":[82],"Sparrow":[84],"model":[85,99],"to":[86,105],"estimate":[87],"local":[89],"reflection":[90],"properties":[91],"surface.":[94],"parameters":[96],"then":[101],"used":[102],"as":[103],"features":[104],"classify":[106],"each":[107],"surface":[108],"point":[109],"individually.":[110],"":[111]},"cited_by_api_url":"https://api.openalex.org/works?filter=cites:W2109178853","counts_by_year":[{"year":2020,"cited_by_count":1},{"year":2016,"cited_by_count":1},{"year":2015,"cited_by_count":3},{"year":2013,"cited_by_count":1},{"year":2012,"cited_by_count":2}],"updated_date":"2024-12-17T12:59:00.382827","created_date":"2016-06-24"}