乐胖代购免代理版

{"id":"https://openalex.org/W2133812334","doi":"https://doi.org/10.1109/test.2001.966677","title":"99% AC test coverage using only LBIST on the 1 GHz IBM S/390 zSeries 900 Microprocessor","display_name":"99% AC test coverage using only LBIST on the 1 GHz IBM S/390 zSeries 900 Microprocessor","publication_year":2002,"publication_date":"2002-11-13","ids":{"openalex":"https://openalex.org/W2133812334","doi":"https://doi.org/10.1109/test.2001.966677","mag":"2133812334"},"language":"en","primary_location":{"is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2001.966677","pdf_url":null,"source":null,"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false},"type":"article","type_crossref":"proceedings-article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5006912711","display_name":"M.P. Kusko","orcid":null},"institutions":[{"id":"https://openalex.org/I1341412227","display_name":"IBM (United States)","ror":"https://ror.org/05hh8d621","country_code":"US","type":"company","lineage":["https://openalex.org/I1341412227"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"M.P. Kusko","raw_affiliation_strings":["IBM Corporation, Poughkeepsie (NY), USA"],"affiliations":[{"raw_affiliation_string":"IBM Corporation, Poughkeepsie (NY), USA","institution_ids":["https://openalex.org/I1341412227"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5031620244","display_name":"Bryan Robbins","orcid":null},"institutions":[{"id":"https://openalex.org/I1341412227","display_name":"IBM (United States)","ror":"https://ror.org/05hh8d621","country_code":"US","type":"company","lineage":["https://openalex.org/I1341412227"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"B.J. Robbins","raw_affiliation_strings":["IBM, ,"],"affiliations":[{"raw_affiliation_string":"IBM, ,","institution_ids":["https://openalex.org/I1341412227"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5057864560","display_name":"T.J. Koprowski","orcid":null},"institutions":[{"id":"https://openalex.org/I1341412227","display_name":"IBM (United States)","ror":"https://ror.org/05hh8d621","country_code":"US","type":"company","lineage":["https://openalex.org/I1341412227"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"T.J. Koprowski","raw_affiliation_strings":["IBM, ,"],"affiliations":[{"raw_affiliation_string":"IBM, ,","institution_ids":["https://openalex.org/I1341412227"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5010780592","display_name":"W. Huott","orcid":null},"institutions":[{"id":"https://openalex.org/I1341412227","display_name":"IBM (United States)","ror":"https://ror.org/05hh8d621","country_code":"US","type":"company","lineage":["https://openalex.org/I1341412227"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"W.V. Huott","raw_affiliation_strings":["IBM, ,"],"affiliations":[{"raw_affiliation_string":"IBM, ,","institution_ids":["https://openalex.org/I1341412227"]}]}],"institution_assertions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":3.369,"has_fulltext":true,"fulltext_origin":"ngrams","cited_by_count":50,"citation_normalized_percentile":{"value":0.914166,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":92,"max":93},"biblio":{"volume":null,"issue":null,"first_page":"586","last_page":"592"},"is_retracted":false,"is_paratext":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9997,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13293","display_name":"Engineering and Test Systems","score":0.9974,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/microprocessor","display_name":"Microprocessor","score":0.7928},{"id":"https://openalex.org/keywords/ibm","display_name":"IBM","score":0.77807164},{"id":"https://openalex.org/keywords/test-suite","display_name":"Test suite","score":0.45901716}],"concepts":[{"id":"https://openalex.org/C2780728072","wikidata":"https://www.wikidata.org/wiki/Q5297","display_name":"Microprocessor","level":2,"score":0.7928},{"id":"https://openalex.org/C70388272","wikidata":"https://www.wikidata.org/wiki/Q5968558","display_name":"IBM","level":2,"score":0.77807164},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.65966874},{"id":"https://openalex.org/C115537543","wikidata":"https://www.wikidata.org/wiki/Q165596","display_name":"Cache","level":2,"score":0.65499043},{"id":"https://openalex.org/C81917197","wikidata":"https://www.wikidata.org/wiki/Q628760","display_name":"Selection (genetic