{"id":"https://openalex.org/W2131779957","doi":"https://doi.org/10.1109/test.2001.966686","title":"A token scan architecture for low power testing","display_name":"A token scan architecture for low power testing","publication_year":2002,"publication_date":"2002-11-13","ids":{"openalex":"https://openalex.org/W2131779957","doi":"https://doi.org/10.1109/test.2001.966686","mag":"2131779957"},"language":"en","primary_location":{"is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2001.966686","pdf_url":null,"source":null,"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false},"type":"article","type_crossref":"proceedings-article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5111502914","display_name":"Tsung\u2010Chu Huang","orcid":null},"institutions":[{"id":"https://openalex.org/I91807558","display_name":"National Cheng Kung University","ror":"https://ror.org/01b8kcc49","country_code":"TW","type":"funder","lineage":["https://openalex.org/I91807558"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"None Tsung-Chu Huang","raw_affiliation_strings":["[Dept. of Electr. Eng., Nat. Cheng-Kung Univ., Tainan, Taiwan]"],"affiliations":[{"raw_affiliation_string":"[Dept. of Electr. Eng., Nat. Cheng-Kung Univ., Tainan, Taiwan]","institution_ids":["https://openalex.org/I91807558"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5079657769","display_name":"Kuen-Jong Lee","orcid":"https://orcid.org/0000-0002-6690-0074"},"institutions":[{"id":"https://openalex.org/I91807558","display_name":"National Cheng Kung University","ror":"https://ror.org/01b8kcc49","country_code":"TW","type":"funder","lineage":["https://openalex.org/I91807558"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"None Kuen-Jong Lee","raw_affiliation_strings":[" National Cheng-Kung University"],"affiliations":[{"raw_affiliation_string":" National Cheng-Kung University","institution_ids":["https://openalex.org/I91807558"]}]}],"institution_assertions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":1.122,"has_fulltext":true,"fulltext_origin":"ngrams","cited_by_count":36,"citation_normalized_percentile":{"value":0.934972,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":90,"max":91},"biblio":{"volume":null,"issue":null,"first_page":"660","last_page":"669"},"is_retracted":false,"is_paratext":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9999,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9988,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/scan-chain","display_name":"Scan chain","score":0.6931592},{"id":"https://openalex.org/keywords/clock-gating","display_name":"Clock gating","score":0.6658244}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7166597},{"id":"https://openalex.org/C48145219","wikidata":"https://www.wikidata.org/wiki/Q1335365","display_name":"Security token","level":2,"score":0.70579374},{"id":"https://openalex.org/C150012182","wikidata":"https://www.wikidata.org/wiki/Q225990","display_name":"Scan chain","level":3,"score":0.6931592},{"id":"https://openalex.org/C22716491","wikidata":"https://www.wikidata.org/wiki/Q590170","display_name":"Clock gating","level":5,"score":0.6658244},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.47364035},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.40170202},{"id":"https://openalex.org/C530198007","wikidata":"https://www.wikidata.org/wiki/Q80831","display_name":"Integrated circuit","level":2,"score":0.23033985},{"id":"https://openalex.org/C60501442","wikidata":"https://www.wikidata.org/wiki/Q4382014","display_name":"Clock skew","level":4,"score":0.2033439},{"id":"https://openalex.org/C137059387","wikidata":"https://www.wikidata.org/wiki/Q426882","display_name":"Clock signal","level":3,"score":0.18397155},{"id":"https://openalex.org/C134652429","wikidata":"https://www.wikidata.org/wiki/Q1052698","display_name":"Jitter","level":2,"score":0.14981782},{"id":"https://openalex.org/C31258907","wikidata":"https://www.wikidata.org/wiki/Q1301371","display_name":"Computer network","level":1,"score":0.10884935},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.09373331},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2001.966686","pdf_url":null,"source":null,"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.64,"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7"}],"grants":[],"datasets":[],"versions":[],"referenced_works_count":21,"referenced_works":["https://openalex.org/W1660272255","https://openalex.org/W1914799182","https://openalex.org/W2004437077","https://openalex.org/W2080510479","https://openalex.org/W2101453407","https://openalex.org/W2106303764","https://openalex.org/W2108809230","https://openalex.org/W2113006656","https://openalex.org/W2125715320","https://openalex.org/W2126641963","https://openalex.org/W2133769728","https://openalex.org/W2138444824","https://openalex.org/W2139098514","https://openalex.org/W2149690470","https://openalex.org/W2156272775","https://openalex.org/W2157465781","https://openalex.org/W2160135614","https://openalex.org/W2161330204","https://openalex.org/W2169462318","https://openalex.org/W2199251691","https://openalex.org/W4240114554"],"related_works":["https://openalex.org/W4388335561","https://openalex.org/W4288261899","https://openalex.org/W2970530566","https://openalex.org/W2907573123","https://openalex.org/W2620506035","https://openalex.org/W2474747038","https://openalex.org/W2168810991","https://openalex.org/W2131779957","https://openalex.org/W2121199343","https://openalex.org/W2062729584"],"abstract_inverted_index":{"Presents":[0],"a":[1,28,43,67],"novel":[2,68],"scan":[3,29,45,82,90,100,133],"architecture":[4,91],"for":[5,128],"low-power":[6],"testing,":[7],"which":[8],"employs":[9],"the":[10,20,39,54,59,75,80,85,88,95,99,105,110,113],"techniques":[11],"of":[12,74,79,122],"multiphase":[13,21],"clocking,":[14],"token":[15,44,81,89],"ring,":[16],"and":[17,33,61,77,112],"clock-gating.":[18],"When":[19],"clocking":[22],"technique":[23,70],"is":[24],"directly":[25],"employed":[26],"to":[27,48,58],"chain,":[30],"inter-phase":[31],"skews":[32],"large":[34],"routing":[35],"area":[36],"will":[37],"be":[38,126],"problems.":[40,51],"We":[41],"develop":[42],"cell":[46],"design":[47],"address":[49],"these":[50],"To":[52],"reduce":[53,94],"power":[55,123],"dissipation":[56],"due":[57],"clock":[60,111],"scan-in":[62,114],"data":[63,96,115],"trees,":[64],"we":[65],"propose":[66],"clock-gating":[69],"that":[71],"takes":[72],"advantage":[73],"regularity":[76],"periodicity":[78],"chain.":[83],"Combining":[84],"three":[86],"techniques,":[87],"can":[92,125],"efficiently":[93],"transitions":[97],"in":[98,108],"circuits":[101,130],"as":[102,104],"well":[103],"switching":[106],"activity":[107],"both":[109],"trees.":[116],"From":[117],"experiments,":[118],"more":[119],"than":[120],"95%":[121],"reduction":[124],"achieved":[127],"most":[129],"with":[131],"long":[132],"chains.":[134]},"abstract_inverted_index_v3":null,"cited_by_api_url":"https://api.openalex.org/works?filter=cites:W2131779957","counts_by_year":[{"year":2021,"cited_by_count":2},{"year":2017,"cited_by_count":1},{"year":2016,"cited_by_count":2},{"year":2015,"cited_by_count":1},{"year":2014,"cited_by_count":2},{"year":2012,"cited_by_count":1}],"updated_date":"2025-04-19T01:59:03.207108","created_date":"2016-06-24"}