乐胖代购免代理版

{"id":"https://openalex.org/W4388901662","doi":"https://doi.org/10.1109/taes.2023.3293455","title":"On the Characterization of Partial-Discharge Endurance of Dielectric Materials for Aerospace Applications","display_name":"On the Characterization of Partial-Discharge Endurance of Dielectric Materials for Aerospace Applications","publication_year":2023,"publication_date":"2023-11-22","ids":{"openalex":"https://openalex.org/W4388901662","doi":"https://doi.org/10.1109/taes.2023.3293455"},"language":"en","primary_location":{"is_oa":false,"landing_page_url":"https://doi.org/10.1109/taes.2023.3293455","pdf_url":null,"source":{"id":"https://openalex.org/S193624734","display_name":"IEEE Transactions on Aerospace and Electronic Systems","issn_l":"0018-9251","issn":["0018-9251","1557-9603","2371-9877"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false},"type":"article","type_crossref":"journal-article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5027146086","display_name":"Gian Carlo Montanari","orcid":"https://orcid.org/0000-0003-2025-8693"},"institutions":[{"id":"https://openalex.org/I103163165","display_name":"Florida State University","ror":"https://ror.org/05g3dte14","country_code":"US","type":"education","lineage":["https://openalex.org/I103163165"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Gian Carlo Montanari","raw_affiliation_strings":["Center for Advanced Power Systems, Florida State University, Tallahassee, FL, USA"],"affiliations":[{"raw_affiliation_string":"Center for Advanced Power Systems, Florida State University, Tallahassee, FL, USA","institution_ids":["https://openalex.org/I103163165"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5006014656","display_name":"Skyler Schwartz","orcid":"https://orcid.org/0000-0002-7491-5161"},"institutions":[{"id":"https://openalex.org/I43579087","display_name":"University of Wisconsin\u2013Milwaukee","ror":"https://ror.org/031q21x57","country_code":"US","type":"education","lineage":["https://openalex.org/I43579087"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Skyler Schwartz","raw_affiliation_strings":["Department of Electrical Engineering and Computer Science, University of Wisconsin-Milwaukee, Milwaukee, WI, USA"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering and Computer Science, University of Wisconsin-Milwaukee, Milwaukee, WI, USA","institution_ids":["https://openalex.org/I43579087"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5075778227","display_name":"Robert Cuzner","orcid":"https://orcid.org/0000-0001-9522-6392"},"institutions":[{"id":"https://openalex.org/I43579087","display_name":"University of Wisconsin\u2013Milwaukee","ror":"https://ror.org/031q21x57","country_code":"US","type":"education","lineage":["https://openalex.org/I43579087"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Robert Cuzner","raw_affiliation_strings":["Department of Electrical Engineering and Computer Science, University of Wisconsin-Milwaukee, Milwaukee, WI, USA"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering and Computer Science, University of Wisconsin-Milwaukee, Milwaukee, WI, USA","institution_ids":["https://openalex.org/I43579087"]}]}],"institution_assertions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.544,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.667822,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":84,"max":87},"biblio":{"volume":"59","issue":"6","first_page":"7590","last_page":"7599"},"is_retracted":false,"is_paratext":false,"primary_topic":{"id":"https://openalex.org/T10511","display_name":"High voltage insulation and dielectric phenomena","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10511","display_name":"High voltage insulation and dielectric phenomena","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12495","display_name":"Electrostatic Discharge in Electronics","score":0.9946,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11343","display_name":"Power Transformer Diagnostics and Insulation","score":0.9938,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/accelerated-life-testing","display_name":"Accelerated life testing","score":0.5030002},{"id":"https://openalex.org/keywords/resilience","display_name":"Resilience","score":0.41490763}],"concepts":[{"id":"https://openalex.org/C167740415","wikidata":"https://www.wikidata.org/wiki/Q2876213","display_name":"Aerospace","level":2,"score":0.7982607},{"id":"https://openalex.org/C130143024","wikidata":"https://www.wikidata.org/wiki/Q1929972","display_name":"Partial discharge","level":3,"score":0.6957115},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.65372753},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.5952123},{"id":"https://openalex.org/C2779343474","wikidata":"https://www.wikidata.org/wiki/Q3109175","display_name":"Context (archaeology)","level":2,"score":0.5926224},{"id":"https://openalex.org/C158379689","wikidata":"https://www.wikidata.org/wiki/Q3533504","display_name":"Accelerated life testing","level":3,"score":0.5030002},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.45501342},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.43912107},{"id":"https://openalex.org/C138331895","wikidata":"https://www.wikidata.org/wiki/Q11650","display_name":"Electronics","level":2,"score":0.4316249},{"id":"https://openalex.org/C2779585090","wikidata":"https://www.wikidata.org/wiki/Q3457762","display_name":"Resilience (materials science)","level":2,"score":0.41490763},{"id":"https://openalex.org/C171146098","wikidata":"https://www.wikidata.org/wiki/Q124192","display_name":"Automotive