{"id":"https://openalex.org/W2151874577","doi":"https://doi.org/10.1109/tim.2007.894223","title":"Testing Analog and Mixed-Signal Circuits With Built-In Hardware\u2014A New Approach","display_name":"Testing Analog and Mixed-Signal Circuits With Built-In Hardware\u2014A New Approach","publication_year":2007,"publication_date":"2007-05-25","ids":{"openalex":"https://openalex.org/W2151874577","doi":"https://doi.org/10.1109/tim.2007.894223","mag":"2151874577"},"language":"en","primary_location":{"is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2007.894223","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false},"type":"article","type_crossref":"journal-article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5103350095","display_name":"Sunil R. Das","orcid":null},"institutions":[{"id":"https://openalex.org/I149292303","display_name":"Troy University","ror":"https://ror.org/029jj9438","country_code":"US","type":"education","lineage":["https://openalex.org/I149292303"]},{"id":"https://openalex.org/I153718931","display_name":"University of Ottawa","ror":"https://ror.org/03c4mmv16","country_code":"CA","type":"education","lineage":["https://openalex.org/I153718931"]}],"countries":["CA","US"],"is_corresponding":false,"raw_author_name":"Sunil R. Das","raw_affiliation_strings":["Department of Computer and Information Science, College of Arts and Sciences, Troy University, Montgomery, AL, USA","Faculty of Engineering, School of Information Technology and Engineering, University of Ottawa, Ottawa, ONT, Canada"],"affiliations":[{"raw_affiliation_string":"Department of Computer and Information Science, College of Arts and Sciences, Troy University, Montgomery, AL, USA","institution_ids":["https://openalex.org/I149292303"]},{"raw_affiliation_string":"Faculty of Engineering, School of Information Technology and Engineering, University of Ottawa, Ottawa, ONT, Canada","institution_ids":["https://openalex.org/I153718931"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5088387631","display_name":"Jila Zakizadeh","orcid":null},"institutions":[{"id":"https://openalex.org/I153718931","display_name":"University of Ottawa","ror":"https://ror.org/03c4mmv16","country_code":"CA","type":"education","lineage":["https://openalex.org/I153718931"]}],"countries":["CA"],"is_corresponding":false,"raw_author_name":"Jila Zakizadeh","raw_affiliation_strings":["Faculty of Engineering School of Information Technology and Engineering, University of Ottawa, Ottawa, ONT, Canada"],"affiliations":[{"raw_affiliation_string":"Faculty of Engineering School of Information Technology and Engineering, University of Ottawa, Ottawa, ONT, Canada","institution_ids":["https://openalex.org/I153718931"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5109483458","display_name":"Satyendra N. Biswas","orcid":null},"institutions":[{"id":"https://openalex.org/I39815113","display_name":"Georgia Southern University","ror":"https://ror.org/04agmb972","country_code":"US","type":"education","lineage":["https://openalex.org/I39815113"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Satyendra Biswas","raw_affiliation_strings":["Department of Electrical Engineering Technology, Georgia Southern University, Statesboro, GA, USA"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering Technology, Georgia Southern University, Statesboro, GA, USA","institution_ids":["https://openalex.org/I39815113"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5008303398","display_name":"Mansour H. Assaf","orcid":"https://orcid.org/0000-0003-3052-9469"},"institutions":[{"id":"https://openalex.org/I174491546","display_name":"University of Trinidad and Tobago","ror":"https://ror.org/03np13864","country_code":"TT","type":"education","lineage":["https://openalex.org/I174491546"]}],"countries":["TT"],"is_corresponding":false,"raw_author_name":"Mansour H. Assaf","raw_affiliation_strings":["OMeara Campus, University of Trinidad and Tobago, Arima, Trinidad and Tobago"],"affiliations":[{"raw_affiliation_string":"OMeara Campus, University of Trinidad and Tobago, Arima, Trinidad and Tobago","institution_ids":["https://openalex.org/I174491546"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5048076896","display_name":"Amiya Nayak","orcid":"https://orcid.org/0000-0002-4605-0500"},"institutions":[{"id":"https://openalex.org/I153718931","display_name":"University of Ottawa","ror":"https://ror.org/03c4mmv16","country_code":"CA","type":"education","lineage":["https://openalex.org/I153718931"]}],"countries":["CA"],"is_corresponding":false,"raw_author_name":"Amiya R. Nayak","raw_affiliation_strings":["Faculty of Engineering School of Information Technology and Engineering, University of Ottawa, Ottawa, ONT, Canada"],"affiliations":[{"raw_affiliation_string":"Faculty