algorithm)","level":2,"score":0.50757396},{"id":"https://openalex.org/C2778348673","wikidata":"https://www.wikidata.org/wiki/Q739302","display_name":"Production (economics)","level":2,"score":0.4608893},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.4601669},{"id":"https://openalex.org/C151552104","wikidata":"https://www.wikidata.org/wiki/Q7705809","display_name":"Test suite","level":4,"score":0.45901716},{"id":"https://openalex.org/C79581498","wikidata":"https://www.wikidata.org/wiki/Q1367530","display_name":"Suite","level":2,"score":0.44313252},{"id":"https://openalex.org/C2777267654","wikidata":"https://www.wikidata.org/wiki/Q3519023","display_name":"Test (biology)","level":2,"score":0.41947585},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.37274644},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.3596009},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.34190387},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.22696212},{"id":"https://openalex.org/C128942645","wikidata":"https://www.wikidata.org/wiki/Q1568346","display_name":"Test case","level":3,"score":0.1207515},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.0},{"id":"https://openalex.org/C152877465","wikidata":"https://www.wikidata.org/wiki/Q208042","display_name":"Regression analysis","level":2,"score":0.0},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C139719470","wikidata":"https://www.wikidata.org/wiki/Q39680","display_name":"Macroeconomics","level":1,"score":0.0},{"id":"https://openalex.org/C95457728","wikidata":"https://www.wikidata.org/wiki/Q309","display_name":"History","level":0,"score":0.0},{"id":"https://openalex.org/C166957645","wikidata":"https://www.wikidata.org/wiki/Q23498","display_name":"Archaeology","level":1,"score":0.0},{"id":"https://openalex.org/C162324750","wikidata":"https://www.wikidata.org/wiki/Q8134","display_name":"Economics","level":0,"score":0.0},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2001.966677","pdf_url":null,"source":null,"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false}],"best_oa_location":null,"sustainable_development_goals":[],"grants":[],"datasets":[],"versions":[],"referenced_works_count":8,"referenced_works":["https://openalex.org/W1581405316","https://openalex.org/W197391467","https://openalex.org/W2074193689","https://openalex.org/W2094036808","https://openalex.org/W2107251436","https://openalex.org/W2137045371","https://openalex.org/W2186608582","https://openalex.org/W4285719527"],"related_works":["https://openalex.org/W4253186488","https://openalex.org/W4231814374","https://openalex.org/W4231704780","https://openalex.org/W3204955359","https://openalex.org/W3126131865","https://openalex.org/W2083611981","https://openalex.org/W2072507639","https://openalex.org/W2044344400","https://openalex.org/W1996938127","https://openalex.org/W1485837041"],"abstract_inverted_index":{"This":[0,59],"paper":[1,63],"explains":[2],"a":[3,24,61,94],"new":[4,120],"logic":[5],"built-in":[6],"self-test":[7],"(LBIST)":[8],"technique":[9,26,106],"used":[10],"in":[11,77,107],"production":[12],"on":[13],"the":[14,29,48,52,79,82,88,97,102,119],"zSeries":[15],"900":[16],"microprocessor":[17],"and":[18,81,93],"associated":[19],"cache":[20],"chips.":[21],"LBIST":[22,90],"is":[23,51,60],"test":[25],"critical":[27],"to":[28,68],"S/390":[30,43],"suite":[31],"of":[32,42,55,96,104,118],"tests.":[33],"Various":[34],"improvements":[35],"have":[36],"been":[37],"made":[38,76],"over":[39],"successive":[40],"generations":[41],"part":[44],"numbers.":[45],"New":[46],"for":[47],"'00":[49],"design":[50],"programmable":[53],"selection":[54],"weights":[56],"during":[57],"LBIST.":[58],"comprehensive":[62],"covering":[64],"why":[65],"we":[66,72,111],"wanted":[67],"improve":[69],"LBIST,":[70],"how":[71],"improved":[73,89],"it,":[74],"choices":[75],"implementing":[78],"enhancement":[80],"results.":[83],"The":[84],"results":[85],"include":[86,112],"both":[87],"fault":[91],"coverage":[92],"discussion":[95],"empirical":[98],"fallout":[99],"data":[100],"showing":[101,115],"effectiveness":[103],"this":[105],"production.":[108],"In":[109],"addition,":[110],"an":[113],"example":[114],"added":[116],"benefits":[117],"technique.":[121]},"cited_by_api_url":"https://api.openalex.org/works?filter=cites:W2133812334","counts_by_year":[{"year":2020,"cited_by_count":1},{"year":2018,"cited_by_count":1},{"year":2015,"cited_by_count":2},{"year":2014,"cited_by_count":1},{"year":2012,"cited_by_count":1}],"updated_date":"2024-12-10T18:56:43.374739","created_date":"2016-06-24"}