engineering","level":1,"score":0.39723766},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.33092505},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.30930033},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.29262906},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.25192797},{"id":"https://openalex.org/C146978453","wikidata":"https://www.wikidata.org/wiki/Q3798668","display_name":"Aerospace engineering","level":1,"score":0.0},{"id":"https://openalex.org/C15744967","wikidata":"https://www.wikidata.org/wiki/Q9418","display_name":"Psychology","level":0,"score":0.0},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C138496976","wikidata":"https://www.wikidata.org/wiki/Q175002","display_name":"Developmental psychology","level":1,"score":0.0},{"id":"https://openalex.org/C101433766","wikidata":"https://www.wikidata.org/wiki/Q3543263","display_name":"Maturity (psychological)","level":2,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"is_oa":false,"landing_page_url":"https://doi.org/10.1109/taes.2023.3293455","pdf_url":null,"source":{"id":"https://openalex.org/S193624734","display_name":"IEEE Transactions on Aerospace and Electronic Systems","issn_l":"0018-9251","issn":["0018-9251","1557-9603","2371-9877"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false}],"best_oa_location":null,"sustainable_development_goals":[],"grants":[{"funder":"https://openalex.org/F4320306084","funder_display_name":"U.S. Department of Energy","award_id":"ZGJ-9-92284"},{"funder":"https://openalex.org/F4320337345","funder_display_name":"Office of Naval Research","award_id":"N00014-21-1-2124"}],"datasets":[],"versions":[],"referenced_works_count":26,"referenced_works":["https://openalex.org/W1997161466","https://openalex.org/W2049503305","https://openalex.org/W2112050963","https://openalex.org/W2132417802","https://openalex.org/W2143257327","https://openalex.org/W2157888346","https://openalex.org/W2265943583","https://openalex.org/W2513723723","https://openalex.org/W2893341647","https://openalex.org/W2897740783","https://openalex.org/W2998548402","https://openalex.org/W3090111049","https://openalex.org/W3120784776","https://openalex.org/W3135010812","https://openalex.org/W3194924262","https://openalex.org/W4200157778","https://openalex.org/W4212842665","https://openalex.org/W4237937493","https://openalex.org/W4243759745","https://openalex.org/W4309603620","https://openalex.org/W4312645560","https://openalex.org/W4313575468","https://openalex.org/W4317743656","https://openalex.org/W4361853982","https://openalex.org/W4379878414","https://openalex.org/W614938507"],"related_works":["https://openalex.org/W4282008660","https://openalex.org/W3155062245","https://openalex.org/W2955994650","https://openalex.org/W2834849852","https://openalex.org/W2536936696","https://openalex.org/W2488364933","https://openalex.org/W2393409683","https://openalex.org/W2294135824","https://openalex.org/W2066632781","https://openalex.org/W2016042781"],"abstract_inverted_index":{"The":[0],"increasing":[1],"voltage":[2,17],"and":[3,10,65,81,103,121,147,172,194],"electrothermal":[4],"stress":[5],"in":[6,42,51],"aerospace":[7,94],"electrical":[8,28,198],"assets,":[9],"the":[11,79,98,189,197],"presence":[12],"of":[13,24,27,53,83,89,106,114,123,157,192],"unconventional":[14],"power":[15],"electronics":[16],"waveforms,":[18],"is":[19],"questing":[20],"for":[21,78,93,143,148,196],"thorough":[22],"redesign":[23],"insulation":[25],"systems":[26],"asset":[29],"components.":[30],"Design":[31],"criteria":[32,139],"which":[33,96],"are":[34,58,152],"partial":[35],"discharge":[36],"(PD)":[37],"free,":[38],"new":[39],"materials,":[40],"and,":[41],"particular,":[43],"materials":[44,92],"showing":[45],"increased":[46],"resistance":[47],"(endurance)":[48],"to":[49,62,100,132,135,140,180,187],"PD":[50,54,84,124,133,174],"case":[52],"inception":[55],"during":[56,165],"operation,":[57,166],"topics":[59],"that":[60],"need":[61],"be":[63,101,136,163],"faced":[64],"developed":[66,153,169],"rapidly.":[67],"In":[68],"such":[69,158],"a":[70,170,178,182],"context,":[71],"this":[72],"article":[73],"proposes":[74],"an":[75,126],"accelerated":[76,108,115],"procedure":[77,112,185],"evaluation":[80],"comparison":[82],"endurance,":[85],"or":[86],"resilience,":[87],"capability":[88],"candidate":[90],"insulating":[91],"application,":[95],"has":[97],"advantage":[99],"shorter":[102],"more":[104],"informative":[105],"conventional":[107],"life":[109,150],"tests.":[110,159],"This":[111],"consists":[113],"surface":[116],"erosion":[117],"tests,":[118],"where":[119],"measurement":[120],"monitoring":[122,175],"by":[125],"innovative":[127],"approach":[128],"allows":[129],"material":[130],"endurance":[131],"degradation":[134],"evaluated.":[137],"Also,":[138],"establish":[141],"algorithms":[142,161],"Dynamic":[144],"Health":[145],"Index":[146],"residual":[149],"estimation":[151],"here":[154],"as":[155,177],"take-away":[156],"These":[160],"could":[162],"applied":[164],"upon":[167],"having":[168],"robust":[171],"automatic":[173],"tool,":[176],"means":[179],"support":[181],"condition-based":[183],"maintenance":[184],"able":[186],"ensure":[188],"desired":[190],"levels":[191],"reliability":[193],"safety":[195],"asset.":[199]},"cited_by_api_url":"https://api.openalex.org/works?filter=cites:W4388901662","counts_by_year":[{"year":2024,"cited_by_count":2},{"year":2023,"cited_by_count":1}],"updated_date":"2025-01-16T11:47:28.254950","created_date":"2023-11-23"}