of Engineering School of Information Technology and Engineering, University of Ottawa, Ottawa, ONT, Canada","institution_ids":["https://openalex.org/I153718931"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5023904661","display_name":"Emil M. Petriu","orcid":"https://orcid.org/0000-0002-0274-1035"},"institutions":[{"id":"https://openalex.org/I153718931","display_name":"University of Ottawa","ror":"https://ror.org/03c4mmv16","country_code":"CA","type":"education","lineage":["https://openalex.org/I153718931"]}],"countries":["CA"],"is_corresponding":false,"raw_author_name":"Emil M. Petriu","raw_affiliation_strings":["Faculty of Engineering School of Information Technology and Engineering, University of Ottawa, Ottawa, ONT, Canada"],"affiliations":[{"raw_affiliation_string":"Faculty of Engineering School of Information Technology and Engineering, University of Ottawa, Ottawa, ONT, Canada","institution_ids":["https://openalex.org/I153718931"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5110090558","display_name":"Wen-Ben Jone","orcid":null},"institutions":[{"id":"https://openalex.org/I63135867","display_name":"University of Cincinnati","ror":"https://ror.org/01e3m7079","country_code":"US","type":"education","lineage":["https://openalex.org/I63135867"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Wen-Ben Jone","raw_affiliation_strings":["Department of Electrical and Computer Engineering, University of Cincinnati, Cincinnati, OH, USA"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, University of Cincinnati, Cincinnati, OH, USA","institution_ids":["https://openalex.org/I63135867"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5019897542","display_name":"Mehmet \u015eahinoglu","orcid":"https://orcid.org/0000-0003-4488-2300"},"institutions":[{"id":"https://openalex.org/I149292303","display_name":"Troy University","ror":"https://ror.org/029jj9438","country_code":"US","type":"education","lineage":["https://openalex.org/I149292303"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Mehmet Sahinoglu","raw_affiliation_strings":["Department of Computer and Information Science, College of Arts and Sciences, Troy University, Montgomery, AL, USA"],"affiliations":[{"raw_affiliation_string":"Department of Computer and Information Science, College of Arts and Sciences, Troy University, Montgomery, AL, USA","institution_ids":["https://openalex.org/I149292303"]}]}],"institution_assertions":[],"countries_distinct_count":3,"institutions_distinct_count":5,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":2.74,"has_fulltext":true,"fulltext_origin":"ngrams","cited_by_count":51,"citation_normalized_percentile":{"value":0.987749,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":93,"max":94},"biblio":{"volume":"56","issue":"3","first_page":"840","last_page":"855"},"is_retracted":false,"is_paratext":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13293","display_name":"Engineering and Test Systems","score":0.9966,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/netlist","display_name":"Netlist","score":0.8800256},{"id":"https://openalex.org/keywords/mixed-signal-integrated-circuit","display_name":"Mixed-signal integrated circuit","score":0.78259903},{"id":"https://openalex.org/keywords/analogue-electronics","display_name":"Analogue electronics","score":0.6853517},{"id":"https://openalex.org/keywords/built-in-self-test","display_name":"Built-in self-test","score":0.4422587},{"id":"https://openalex.org/keywords/benchmark","display_name":"Benchmark (surveying)","score":0.42586195},{"id":"https://openalex.org/keywords/signal","display_name":"SIGNAL (programming language)","score":0.42288023}],"concepts":[{"id":"https://openalex.org/C177650935","wikidata":"https://www.wikidata.org/wiki/Q1760303","display_name":"Netlist","level":2,"score":0.8800256},{"id":"https://openalex.org/C62907940","wikidata":"https://www.wikidata.org/wiki/Q1541329","display_name":"Mixed-signal integrated circuit","level":3,"score":0.78259903},{"id":"https://openalex.org/C29074008","wikidata":"https://www.wikidata.org/wiki/Q174925","display_name":"Analogue electronics","level":3,"score":0.6853517},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.6300187},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.6277192},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.54177296},{"id":"https://openalex.org/C13412647","wikidata":"https://www.wikidata.org/wiki/Q174948","display_name":"Analog signal","level":3,"score":0.49494308},{"id":"https://openalex.org/C2780980493","wikidata":"https://www.wikidata.org/wiki/Q181142","display_name":"Built-in self-test","level":2,"score":0.4422587},{"id":"https://openalex.org/C98142538","wikidata":"https://www.wikidata.org/wiki/Q485005","display_name":"Analog