乐胖代购免代理版

{"id":"https://openalex.org/W2914151932","doi":"https://doi.org/10.1109/tci.2019.2895203","title":"Analysis of Artifacts in SAR Imagery Due to Fluctuation in Refractive Index","display_name":"Analysis of Artifacts in SAR Imagery Due to Fluctuation in Refractive Index","publication_year":2019,"publication_date":"2019-01-24","ids":{"openalex":"https://openalex.org/W2914151932","doi":"https://doi.org/10.1109/tci.2019.2895203","mag":"2914151932"},"language":"en","primary_location":{"is_oa":true,"landing_page_url":"https://doi.org/10.1109/tci.2019.2895203","pdf_url":null,"source":{"id":"https://openalex.org/S4210233665","display_name":"IEEE Transactions on Computational Imaging","issn_l":"2333-9403","issn":["2333-9403","2573-0436"],"is_oa":false,"is_in_doaj":false,"is_indexed_in_scopus":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"publisher-specific-oa","license_id":"https://openalex.org/licenses/publisher-specific-oa","version":"acceptedVersion","is_accepted":true,"is_published":false},"type":"article","type_crossref":"journal-article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"bronze","oa_url":"https://doi.org/10.1109/tci.2019.2895203","any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5056090082","display_name":"Birsen Yaz\u0131c\u0131","orcid":"https://orcid.org/0000-0002-0912-0848"},"institutions":[{"id":"https://openalex.org/I165799507","display_name":"Rensselaer Polytechnic Institute","ror":"https://ror.org/01rtyzb94","country_code":"US","type":"funder","lineage":["https://openalex.org/I165799507"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Birsen Yazici","raw_affiliation_strings":["Department of Electrical, Computer and Systems Engineering, Rensselaer Polytechnic Institute, Troy, NY, USA"],"affiliations":[{"raw_affiliation_string":"Department of Electrical, Computer and Systems Engineering, Rensselaer Polytechnic Institute, Troy, NY, USA","institution_ids":["https://openalex.org/I165799507"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100398647","display_name":"Ling Wang","orcid":"https://orcid.org/0000-0001-7140-430X"},"institutions":[{"id":"https://openalex.org/I9842412","display_name":"Nanjing University of Aeronautics and Astronautics","ror":"https://ror.org/01scyh794","country_code":"CN","type":"funder","lineage":["https://openalex.org/I9842412"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Ling Wang","raw_affiliation_strings":["Department of Information and Communication Engineering, Key Laboratory of Radar Imaging and Microwave Photonics of the Ministry of Education, Nanjing University of Aeronautics and Astronautics, Nanjing, China"],"affiliations":[{"raw_affiliation_string":"Department of Information and Communication Engineering, Key Laboratory of Radar Imaging and Microwave Photonics of the Ministry of Education, Nanjing University of Aeronautics and Astronautics, Nanjing, China","institution_ids":["https://openalex.org/I9842412"]}]}],"institution_assertions":[],"countries_distinct_count":2,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.178,"has_fulltext":true,"fulltext_origin":"ngrams","cited_by_count":3,"citation_normalized_percentile":{"value":0.638417,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":74,"max":76},"biblio":{"volume":"5","issue":"3","first_page":"450","last_page":"464"},"is_retracted":false,"is_paratext":false,"primary_topic":{"id":"https://openalex.org/T10801","display_name":"Synthetic Aperture Radar (SAR) Applications and Techniques","score":0.9999,"subfield":{"id":"https://openalex.org/subfields/2202","display_name":"Aerospace Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10801","display_name":"Synthetic Aperture Radar (SAR) Applications and Techniques","score":0.9999,"subfield":{"id":"https://openalex.org/subfields/2202","display_name":"Aerospace Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11038","display_name":"Advanced SAR Imaging Techniques","score":0.9998,"subfield":{"id":"https://openalex.org/subfields/2202","display_name":"Aerospace Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11739","display_name":"Microwave Imaging and Scattering Analysis","score":0.9958,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[],"concepts":[{"id":"https://openalex.org/C87360688","wikidata":"https://www.wikidata.org/wiki/Q740686","display_name":"Synthetic aperture radar","level":2,"score":0.7702321},{"id":"https://openalex.org/C42067758","wikidata":"https://www.wikidata.org/wiki/Q174102","display_name":"Refractive index","level":2,"score":0.68522996},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.5678353},{"id":"https://openalex.org/C180205008","wikidata":"https://www.wikidata.org/wiki/Q159190","display_name":"Amplitude","level":2,"score":0.51567185},{"id":"https://openalex.org/C62649853","wikidata":"https://www.wikidata.org/wiki/Q199687","display_name":"Remote sensing","level":1,"score":0.42492133},{"id":"https://openalex.org/C125287762","wikidata":"https://www.wikidata.org/wiki/Q1758948","display_name":"Absorption (acoustics)","level":2,"score":0.416684},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.38322467},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.38309348},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.3047046}],"mesh":[],"locations_count":1,"locations":[{"is_oa":true,"landing_page_url":"https://doi.org/10.1109/tci.2019.2895203","pdf_url":null,"source":{"id":"https://openalex.org/S4210233665","display_name":"IEEE Transactions on Computational Imaging","issn_l":"2333-9403","issn":["2333-9403","2573-0436"],"is_oa":false,"is_in_doaj":false,"is_indexed_in_scopus":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"publisher-specific-oa","license_id":"https://openalex.org/licenses/publisher-specific-oa","version":"acceptedVersion","is_accepted":true,"is_published":false}],"best_oa_location":{"is_oa":true,"landing_page_url":"https://doi.org/10.1109/tci.2019.2895203","pdf_url":null,"source":{"id":"https://openalex.org/S4210233665","display_name":"IEEE Transactions on Computational Imaging","issn_l":"2333-9403","issn":["2333-9403","2573-0436"],"is_oa":false,"is_in_doaj":false,"is_indexed_in_scopus":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"publisher-specific-oa","license_id":"https://openalex.org/licenses/publisher-specific-oa","version":"acceptedVersion","is_accepted":true,"is_published":false},"sustainable_development_goals":[],"grants":[{"funder":"https://openalex.org/F4320306076","funder_display_name":"National Science Foundation","award_id":"ECCS-1809234"},{"funder":"https://openalex.org/F4320337345","funder_display_name":"Office of Naval Research","award_id":"N0001418-1-2068"},{"funder":"https://openalex.org/F4320338279","funder_display_name":"Air Force Office of Scientific Research","award_id":"FA9550-16-1-0234"}],"datasets":[],"versions":[],"referenced_works_count":39,"referenced_works":["https://openalex.org/W1953358465","https://openalex.org/W1974634302","https://openalex.org/W1992661543","https://openalex.org/W2014636240","https://openalex.org/W2025969570","https://openalex.org/W2028493081","https://openalex.org/W2034696522","https://openalex.org/W2046634250","https://openalex.org/W2049288018","https://openalex.org/W2068772629","https://openalex.org/W2073796012","https://openalex.org/W2076166758","https://openalex.org/W2092853392","https://openalex.org/W2104778672","https://openalex.org/W2109061412","https://openalex.org/W2120041222","https://openalex.org/W2129947833","https://openalex.org/W2131328378","https://openalex.org/W2132839514","https://openalex.org/W2133386437","https://openalex.org/W2134686545","https://openalex.org/W2138805581","https://openalex.org/W2144436255","https://openalex.org/W2146117243","https://openalex.org/W2154238733","https://openalex.org/W2159822431","https://openalex.org/W2162215273","https://openalex.org/W2166382421","https://openalex.org/W2166947456","https://openalex.org/W2169117591","https://openalex.org/W2209091105","https://openalex.org/W2252343443","https://openalex.org/W2513908457","https://openalex.org/W2542059353","https://openalex.org/W2565653267","https://openalex.org/W2625319511","https://openalex.org/W2738372290","https://openalex.org/W4236349682","https://openalex.org/W4394006900"],"related_works":["https://openalex.org/W782553550","https://openalex.org/W4252699458","https://openalex.org/W3193665957","https://openalex.org/W2121524756","https://openalex.org/W2080868394","https://openalex.org/W2064502186","https://openalex.org/W2061199333","https://openalex.org/W2011422850","https://openalex.org/W2004357175","https://openalex.org/W1990192565"],"abstract_inverted_index":{"In":[0],"this":[1],"paper,":[2],"we":[3],"analyze":[4,53],"the":[5,16,20,50,54,65,93,99],"artifacts":[6],"in":[7,15,28,56,64,92,98,116],"synthetic":[8,117],"aperture":[9,118],"radar":[10,119],"imagery":[11],"due":[12,23,59],"to":[13,24,60,73,105,126],"fluctuations":[14,63],"refractive":[17,41,47],"index":[18,48],"of":[19,30,67,101],"atmosphere,":[21],"specifically":[22],"absorption":[25,37,61],"and":[26,38,52,62],"variations":[27,91],"speed":[29,66,100],"light.":[31],"SAR":[32],"image":[33],"reconstruction":[34],"algorithms":[35],"ignore":[36],"assume":[39,44],"unit":[40],"index.":[42],"We":[43,122],"a":[45,81],"complex-valued":[46],"for":[49],"atmosphere":[51],"errors":[55,112],"reconstructed":[57],"images":[58],"electromagnetic":[68],"(EM)":[69],"waves.":[70],"Absorption":[71],"leads":[72],"amplitude":[74],"errors,":[75,107],"which":[76,108],"can":[77,86],"be":[78,87],"viewed":[79],"as":[80,89,110],"filtering":[82],"error.":[83],"This":[84],"error":[85],"characterized":[88],"systematic":[90],"ground":[94],"reflectivity":[95],"function.":[96],"Fluctuations":[97],"EM":[102],"waves":[103],"lead":[104],"phase":[106],"manifest":[109],"positioning":[111],"or":[113],"geometric":[114],"distortions":[115],"(SAR)":[120],"imagery.":[121],"perform":[123],"numerical":[124],"simulations":[125],"verify":[127],"our":[128],"analysis.":[129]},"abstract_inverted_index_v3":null,"cited_by_api_url":"https://api.openalex.org/works?filter=cites:W2914151932","counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":1}],"updated_date":"2025-04-21T04:49:33.617758","created_date":"2019-02-21"}