{"id":"https://openalex.org/W2123227472","doi":"https://doi.org/10.1109/test.2009.5355549","title":"Cache-resident self-testing for I/O circuitry","display_name":"Cache-resident self-testing for I/O circuitry","publication_year":2009,"publication_date":"2009-11-01","ids":{"openalex":"https://openalex.org/W2123227472","doi":"https://doi.org/10.1109/test.2009.5355549","mag":"2123227472"},"language":"en","primary_location":{"is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2009.5355549","pdf_url":null,"source":{"id":"https://openalex.org/S4306420246","display_name":"International Test Conference","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_indexed_in_scopus":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false},"type":"article","type_crossref":"proceedings-article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5005706700","display_name":"Sankar Gurumurthy","orcid":null},"institutions":[{"id":"https://openalex.org/I4210137977","display_name":"Advanced Micro Devices (United States)","ror":"https://ror.org/04kd6c783","country_code":"US","type":"funder","lineage":["https://openalex.org/I4210137977"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Sankar Gurumurthy","raw_affiliation_strings":["Advanced Micro Devices, Inc., Austin TX, USA"],"affiliations":[{"raw_affiliation_string":"Advanced Micro Devices, Inc., Austin TX, USA","institution_ids":["https://openalex.org/I4210137977"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5047884369","display_name":"Darren Bertanzetti","orcid":null},"institutions":[{"id":"https://openalex.org/I1311921367","display_name":"Advanced Micro Devices (Canada)","ror":"https://ror.org/02yh0k313","country_code":"CA","type":"company","lineage":["https://openalex.org/I1311921367","https://openalex.org/I4210137977"]}],"countries":["CA"],"is_corresponding":false,"raw_author_name":"Darren Bertanzetti","raw_affiliation_strings":["Adv. Micro Devices, Inc., Fort Collins, CO, USA"],"affiliations":[{"raw_affiliation_string":"Adv. Micro Devices, Inc., Fort Collins, CO, USA","institution_ids":["https://openalex.org/I1311921367"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5070477651","display_name":"P. Jakobsen","orcid":"https://orcid.org/0000-0002-6780-2441"},"institutions":[{"id":"https://openalex.org/I1311921367","display_name":"Advanced Micro Devices (Canada)","ror":"https://ror.org/02yh0k313","country_code":"CA","type":"company","lineage":["https://openalex.org/I1311921367","https://openalex.org/I4210137977"]}],"countries":["CA"],"is_corresponding":false,"raw_author_name":"Peter Jakobsen","raw_affiliation_strings":["Adv. Micro Devices, Inc., Fort Collins, CO, USA"],"affiliations":[{"raw_affiliation_string":"Adv. Micro Devices, Inc., Fort Collins, CO, USA","institution_ids":["https://openalex.org/I1311921367"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5083100857","display_name":"Jeff Rearick","orcid":null},"institutions":[{"id":"https://openalex.org/I1311921367","display_name":"Advanced Micro Devices (Canada)","ror":"https://ror.org/02yh0k313","country_code":"CA","type":"company","lineage":["https://openalex.org/I1311921367","https://openalex.org/I4210137977"]}],"countries":["CA"],"is_corresponding":false,"raw_author_name":"Jeff Rearick","raw_affiliation_strings":["Adv. Micro Devices, Inc., Fort Collins, CO, USA"],"affiliations":[{"raw_affiliation_string":"Adv. Micro Devices, Inc., Fort Collins, CO, USA","institution_ids":["https://openalex.org/I1311921367"]}]}],"institution_assertions":[],"countries_distinct_count":2,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":true,"fulltext_origin":"ngrams","cited_by_count":4,"citation_normalized_percentile":{"value":0.445748,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":77,"max":79},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"8"},"is_retracted":false,"is_paratext":false,"primary_topic":{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12495","display_name":"Electrostatic