{"id":"https://openalex.org/W2086926157","doi":"https://doi.org/10.1109/test.2011.6139151","title":"Cell-aware analysis for small-delay effects and production test results from different fault models","display_name":"Cell-aware analysis for small-delay effects and production test results from different fault models","publication_year":2011,"publication_date":"2011-09-01","ids":{"openalex":"https://openalex.org/W2086926157","doi":"https://doi.org/10.1109/test.2011.6139151","mag":"2086926157"},"language":"en","primary_location":{"is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2011.6139151","pdf_url":null,"source":null,"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false},"type":"article","type_crossref":"proceedings-article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5065187948","display_name":"Friedrich Hapke","orcid":"https://orcid.org/0000-0001-8744-3039"},"institutions":[],"countries":["DE"],"is_corresponding":false,"raw_author_name":"F. Hapke","raw_affiliation_strings":["Mentor Graphics, Hamburg, Germany"],"affiliations":[{"raw_affiliation_string":"Mentor Graphics, Hamburg, Germany","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5052014650","display_name":"Juergen Schloeffel","orcid":null},"institutions":[],"countries":["DE"],"is_corresponding":false,"raw_author_name":"J. Schloeffel","raw_affiliation_strings":["Mentor Graphics, Hamburg, Germany"],"affiliations":[{"raw_affiliation_string":"Mentor Graphics, Hamburg, Germany","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5055255968","display_name":"W. Redemund","orcid":null},"institutions":[],"countries":["DE"],"is_corresponding":false,"raw_author_name":"W. Redemund","raw_affiliation_strings":["Mentor Graphics, Hamburg, Germany"],"affiliations":[{"raw_affiliation_string":"Mentor Graphics, Hamburg, Germany","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5066282637","display_name":"Andreas Glowatz","orcid":"https://orcid.org/0000-0002-8086-6220"},"institutions":[],"countries":["DE"],"is_corresponding":false,"raw_author_name":"A. Glowatz","raw_affiliation_strings":["Mentor Graphics, Hamburg, Germany"],"affiliations":[{"raw_affiliation_string":"Mentor Graphics, Hamburg, Germany","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5080960636","display_name":"Janusz Rajski","orcid":"https://orcid.org/0000-0003-2124-447X"},"institutions":[{"id":"https://openalex.org/I105695857","display_name":"Siemens (Hungary)","ror":"https://ror.org/01rk7mv85","country_code":"HU","type":"company","lineage":["https://openalex.org/I105695857","https://openalex.org/I1325886976"]}],"countries":["HU"],"is_corresponding":false,"raw_author_name":"J. Rajski","raw_affiliation_strings":["Mentor Graphics Wilsonville , Oregon, USA#TAB#"],"affiliations":[{"raw_affiliation_string":"Mentor Graphics Wilsonville , Oregon, USA#TAB#","institution_ids":["https://openalex.org/I105695857"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5048205919","display_name":"Michael Reese","orcid":null},"institutions":[{"id":"https://openalex.org/I4210137977","display_name":"Advanced Micro Devices (United States)","ror":"https://ror.org/04kd6c783","country_code":"US","type":"funder","lineage":["https://openalex.org/I4210137977"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"M. Reese","raw_affiliation_strings":["AMD, Inc., Austin, Texas, USA"],"affiliations":[{"raw_affiliation_string":"AMD, Inc., Austin, Texas, USA","institution_ids":["https://openalex.org/I4210137977"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5083100857","display_name":"Jeff Rearick","orcid":null},"institutions":[{"id":"https://openalex.org/I4210137977","display_name":"Advanced Micro Devices (United States)","ror":"https://ror.org/04kd6c783","country_code":"US","type":"funder","lineage":["https://openalex.org/I4210137977"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"J. Rearick","raw_affiliation_strings":["AMD, Inc., Austin, Texas, USA"],"affiliations":[{"raw_affiliation_string":"AMD, Inc., Austin, Texas, USA","institution_ids":["https://openalex.org/I4210137977"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5086523644","display_name":"J. Rivers","orcid":null},"institutions":[{"id":"https://openalex.org/I4210137977","display_name":"Advanced Micro Devices (United