{"id":"https://openalex.org/W2967892747","doi":"https://doi.org/10.1109/smacd.2019.8795245","title":"TiDeVa: A Toolbox for the Automated and Robust Analysis of Time-Dependent Variability at Transistor Level","display_name":"TiDeVa: A Toolbox for the Automated and Robust Analysis of Time-Dependent Variability at Transistor Level","publication_year":2019,"publication_date":"2019-07-01","ids":{"openalex":"https://openalex.org/W2967892747","doi":"https://doi.org/10.1109/smacd.2019.8795245","mag":"2967892747"},"language":"en","primary_location":{"is_oa":false,"landing_page_url":"https://doi.org/10.1109/smacd.2019.8795245","pdf_url":null,"source":null,"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false},"type":"article","type_crossref":"proceedings-article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"https://digital.csic.es/bitstream/10261/354683/1/SMACD_2019_TiDeVa.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5035904954","display_name":"P. Saraz\u00e1-Canflanca","orcid":"https://orcid.org/0000-0003-2155-8305"},"institutions":[{"id":"https://openalex.org/I4210104545","display_name":"Instituto de Microelectr\u00f3nica de Sevilla","ror":"https://ror.org/01mqtzm43","country_code":"ES","type":"facility","lineage":["https://openalex.org/I134820265","https://openalex.org/I4210104545","https://openalex.org/I4210147934","https://openalex.org/I79238269"]},{"id":"https://openalex.org/I79238269","display_name":"Universidad de Sevilla","ror":"https://ror.org/03yxnpp24","country_code":"ES","type":"education","lineage":["https://openalex.org/I79238269"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"P. Saraza-Canflanca","raw_affiliation_strings":["Instituto de Microelectr\u00f3nica de Sevilla, IMSE-CNM (CSIC/Universidad de Sevilla), Sevilla, Spain"],"affiliations":[{"raw_affiliation_string":"Instituto de Microelectr\u00f3nica de Sevilla, IMSE-CNM (CSIC/Universidad de Sevilla), Sevilla, Spain","institution_ids":["https://openalex.org/I4210104545","https://openalex.org/I79238269"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5056827862","display_name":"J. Diaz-Fortuny","orcid":"https://orcid.org/0000-0002-8186-071X"},"institutions":[{"id":"https://openalex.org/I123044942","display_name":"Universitat Aut\u00f2noma de Barcelona","ror":"https://ror.org/052g8jq94","country_code":"ES","type":"education","lineage":["https://openalex.org/I123044942"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"J. Diaz-Fortuny","raw_affiliation_strings":["Electronic Engineering Department (REDEC) group, Universitat Aut\u00f2noma de Barcelona (UAB), Barcelona, Spain"],"affiliations":[{"raw_affiliation_string":"Electronic Engineering Department (REDEC) group, Universitat Aut\u00f2noma de Barcelona (UAB), Barcelona, Spain","institution_ids":["https://openalex.org/I123044942"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5068422347","display_name":"R. Castro\u2010L\u00f3pez","orcid":"https://orcid.org/0000-0002-6247-3124"},"institutions":[{"id":"https://openalex.org/I4210104545","display_name":"Instituto de Microelectr\u00f3nica de Sevilla","ror":"https://ror.org/01mqtzm43","country_code":"ES","type":"facility","lineage":["https://openalex.org/I134820265","https://openalex.org/I4210104545","https://openalex.org/I4210147934","https://openalex.org/I79238269"]},{"id":"https://openalex.org/I79238269","display_name":"Universidad de Sevilla","ror":"https://ror.org/03yxnpp24","country_code":"ES","type":"education","lineage":["https://openalex.org/I79238269"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"R. Castro-Lopez","raw_affiliation_strings":["Instituto de Microelectr\u00f3nica de Sevilla, IMSE-CNM (CSIC/Universidad de Sevilla), Sevilla, Spain"],"affiliations":[{"raw_affiliation_string":"Instituto de Microelectr\u00f3nica de Sevilla, IMSE-CNM (CSIC/Universidad de Sevilla), Sevilla, Spain","institution_ids":["https://openalex.org/I4210104545","https://openalex.org/I79238269"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5011140420","display_name":"E. Roca","orcid":"https://orcid.org/0000-0001-6260-6495"},"institutions":[{"id":"https://openalex.org/I4210104545","display_name":"Instituto de Microelectr\u00f3nica de Sevilla","ror":"https://ror.org/01mqtzm43","country_code":"ES","type":"facility","lineage":["https://openalex.org/I134820265","https://openalex.org/I4210104545","https://openalex.org/I4210147934","https://openalex.org/I79238269"]},{"id":"https://openalex.org/I79238269","display_name":"Universidad de Sevilla","ror":"https://ror.org/03yxnpp24","country_code":"ES","type":"education","lineage":["https://openalex.org/I79238269"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"E. Roca","raw_affiliation_strings":["Instituto de Microelectr\u00f3nica de Sevilla, IMSE-CNM (CSIC/Universidad de Sevilla), Sevilla, Spain"],"affiliations":[{"raw_affiliation_string":"Instituto de Microelectr\u00f3nica de Sevilla, IMSE-CNM (CSIC/Universidad de Sevilla), Sevilla, Spain","institution_ids":["https://openalex.org/I4210104545","https://openalex.org/I79238269"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5004487540","display_name":"J. Mart\u00edn-Mart\u00ednez","orcid":"https://orcid.org/0000-0001-5938-5898"},"institutions":[{"id":"https://openalex.org/I123044942","display_name":"Universitat