{"id":"https://openalex.org/W2123831500","doi":"https://doi.org/10.1109/test.1998.743210","title":"A novel combinational testability analysis by considering signal correlation","display_name":"A novel combinational testability analysis by considering signal correlation","publication_year":2002,"publication_date":"2002-11-27","ids":{"openalex":"https://openalex.org/W2123831500","doi":"https://doi.org/10.1109/test.1998.743210","mag":"2123831500"},"language":"en","primary_location":{"is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.1998.743210","pdf_url":null,"source":null,"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false},"type":"article","type_crossref":"proceedings-article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5068327561","display_name":"Shih\u2010Chieh Chang","orcid":"https://orcid.org/0000-0002-5481-9877"},"institutions":[{"id":"https://openalex.org/I148099254","display_name":"National Chung Cheng University","ror":"https://ror.org/0028v3876","country_code":"TW","type":"education","lineage":["https://openalex.org/I148099254"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"None Shih-Chieh Chang","raw_affiliation_strings":["Department of Computer Science and Information Engineering, National Chung Cheng University"],"affiliations":[{"raw_affiliation_string":"Department of Computer Science and Information Engineering, National Chung Cheng University","institution_ids":["https://openalex.org/I148099254"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102150514","display_name":"Shi-Sen Chang","orcid":null},"institutions":[{"id":"https://openalex.org/I148099254","display_name":"National Chung Cheng University","ror":"https://ror.org/0028v3876","country_code":"TW","type":"education","lineage":["https://openalex.org/I148099254"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"None Shi-Sen Chang","raw_affiliation_strings":["Department of Computer Science and Information Engineering, National Chung Cheng University"],"affiliations":[{"raw_affiliation_string":"Department of Computer Science and Information Engineering, National Chung Cheng University","institution_ids":["https://openalex.org/I148099254"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5110090558","display_name":"Wen-Ben Jone","orcid":null},"institutions":[{"id":"https://openalex.org/I148099254","display_name":"National Chung Cheng University","ror":"https://ror.org/0028v3876","country_code":"TW","type":"education","lineage":["https://openalex.org/I148099254"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"None Wen-Ben Jone","raw_affiliation_strings":["Department of Computer Science and Information Engineering, National Chung Cheng University"],"affiliations":[{"raw_affiliation_string":"Department of Computer Science and Information Engineering, National Chung Cheng University","institution_ids":["https://openalex.org/I148099254"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5089543669","display_name":"Chien-Chung Tsai","orcid":null},"institutions":[{"id":"https://openalex.org/I105695857","display_name":"Siemens (Hungary)","ror":"https://ror.org/01rk7mv85","country_code":"HU","type":"company","lineage":["https://openalex.org/I105695857","https://openalex.org/I1325886976"]},{"id":"https://openalex.org/I4210099704","display_name":"Mentor","ror":"https://ror.org/016grqh48","country_code":"GB","type":"nonprofit","lineage":["https://openalex.org/I4210099704"]}],"countries":["GB","HU"],"is_corresponding":false,"raw_author_name":"None Chien-Chung Tsai","raw_affiliation_strings":["Mentor Graphics Corporation"],"affiliations":[{"raw_affiliation_string":"Mentor Graphics Corporation","institution_ids":["https://openalex.org/I105695857","https://openalex.org/I4210099704"]}]}],"institution_assertions":[],"countries_distinct_count":3,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":true,"fulltext_origin":"ngrams","cited_by_count":12,"citation_normalized_percentile":{"value":0.768987,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":81,"max":82},"biblio":{"volume":null,"issue":null,"first_page":"658","last_page":"667"},"is_retracted":false,"is_paratext":false,"primary_topic":{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13293","display_name":"Engineering and Test Systems","score":0.9984,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/observability","display_name":"Observability","score":0.94473165},{"id":"https://openalex.org/keywords/design-for-testing","display_name":"Design for