Discharge in Electronics","score":0.9952,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/speedup","display_name":"Speedup","score":0.69668955},{"id":"https://openalex.org/keywords/microprocessor","display_name":"Microprocessor","score":0.64992845},{"id":"https://openalex.org/keywords/built-in-self-test","display_name":"Built-in self-test","score":0.4369383}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7779728},{"id":"https://openalex.org/C115537543","wikidata":"https://www.wikidata.org/wiki/Q165596","display_name":"Cache","level":2,"score":0.75718695},{"id":"https://openalex.org/C68339613","wikidata":"https://www.wikidata.org/wiki/Q1549489","display_name":"Speedup","level":2,"score":0.69668955},{"id":"https://openalex.org/C2780728072","wikidata":"https://www.wikidata.org/wiki/Q5297","display_name":"Microprocessor","level":2,"score":0.64992845},{"id":"https://openalex.org/C173608175","wikidata":"https://www.wikidata.org/wiki/Q232661","display_name":"Parallel computing","level":1,"score":0.4944911},{"id":"https://openalex.org/C189783530","wikidata":"https://www.wikidata.org/wiki/Q352090","display_name":"CPU cache","level":3,"score":0.47741663},{"id":"https://openalex.org/C2780980493","wikidata":"https://www.wikidata.org/wiki/Q181142","display_name":"Built-in self-test","level":2,"score":0.4369383},{"id":"https://openalex.org/C2777267654","wikidata":"https://www.wikidata.org/wiki/Q3519023","display_name":"Test (biology)","level":2,"score":0.42037743},{"id":"https://openalex.org/C38556500","wikidata":"https://www.wikidata.org/wiki/Q13404475","display_name":"Cache algorithms","level":4,"score":0.41562507},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.41158172},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2009.5355549","pdf_url":null,"source":{"id":"https://openalex.org/S4306420246","display_name":"International Test Conference","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_indexed_in_scopus":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false}],"best_oa_location":null,"sustainable_development_goals":[],"grants":[],"datasets":[],"versions":[],"referenced_works_count":11,"referenced_works":["https://openalex.org/W1484200663","https://openalex.org/W1552866142","https://openalex.org/W2031357410","https://openalex.org/W2093568350","https://openalex.org/W2108528814","https://openalex.org/W2111785162","https://openalex.org/W2128285650","https://openalex.org/W2144375411","https://openalex.org/W2171452343","https://openalex.org/W3102742490","https://openalex.org/W4403015621"],"related_works":["https://openalex.org/W3147501184","https://openalex.org/W2363672756","https://openalex.org/W2350686196","https://openalex.org/W2268996566","https://openalex.org/W2167303720","https://openalex.org/W2147122795","https://openalex.org/W2109715593","https://openalex.org/W2061075966","https://openalex.org/W2046128376","https://openalex.org/W2038423975"],"abstract_inverted_index":{"A":[0],"technique":[1],"is":[2,56],"described":[3],"for":[4,33],"testing":[5,32],"the":[6,13,40,52],"I/O":[7],"interfaces":[8],"of":[9,15,39,44,47],"a":[10],"microprocessor":[11],"through":[12],"use":[14],"cache-resident":[16],"self-test.":[17],"Experimental":[18],"results":[19,49],"show":[20],"that":[21],"this":[22],"test":[23,48],"application":[24],"method":[25,55],"executes":[26],"much":[27],"faster":[28],"than":[29],"traditional":[30],"scan-based":[31],"both":[34],"characterization":[35],"and":[36],"production":[37],"versions":[38],"tests.":[41],"The":[42,54],"addition":[43],"on-chip":[45],"post-processing":[46],"further":[50],"enhances":[51],"speedup.":[53],"compatible":[57],"with":[58],"low-cost":[59],"testers.":[60]},"abstract_inverted_index_v3":null,"cited_by_api_url":"https://api.openalex.org/works?filter=cites:W2123227472","counts_by_year":[{"year":2021,"cited_by_count":1},{"year":2014,"cited_by_count":3}],"updated_date":"2025-04-16T15:43:02.254887","created_date":"2016-06-24"}