{"id":"https://openalex.org/W4250742633","doi":"https://doi.org/10.1109/test.2000.894316","title":"A stand-alone integrated test core for time and frequency domain measurements","display_name":"A stand-alone integrated test core for time and frequency domain measurements","publication_year":2002,"publication_date":"2002-11-07","ids":{"openalex":"https://openalex.org/W4250742633","doi":"https://doi.org/10.1109/test.2000.894316"},"language":"en","primary_location":{"is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2000.894316","pdf_url":null,"source":null,"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false},"type":"article","type_crossref":"proceedings-article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5075705685","display_name":"M.M. Hafed","orcid":null},"institutions":[{"id":"https://openalex.org/I5023651","display_name":"McGill University","ror":"https://ror.org/01pxwe438","country_code":"CA","type":"funder","lineage":["https://openalex.org/I5023651"]}],"countries":["CA"],"is_corresponding":false,"raw_author_name":"M. Hafed","raw_affiliation_strings":["Microelectronics and Computer Systems Laboratory, McGill University, Montreal, QUE, Canada"],"affiliations":[{"raw_affiliation_string":"Microelectronics and Computer Systems Laboratory, McGill University, Montreal, QUE, Canada","institution_ids":["https://openalex.org/I5023651"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5045948506","display_name":"N. Abaskharoun","orcid":null},"institutions":[{"id":"https://openalex.org/I5023651","display_name":"McGill University","ror":"https://ror.org/01pxwe438","country_code":"CA","type":"funder","lineage":["https://openalex.org/I5023651"]}],"countries":["CA"],"is_corresponding":false,"raw_author_name":"N. Abaskharoun","raw_affiliation_strings":["Microelectronics and Computer Systems Laboratory, McGill University, Montreal, QUE, Canada"],"affiliations":[{"raw_affiliation_string":"Microelectronics and Computer Systems Laboratory, McGill University, Montreal, QUE, Canada","institution_ids":["https://openalex.org/I5023651"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5083312864","display_name":"G.W. Roberts","orcid":"https://orcid.org/0000-0002-4880-0272"},"institutions":[{"id":"https://openalex.org/I5023651","display_name":"McGill University","ror":"https://ror.org/01pxwe438","country_code":"CA","type":"funder","lineage":["https://openalex.org/I5023651"]}],"countries":["CA"],"is_corresponding":false,"raw_author_name":"G.W. Roberts","raw_affiliation_strings":["Microelectronics and Computer Systems Laboratory, McGill University, Montreal, QUE, Canada"],"affiliations":[{"raw_affiliation_string":"Microelectronics and Computer Systems Laboratory, McGill University, Montreal, QUE, Canada","institution_ids":["https://openalex.org/I5023651"]}]}],"institution_assertions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":5.228,"has_fulltext":true,"fulltext_origin":"ngrams","cited_by_count":26,"citation_normalized_percentile":{"value":0.758681,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":87,"max":88},"biblio":{"volume":null,"issue":null,"first_page":"1031","last_page":"1040"},"is_retracted":false,"is_paratext":false,"primary_topic":{"id":"https://openalex.org/T11417","display_name":"Advancements in PLL and VCO Technologies","score":0.9998,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11417","display_name":"Advancements in PLL and VCO Technologies","score":0.9998,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9991,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","score":0.998,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[],"concepts":[{"id":"https://openalex.org/C19118579","wikidata":"https://www.wikidata.org/wiki/Q786423","display_name":"Frequency domain","level":2,"score":0.515658},{"id":"https://openalex.org/C2164484","wikidata":"https://www.wikidata.org/wiki/Q5170150","display_name":"Core (optical fiber)","level":2,"score":0.49223772},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4904637},{"id":"https://openalex.org/C142433447","wikidata":"https://www.wikidata.org/wiki/Q7806653","display_name":"Time\u2013frequency analysis","level":3,"score":0.46752644},{"id":"https://openalex.org/C2777267654","wikidata":"https://www.wikidata.org/wiki/Q3519023","display_name":"Test (biology)","level":2,"score":0.46236542},{"id":"https://openalex.org/C103824480","wikidata":"https://www.wikidata.org/wiki/Q185889","display_name":"Time domain","level":2,"score":0.44995457},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.18722308},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.16206938},{"id":"https://openalex.org/C554190296","wikidata":"https://www.wikidata.org/wiki/Q47528","display_name":"Radar","level":2,"score":0.061706305},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2000.894316","pdf_url":null,"source":null,"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false}],"best_oa_location":null,"sustainable_development_goals":[],"grants":[],"datasets":[],"versions":[],"referenced_works_count":12,"referenced_works":["https://openalex.org/W1606253031","https://openalex.org/W1755135296","https://openalex.org/W1830201611","https://openalex.org/W1924406256","https://openalex.org/W1998284495","https://openalex.org/W2130738940","https://openalex.org/W2142974267","https://openalex.org/W2159029162","https://openalex.org/W2159312763","https://openalex.org/W2166053532","https://openalex.org/W2167896761","https://openalex.org/W2221824833"],"related_works":["https://openalex.org/W2906270673","https://openalex.org/W2388951617","https://openalex.org/W2355447608","https://openalex.org/W2167164662","https://openalex.org/W2053630710","https://openalex.org/W2024733750","https://openalex.org/W1995041532","https://openalex.org/W1980067354","https://openalex.org/W1947057263","https://openalex.org/W1482418973"],"abstract_inverted_index":{"An":[0],"area":[1,100],"efficient":[2],"and":[3,27,42,52,77],"robust":[4],"integrated":[5],"test":[6,51],"core":[7,14],"for":[8,22],"mixed-signal":[9],"circuits":[10],"is":[11,31],"described.":[12],"The":[13],"consists":[15],"of":[16,33,85],"a":[17,23,28,60,82],"completely":[18],"digital":[19],"implementation,":[20],"except":[21],"simple":[24],"reconstruction":[25],"filter":[26],"comparator.":[29],"It":[30,68],"capable":[32],"both":[34],"generating":[35],"arbitrary":[36,45],"band-limited":[37],"waveforms":[38,48],"(for":[39,49],"excitation":[40],"purposes)":[41],"coherently":[43],"digitizing":[44],"periodic":[46],"analog":[47],"DSP-based":[50],"measurement).":[53],"A":[54],"prototype":[55],"IC":[56],"was":[57,69,89],"fabricated":[58],"in":[59],"3.3":[61],"V":[62],"0.35":[63],"/spl":[64],"mu/m":[65],"CMOS":[66],"process.":[67],"demonstrated":[70],"to":[71,102],"perform":[72],"various":[73],"curve":[74],"tracing,":[75],"timing,":[76],"spectrum":[78],"analysis":[79],"tasks":[80],"at":[81],"sampling":[83],"frequency":[84],"20":[86],"MHz":[87],"(which":[88],"only":[90,103],"limited":[91],"by":[92],"our":[93],"experimental":[94],"setup)":[95],"while":[96],"taking":[97],"up":[98],"an":[99],"equivalent":[101],"about":[104],"five":[105],"thousand":[106],"standard-cell":[107],"2-input":[108],"NAND":[109],"gates.":[110]},"abstract_inverted_index_v3":null,"cited_by_api_url":"https://api.openalex.org/works?filter=cites:W4250742633","counts_by_year":[{"year":2016,"cited_by_count":1}],"updated_date":"2025-03-15T21:29:33.818909","created_date":"2022-05-12"}