multiplier","level":4,"score":0.42821077},{"id":"https://openalex.org/C185798385","wikidata":"https://www.wikidata.org/wiki/Q1161707","display_name":"Benchmark (surveying)","level":2,"score":0.42586195},{"id":"https://openalex.org/C2779843651","wikidata":"https://www.wikidata.org/wiki/Q7390335","display_name":"SIGNAL (programming language)","level":2,"score":0.42288023},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.36281377},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2789359},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.18249184},{"id":"https://openalex.org/C84462506","wikidata":"https://www.wikidata.org/wiki/Q173142","display_name":"Digital signal processing","level":2,"score":0.13748595},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C13280743","wikidata":"https://www.wikidata.org/wiki/Q131089","display_name":"Geodesy","level":1,"score":0.0},{"id":"https://openalex.org/C205649164","wikidata":"https://www.wikidata.org/wiki/Q1071","display_name":"Geography","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2007.894223","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false}],"best_oa_location":null,"sustainable_development_goals":[],"grants":[],"datasets":[],"versions":[],"referenced_works_count":32,"referenced_works":["https://openalex.org/W1502477161","https://openalex.org/W159378146","https://openalex.org/W1593977319","https://openalex.org/W1924227955","https://openalex.org/W1940143604","https://openalex.org/W1988380797","https://openalex.org/W2000140246","https://openalex.org/W2038380992","https://openalex.org/W2043494457","https://openalex.org/W2049458920","https://openalex.org/W2066750428","https://openalex.org/W2084128131","https://openalex.org/W2099425240","https://openalex.org/W2109678242","https://openalex.org/W2122000269","https://openalex.org/W2124912253","https://openalex.org/W2130656936","https://openalex.org/W2131346107","https://openalex.org/W2131610230","https://openalex.org/W2134449695","https://openalex.org/W2135321691","https://openalex.org/W2139000601","https://openalex.org/W2142590167","https://openalex.org/W2147058628","https://openalex.org/W2152215960","https://openalex.org/W2154242671","https://openalex.org/W2161191982","https://openalex.org/W2162281676","https://openalex.org/W2986797468","https://openalex.org/W3022699844","https://openalex.org/W327215","https://openalex.org/W4302860535"],"related_works":["https://openalex.org/W4388041735","https://openalex.org/W2984909202","https://openalex.org/W2155285526","https://openalex.org/W2149724644","https://openalex.org/W2144814304","https://openalex.org/W1981652693","https://openalex.org/W1909129617","https://openalex.org/W1531784838","https://openalex.org/W1493881961","https://openalex.org/W133135164"],"abstract_inverted_index":{"This":[0],"paper":[1],"aims":[2],"to":[3,7,50,106],"develop":[4],"an":[5],"approach":[6],"test":[8],"analog":[9,27,79,90],"and":[10,91,95,111],"mixed-signal":[11,30,82,92],"embedded-core-based":[12],"system-on-chips":[13],"(SOCs)":[14],"with":[15],"built-in":[16,21],"hardware.":[17],"In":[18],"particular,":[19],"oscillation-based":[20],"self-test":[22],"(OBIST)":[23],"methodology":[24],"for":[25,43,77],"testing":[26,78],"components":[28],"in":[29,34,81,101],"circuits":[31,80,94,97],"is":[32,41,61],"implemented":[33],"this":[35],"paper.":[36],"The":[37],"proposed":[38,115],"OBIST":[39,59],"structure":[40],"utilized":[42],"on-chip":[44],"generation":[45],"of":[46,57,113],"oscillatory":[47],"responses":[48],"corresponding":[49],"the":[51,58,108,114],"analog-circuit":[52],"components.":[53],"A":[54],"major":[55],"advantage":[56],"method":[60],"that":[62],"it":[63,75],"does":[64],"not":[65],"require":[66],"stimulus":[67],"generators":[68],"or":[69],"complex":[70],"response":[71],"analyzers,":[72],"which":[73],"makes":[74],"suitable":[76],"SOC":[83],"environments.":[84],"Extensive":[85],"simulation":[86],"results":[87],"on":[88],"sample":[89],"benchmark":[93],"other":[96],"described":[98],"by":[99],"netlist":[100],"HSPICE":[102],"format":[103],"are":[104],"provided":[105],"demonstrate":[107],"feasibility,":[109],"usefulness,":[110],"relevance":[112],"implementations":[116]},"cited_by_api_url":"https://api.openalex.org/works?filter=cites:W2151874577","counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":2},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":2},{"year":2020,"cited_by_count":5},{"year":2019,"cited_by_count":3},{"year":2018,"cited_by_count":4},{"year":2017,"cited_by_count":4},{"year":2016,"cited_by_count":2},{"year":2015,"cited_by_count":3},{"year":2014,"cited_by_count":3},{"year":2013,"cited_by_count":3},{"year":2012,"cited_by_count":6}],"updated_date":"2025-01-05T19:25:48.189732","created_date":"2016-06-24"}