States)","ror":"https://ror.org/04kd6c783","country_code":"US","type":"funder","lineage":["https://openalex.org/I4210137977"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"J. Rivers","raw_affiliation_strings":["AMD, Inc., Austin, Texas, USA"],"affiliations":[{"raw_affiliation_string":"AMD, Inc., Austin, Texas, USA","institution_ids":["https://openalex.org/I4210137977"]}]}],"institution_assertions":[],"countries_distinct_count":3,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":3.276,"has_fulltext":true,"fulltext_origin":"ngrams","cited_by_count":37,"citation_normalized_percentile":{"value":0.967446,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":93,"max":94},"biblio":{"volume":null,"issue":null,"first_page":null,"last_page":null},"is_retracted":false,"is_paratext":false,"primary_topic":{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":0.9973,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6030694},{"id":"https://openalex.org/C2777267654","wikidata":"https://www.wikidata.org/wiki/Q3519023","display_name":"Test (biology)","level":2,"score":0.57902086},{"id":"https://openalex.org/C2778348673","wikidata":"https://www.wikidata.org/wiki/Q739302","display_name":"Production (economics)","level":2,"score":0.5204016},{"id":"https://openalex.org/C17626397","wikidata":"https://www.wikidata.org/wiki/Q837455","display_name":"Automatic test pattern generation","level":3,"score":0.48804843},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.45675194},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1402381},{"id":"https://openalex.org/C162324750","wikidata":"https://www.wikidata.org/wiki/Q8134","display_name":"Economics","level":0,"score":0.06948039},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.0},{"id":"https://openalex.org/C139719470","wikidata":"https://www.wikidata.org/wiki/Q39680","display_name":"Macroeconomics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2011.6139151","pdf_url":null,"source":null,"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false}],"best_oa_location":null,"sustainable_development_goals":[],"grants":[],"datasets":[],"versions":[],"referenced_works_count":22,"referenced_works":["https://openalex.org/W1695545649","https://openalex.org/W1775604791","https://openalex.org/W1908637464","https://openalex.org/W1961775031","https://openalex.org/W2034030717","https://openalex.org/W2061946964","https://openalex.org/W2096007426","https://openalex.org/W2102372015","https://openalex.org/W2102556246","https://openalex.org/W2114063437","https://openalex.org/W2115825784","https://openalex.org/W2117340982","https://openalex.org/W2118856265","https://openalex.org/W2119041895","https://openalex.org/W2119277411","https://openalex.org/W2120956034","https://openalex.org/W2124692465","https://openalex.org/W2137041591","https://openalex.org/W2149991436","https://openalex.org/W2169375167","https://openalex.org/W2170907629","https://openalex.org/W3139956757"],"related_works":["https://openalex.org/W4254560580","https://openalex.org/W2748952813","https://openalex.org/W2390279801","https://openalex.org/W2358668433","https://openalex.org/W2323083271","https://openalex.org/W2131559056","https://openalex.org/W2127167802","https://openalex.org/W2080984854","https://openalex.org/W2019500818","https://openalex.org/W2009690023"],"abstract_inverted_index":{"This":[0,26],"paper":[1],"focuses":[2],"on":[3,47,71],"a":[4,52,72],"new":[5],"approach":[6],"to":[7,21],"significantly":[8],"improve":[9],"the":[10,18,29],"overall":[11],"defect":[12,64],"coverage":[13],"for":[14,33],"CMOS-based":[15],"designs":[16],"with":[17,67],"final":[19],"goal":[20],"eliminate":[22],"any":[23],"system-level":[24],"test.":[25],"methodology":[27],"describes":[28],"pattern":[30],"generation":[31],"flow":[32],"detecting":[34],"cell-internal":[35,40],"small-delay":[36],"defects":[37],"caused":[38],"by":[39],"resistive":[41],"bridges.":[42],"Results":[43],"have":[44],"been":[45],"evaluated":[46],"1,900":[48],"library":[49],"cells":[50],"of":[51],"32-nm":[53],"technology.":[54],"First":[55],"production":[56],"test":[57],"results":[58],"are":[59],"presented":[60],"from":[61],"evaluating":[62],"additional":[63],"detections":[65],"achieved":[66],"different":[68],"fault":[69],"models":[70],"45-nm":[73],"design.":[74]},"abstract_inverted_index_v3":null,"cited_by_api_url":"https://api.openalex.org/works?filter=cites:W2086926157","counts_by_year":[{"year":2024,"cited_by_count":4},{"year":2023,"cited_by_count":2},{"year":2022,"cited_by_count":3},{"year":2021,"cited_by_count":5},{"year":2020,"cited_by_count":3},{"year":2019,"cited_by_count":4},{"year":2018,"cited_by_count":1},{"year":2017,"cited_by_count":3},{"year":2015,"cited_by_count":3},{"year":2014,"cited_by_count":3},{"year":2013,"cited_by_count":2},{"year":2012,"cited_by_count":4}],"updated_date":"2025-03-16T08:27:45.700188","created_date":"2016-06-24"}