乐胖代购免代理版

{"id":"https://openalex.org/W2099992850","doi":"https://doi.org/10.1109/test.2006.297691","title":"Cost Effective Outliers Screening with Moving Limits and Correlation Testing for Analogue ICs","display_name":"Cost Effective Outliers Screening with Moving Limits and Correlation Testing for Analogue ICs","publication_year":2006,"publication_date":"2006-10-01","ids":{"openalex":"https://openalex.org/W2099992850","doi":"https://doi.org/10.1109/test.2006.297691","mag":"2099992850"},"language":"en","primary_location":{"is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2006.297691","pdf_url":null,"source":{"id":"https://openalex.org/S4210209697","display_name":"Proceedings/Proceedings - International Test Conference","issn_l":"1089-3539","issn":["1089-3539","2378-2250"],"is_oa":false,"is_in_doaj":false,"is_indexed_in_scopus":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false},"type":"article","type_crossref":"proceedings-article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5113687508","display_name":"Liquan Fang","orcid":null},"institutions":[{"id":"https://openalex.org/I109147379","display_name":"NXP (Netherlands)","ror":"https://ror.org/059be4e97","country_code":"NL","type":"funder","lineage":["https://openalex.org/I109147379"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"Liquan Fang","raw_affiliation_strings":["Philips Semiconductors, Gerstweg 2, 6534 AE, Nijmegen, The Netherlands. liquan.fang@philips.com"],"affiliations":[{"raw_affiliation_string":"Philips Semiconductors, Gerstweg 2, 6534 AE, Nijmegen, The Netherlands. liquan.fang@philips.com","institution_ids":["https://openalex.org/I109147379"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5036889760","display_name":"Mohammed Lemnawar","orcid":null},"institutions":[{"id":"https://openalex.org/I109147379","display_name":"NXP (Netherlands)","ror":"https://ror.org/059be4e97","country_code":"NL","type":"funder","lineage":["https://openalex.org/I109147379"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"Mohammed Lemnawar","raw_affiliation_strings":["Philips Semiconductors, Gerstweg 2, 6534 AE, Nijmegen, The Netherlands. mohammed.lemnawar@philips.com"],"affiliations":[{"raw_affiliation_string":"Philips Semiconductors, Gerstweg 2, 6534 AE, Nijmegen, The Netherlands. mohammed.lemnawar@philips.com","institution_ids":["https://openalex.org/I109147379"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5113550789","display_name":"Yizi Xing","orcid":null},"institutions":[{"id":"https://openalex.org/I109147379","display_name":"NXP (Netherlands)","ror":"https://ror.org/059be4e97","country_code":"NL","type":"funder","lineage":["https://openalex.org/I109147379"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"Yizi Xing","raw_affiliation_strings":["Philips Semiconductors, Gerstweg 2, 6534 AE, Nijmegen, The Netherlands. yizi.xing@philips.com"],"affiliations":[{"raw_affiliation_string":"Philips Semiconductors, Gerstweg 2, 6534 AE, Nijmegen, The Netherlands. yizi.xing@philips.com","institution_ids":["https://openalex.org/I109147379"]}]}],"institution_assertions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":2.125,"has_fulltext":true,"fulltext_origin":"ngrams","cited_by_count":45,"citation_normalized_percentile":{"value":0.924265,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":92,"max":93},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"10"},"is_retracted":false,"is_paratext":false,"primary_topic":{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9999,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9999,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9975,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/automotive-electronics","display_name":"Automotive electronics","score":0.44576725},{"id":"https://openalex.org/keywords/transceiver","display_name":"Transceiver","score":0.43405995}],"concepts":[{"id":"https://openalex.org/C526921623","wikidata":"https://www.wikidata.org/wiki/Q190117","display_name":"Automotive industry","level":2,"score":0.6514413},{"id":"https://openalex.org/C79337645","wikidata":"https://www.wikidata.org/wiki/Q779824","display_name":"Outlier","level":2,"score":0.6424123},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.5697042},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.52547586},{"id":"https://openalex.org/C2779530757","wikidata":"https://www.wikidata.org/wiki/Q1207505","display_name":"Quality (philosophy)","level":2,"score":0.52478427},{"id":"https://openalex.org/C17626397","wikidata":"https://www.wikidata.org/wiki/Q837455","display_name":"Automatic test pattern generation","level":3,"score":0.44952574},{"id":"https://openalex.org/C2778520156","wikidata":"https://www.wikidata.org/wiki/Q449343","display_name":"Automotive electronics","level":3,"score":0.44576725},{"id":"https://openalex.org/C7720470","wikidata":"https://www.wikidata.org/wiki/Q954187","display_name":"Transceiver","level":3,"score":0.43405995},{"id":"https://openalex.org/C90673727","wikidata":"https://www.wikidata.org/wiki/Q901718","display_name":"Product (mathematics)","level":2,"score":0.4301352},{"id":"https://openalex.org/C2778348673","wikidata":"https://www.wikidata.org/wiki/Q739302","display_name":"Production (economics)","level":2,"score":0.4247326},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3644868},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.33107665},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.18876272},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.1841357},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.17264551},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.11840111},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.10629451},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C111472728","wikidata":"https://www.wikidata.org/wiki/Q9471","display_name":"Epistemology","level":1,"score":0.0},{"id":"https://openalex.org/C162324750","wikidata":"https://www.wikidata.org/wiki/Q8134","display_name":"Economics","level":0,"score":0.0},{"id":"https://openalex.org/C139719470","wikidata":"https://www.wikidata.org/wiki/Q39680","display_name":"Macroeconomics","level":1,"score":0.0},{"id":"https://openalex.org/C146978453","wikidata":"https://www.wikidata.org/wiki/Q3798668","display_name":"Aerospace engineering","level":1,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2006.297691","pdf_url":null,"source":{"id":"https://openalex.org/S4210209697","display_name":"Proceedings/Proceedings - International Test Conference","issn_l":"1089-3539","issn":["1089-3539","2378-2250"],"is_oa":false,"is_in_doaj":false,"is_indexed_in_scopus":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/9","score":0.64,"display_name":"Industry, innovation and infrastructure"}],"grants":[],"datasets":[],"versions":[],"referenced_works_count":15,"referenced_works":["https://openalex.org/W1955440229","https://openalex.org/W1994356874","https://openalex.org/W2022590186","https://openalex.org/W2064429915","https://openalex.org/W2101754675","https://openalex.org/W2116996377","https://openalex.org/W2127704806","https://openalex.org/W2130404536","https://openalex.org/W2130501458","https://openalex.org/W2134565911","https://openalex.org/W2137926373","https://openalex.org/W2147198689","https://openalex.org/W2166777727","https://openalex.org/W2543950793","https://openalex.org/W4247409213"],"related_works":["https://openalex.org/W3210666397","https://openalex.org/W3036272329","https://openalex.org/W2990981562","https://openalex.org/W2972765784","https://openalex.org/W2885986920","https://openalex.org/W2758348730","https://openalex.org/W2378051443","https://openalex.org/W2350662357","https://openalex.org/W2160915513","https://openalex.org/W2132658806"],"abstract_inverted_index":{"In":[0,30],"order":[1],"to":[2,20,34,45,68,113],"meet":[3],"the":[4,12,23,36,46,57,61,65,70,77,81,85,89,92,110,115,129,131,135,138,147,158],"zero-defect":[5],"product":[6,160],"quality":[7,161],"requirements":[8],"on":[9],"ICs":[10],"by":[11],"automotive":[13,100],"industry,":[14],"new":[15,149],"test":[16,71,111,142,150],"methods":[17],"are":[18],"needed":[19],"screen":[21],"out":[22],"outliers":[24],"that":[25,59,79,146],"give":[26],"potential":[27],"lifetime":[28],"failures.":[29],"this":[31,118],"paper,":[32],"how":[33],"apply":[35],"combination":[37,119],"of":[38,49,64,84,117,128,134],"moving":[39],"limits":[40,55],"and":[41,141,155],"multiple-parameter":[42],"correlation":[43,74],"testing":[44,48,75],"production":[47,105],"analogue":[50],"IC":[51],"is":[52,56,76,152],"discussed.":[53],"Moving":[54],"technique":[58,78],"uses":[60,80],"measurement":[62,82],"results":[63,83],"neighboring":[66],"dies":[67],"tighten":[69],"limits.":[72],"Multiple-parameter":[73],"different":[86],"blocks":[87],"within":[88],"chip":[90],"as":[91,109],"secondary":[93],"information.":[94],"Moreover,":[95],"in":[96],"our":[97],"work,":[98],"an":[99],"transceiver":[101],"with":[102],"high":[103],"volume":[104],"has":[106],"been":[107],"used":[108],"vehicle":[112],"demonstrate":[114],"effectiveness":[116],"approach.":[120],"The":[121],"collected":[122],"wafer":[123],"map":[124],"data,":[125],"failure":[126],"analysis":[127],"rejects,":[130],"reduction":[132],"trend":[133],"customer":[136],"returns,":[137],"yield":[139],"information":[140,144],"cost":[143,153],"show":[145],"proposed":[148],"approach":[151],"effective":[154],"can":[156],"improve":[157],"outgoing":[159]},"abstract_inverted_index_v3":null,"cited_by_api_url":"https://api.openalex.org/works?filter=cites:W2099992850","counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":2},{"year":2022,"cited_by_count":4},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":3},{"year":2019,"cited_by_count":1},{"year":2018,"cited_by_count":2},{"year":2017,"cited_by_count":4},{"year":2016,"cited_by_count":2},{"year":2013,"cited_by_count":2},{"year":2012,"cited_by_count":6}],"updated_date":"2025-04-13T10:59:09.437264","created_date":"2016-06-24"}