testing","score":0.6028786},{"id":"https://openalex.org/keywords/signal","display_name":"SIGNAL (programming language)","score":0.44701117}],"concepts":[{"id":"https://openalex.org/C36299963","wikidata":"https://www.wikidata.org/wiki/Q1369844","display_name":"Observability","level":2,"score":0.94473165},{"id":"https://openalex.org/C51234621","wikidata":"https://www.wikidata.org/wiki/Q2149495","display_name":"Testability","level":2,"score":0.94324255},{"id":"https://openalex.org/C48209547","wikidata":"https://www.wikidata.org/wiki/Q1331104","display_name":"Controllability","level":2,"score":0.8584335},{"id":"https://openalex.org/C190874656","wikidata":"https://www.wikidata.org/wiki/Q5264347","display_name":"Design for testing","level":3,"score":0.6028786},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.55040467},{"id":"https://openalex.org/C2779960059","wikidata":"https://www.wikidata.org/wiki/Q7113681","display_name":"Overhead (engineering)","level":2,"score":0.49116156},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.46191382},{"id":"https://openalex.org/C2779843651","wikidata":"https://www.wikidata.org/wiki/Q7390335","display_name":"SIGNAL (programming language)","level":2,"score":0.44701117},{"id":"https://openalex.org/C117220453","wikidata":"https://www.wikidata.org/wiki/Q5172842","display_name":"Correlation","level":2,"score":0.42254373},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.3965414},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.39367294},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.2829355},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.18751273},{"id":"https://openalex.org/C28826006","wikidata":"https://www.wikidata.org/wiki/Q33521","display_name":"Applied mathematics","level":1,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.1998.743210","pdf_url":null,"source":null,"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false}],"best_oa_location":null,"sustainable_development_goals":[],"grants":[],"datasets":[],"versions":[],"referenced_works_count":22,"referenced_works":["https://openalex.org/W1491411410","https://openalex.org/W1515082873","https://openalex.org/W1827975329","https://openalex.org/W1856915098","https://openalex.org/W1969070758","https://openalex.org/W1978303825","https://openalex.org/W2021645550","https://openalex.org/W2041753256","https://openalex.org/W2096554094","https://openalex.org/W2101800224","https://openalex.org/W2115571162","https://openalex.org/W2134427430","https://openalex.org/W2135129887","https://openalex.org/W2151094122","https://openalex.org/W2154066710","https://openalex.org/W2162256736","https://openalex.org/W2162874773","https://openalex.org/W260727648","https://openalex.org/W2740369419","https://openalex.org/W4247119135","https://openalex.org/W4302458519","https://openalex.org/W85643503"],"related_works":["https://openalex.org/W2801563517","https://openalex.org/W2782529250","https://openalex.org/W2508171592","https://openalex.org/W2332386680","https://openalex.org/W2130864543","https://openalex.org/W2068126039","https://openalex.org/W2041749520","https://openalex.org/W2037921533","https://openalex.org/W1986570998","https://openalex.org/W1983142522"],"abstract_inverted_index":{"To":[0],"predict":[1],"the":[2,39],"difficulty":[3],"of":[4,73],"testing":[5],"a":[6,37],"wire":[7],"stuck-at":[8],"fault,":[9],"testability":[10,16,58,74],"analysis":[11,75],"algorithms":[12],"provide":[13],"an":[14,48],"estimated":[15,40],"value":[17,41],"by":[18],"computing":[19],"controllability":[20,30],"and":[21,31],"observability.":[22],"In":[23],"all":[24],"previous":[25],"work,":[26],"signal":[27,55],"correlation":[28,56],"between":[29],"observability":[32],"is":[33],"generally":[34],"ignored.":[35],"As":[36],"result,":[38],"can":[42,76],"be":[43,77],"inaccurate.":[44],"This":[45],"paper":[46],"discusses":[47],"efficient":[49],"method":[50],"to":[51],"take":[52],"into":[53],"account":[54],"for":[57],"analysis.":[59],"Our":[60],"experimental":[61],"results":[62],"have":[63],"shown":[64],"that,":[65],"with":[66],"little":[67],"run":[68],"time":[69],"overhead,":[70],"significant":[71],"improvement":[72],"achieved.":[78]},"abstract_inverted_index_v3":null,"cited_by_api_url":"https://api.openalex.org/works?filter=cites:W2123831500","counts_by_year":[{"year":2019,"cited_by_count":1},{"year":2018,"cited_by_count":3},{"year":2017,"cited_by_count":2},{"year":2016,"cited_by_count":3},{"year":2015,"cited_by_count":2}],"updated_date":"2025-04-20T06:56:32.459619","created_date":"2016-06-24"}