{"id":"https://openalex.org/W2147220581","doi":"https://doi.org/10.1109/tim.2005.847241","title":"Numerical Emulator for Walk-Through Metal Detectors Using 3-D Indirect Boundary Integral Equation Method","display_name":"Numerical Emulator for Walk-Through Metal Detectors Using 3-D Indirect Boundary Integral Equation Method","publication_year":2005,"publication_date":"2005-05-24","ids":{"openalex":"https://openalex.org/W2147220581","doi":"https://doi.org/10.1109/tim.2005.847241","mag":"2147220581"},"language":"en","primary_location":{"is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2005.847241","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false},"type":"article","type_crossref":"journal-article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5018807391","display_name":"Chang\u2010Hwan Im","orcid":"https://orcid.org/0000-0003-3795-3318"},"institutions":[{"id":"https://openalex.org/I139264467","display_name":"Seoul National University","ror":"https://ror.org/04h9pn542","country_code":"KR","type":"education","lineage":["https://openalex.org/I139264467"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"C.-H. Im","raw_affiliation_strings":["School of Electr. Eng., Seoul Nat. Univ., South Korea"],"affiliations":[{"raw_affiliation_string":"School of Electr. Eng., Seoul Nat. Univ., South Korea","institution_ids":["https://openalex.org/I139264467"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5037425869","display_name":"Hakkee Jung","orcid":"https://orcid.org/0000-0002-2828-2957"},"institutions":[{"id":"https://openalex.org/I139264467","display_name":"Seoul National University","ror":"https://ror.org/04h9pn542","country_code":"KR","type":"education","lineage":["https://openalex.org/I139264467"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"H.-K. Jung","raw_affiliation_strings":["School of Electr. Eng., Seoul Nat. Univ., South Korea"],"affiliations":[{"raw_affiliation_string":"School of Electr. Eng., Seoul Nat. Univ., South Korea","institution_ids":["https://openalex.org/I139264467"]}]}],"institution_assertions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.293,"has_fulltext":true,"fulltext_origin":"ngrams","cited_by_count":2,"citation_normalized_percentile":{"value":0.557918,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":68,"max":71},"biblio":{"volume":"54","issue":"3","first_page":"1166","last_page":"1170"},"is_retracted":false,"is_paratext":false,"primary_topic":{"id":"https://openalex.org/T11263","display_name":"Electromagnetic Simulation and Numerical Methods","score":0.9742,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11263","display_name":"Electromagnetic Simulation and Numerical Methods","score":0.9742,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11851","display_name":"Electromagnetic Compatibility and Measurements","score":0.9581,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10739","display_name":"Electromagnetic Scattering and Analysis","score":0.9445,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[],"concepts":[{"id":"https://openalex.org/C94915269","wikidata":"https://www.wikidata.org/wiki/Q1834857","display_name":"Detector","level":2,"score":0.7407106},{"id":"https://openalex.org/C27016315","wikidata":"https://www.wikidata.org/wiki/Q580101","display_name":"Integral equation","level":2,"score":0.6168833},{"id":"https://openalex.org/C62354387","wikidata":"https://www.wikidata.org/wiki/Q875399","display_name":"Boundary (topology)","level":2,"score":0.5702806},{"id":"https://openalex.org/C9652623","wikidata":"https://www.wikidata.org/wiki/Q190109","display_name":"Field (mathematics)","level":2,"score":0.5390882},{"id":"https://openalex.org/C202374169","wikidata":"https://www.wikidata.org/wiki/Q124291","display_name":"Electrical conductor","level":2,"score":0.5320505},{"id":"https://openalex.org/C182310444","wikidata":"https://www.wikidata.org/wiki/Q1332643","display_name":"Boundary value problem","level":2,"score":0.4828842},{"id":"https://openalex.org/C115260700","wikidata":"https://www.wikidata.org/wiki/Q11408","display_name":"Magnetic field","level":2,"score":0.4368869},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.39203063},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.37052676},{"id":"https://openalex.org/C30475298","wikidata":"https://www.wikidata.org/wiki/Q909554","display_name":"Computational physics","level":1,"score":0.3351959},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.33004996},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.29126075},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.25528693},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.23535049},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.22426572},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.06917736},{"id":"https://openalex.org/C202444582","wikidata":"https://www.wikidata.org/wiki/Q837863","display_name":"Pure mathematics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2005.847241","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Sustainable cities and communities","id":"https://metadata.un.org/sdg/11","score":0.6}],"grants":[],"datasets":[],"versions":[],"referenced_works_count":7,"referenced_works":["https://openalex.org/W2066005645","https://openalex.org/W2078746130","https://openalex.org/W2095798366","https://openalex.org/W2155331508","https://openalex.org/W2156937242","https://openalex.org/W2163265479","https://openalex.org/W2986901555"],"related_works":["https://openalex.org/W4205655149","https://openalex.org/W2795393339","https://openalex.org/W2773988189","https://openalex.org/W2366906938","https://openalex.org/W2349391998","https://openalex.org/W2133690079","https://openalex.org/W2111215486","https://openalex.org/W2105579035","https://openalex.org/W2031561209","https://openalex.org/W2000775715"],"abstract_inverted_index":{"An":[0],"emulator":[1],"based":[2],"on":[3],"three-dimensional":[4],"(3-D)":[5],"numerical":[6],"techniques":[7],"was":[8,28,50],"developed":[9,48],"to":[10,30,34,52,61,65],"simulate":[11],"the":[12,36,47,56,66],"performance":[13],"of":[14,68,71],"walk-through":[15],"metal":[16,72],"detectors":[17],"with":[18],"AC":[19,38],"field":[20],"excitation.":[21],"The":[22],"indirect":[23],"boundary":[24],"integral":[25],"equation":[26],"method":[27],"found":[29],"be":[31,62],"most":[32],"appropriate":[33],"analyze":[35],"3-D":[37],"magnetic":[39],"field,":[40],"including":[41],"moving":[42],"conductors.":[43],"In":[44],"this":[45],"paper,":[46],"tool":[49],"applied":[51,64],"various":[53,69],"conditions,":[54],"and":[55],"result":[57],"showed":[58],"sufficient":[59],"possibility":[60],"successfully":[63],"design":[67],"types":[70],"detectors.":[73]},"cited_by_api_url":"https://api.openalex.org/works?filter=cites:W2147220581","counts_by_year":[],"updated_date":"2024-12-07T19:48:10.706820","created_date":"2016-06-24"}