Aut\u00f2noma de Barcelona","ror":"https://ror.org/052g8jq94","country_code":"ES","type":"education","lineage":["https://openalex.org/I123044942"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"J. Martin-Martinez","raw_affiliation_strings":["Electronic Engineering Department (REDEC) group, Universitat Aut\u00f2noma de Barcelona (UAB), Barcelona, Spain"],"affiliations":[{"raw_affiliation_string":"Electronic Engineering Department (REDEC) group, Universitat Aut\u00f2noma de Barcelona (UAB), Barcelona, Spain","institution_ids":["https://openalex.org/I123044942"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5058670975","display_name":"R. Rodr\u0131\u0301guez","orcid":"https://orcid.org/0000-0002-4565-6703"},"institutions":[{"id":"https://openalex.org/I123044942","display_name":"Universitat Aut\u00f2noma de Barcelona","ror":"https://ror.org/052g8jq94","country_code":"ES","type":"education","lineage":["https://openalex.org/I123044942"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"R. Rodriguez","raw_affiliation_strings":["Electronic Engineering Department (REDEC) group, Universitat Aut\u00f2noma de Barcelona (UAB), Barcelona, Spain"],"affiliations":[{"raw_affiliation_string":"Electronic Engineering Department (REDEC) group, Universitat Aut\u00f2noma de Barcelona (UAB), Barcelona, Spain","institution_ids":["https://openalex.org/I123044942"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5017592638","display_name":"M. Nafr\u0131\u0301a","orcid":"https://orcid.org/0000-0002-9549-2890"},"institutions":[{"id":"https://openalex.org/I123044942","display_name":"Universitat Aut\u00f2noma de Barcelona","ror":"https://ror.org/052g8jq94","country_code":"ES","type":"education","lineage":["https://openalex.org/I123044942"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"M. Nafria","raw_affiliation_strings":["Electronic Engineering Department (REDEC) group, Universitat Aut\u00f2noma de Barcelona (UAB), Barcelona, Spain"],"affiliations":[{"raw_affiliation_string":"Electronic Engineering Department (REDEC) group, Universitat Aut\u00f2noma de Barcelona (UAB), Barcelona, Spain","institution_ids":["https://openalex.org/I123044942"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5041853563","display_name":"F.V. Fern\u00e1ndez","orcid":"https://orcid.org/0000-0001-8682-2280"},"institutions":[{"id":"https://openalex.org/I4210104545","display_name":"Instituto de Microelectr\u00f3nica de Sevilla","ror":"https://ror.org/01mqtzm43","country_code":"ES","type":"facility","lineage":["https://openalex.org/I134820265","https://openalex.org/I4210104545","https://openalex.org/I4210147934","https://openalex.org/I79238269"]},{"id":"https://openalex.org/I79238269","display_name":"Universidad de Sevilla","ror":"https://ror.org/03yxnpp24","country_code":"ES","type":"education","lineage":["https://openalex.org/I79238269"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"F.V. Fernandez","raw_affiliation_strings":["Instituto de Microelectr\u00f3nica de Sevilla, IMSE-CNM (CSIC/Universidad de Sevilla), Sevilla, Spain"],"affiliations":[{"raw_affiliation_string":"Instituto de Microelectr\u00f3nica de Sevilla, IMSE-CNM (CSIC/Universidad de Sevilla), Sevilla, Spain","institution_ids":["https://openalex.org/I4210104545","https://openalex.org/I79238269"]}]}],"institution_assertions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.651,"has_fulltext":true,"fulltext_origin":"pdf","cited_by_count":4,"citation_normalized_percentile":{"value":0.824985,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":77,"max":79},"biblio":{"volume":null,"issue":null,"first_page":"197","last_page":"200"},"is_retracted":false,"is_paratext":false,"primary_topic":{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/toolbox","display_name":"Toolbox","score":0.7476163},{"id":"https://openalex.org/keywords/circuit-reliability","display_name":"Circuit reliability","score":0.43645832}],"concepts":[{"id":"https://openalex.org/C2777655017","wikidata":"https://www.wikidata.org/wiki/Q1501161","display_name":"Toolbox","level":2,"score":0.7476163},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.6748711},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.611691},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.60398203},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.5218833},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.506477},{"id":"https://openalex.org/C204323151","wikidata":"https://www.wikidata.org/wiki/Q905424","display_name":"Range (aeronautics)","level":2,"score":0.49952698},{"id":"https://openalex.org/C2778309119","wikidata":"https://www.wikidata.org/wiki/Q5121614","display_name":"Circuit reliability","level":4,"score":0.43645832},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.28632534},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.20630378},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.16394219},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.14412591},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.08566585},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.0},{"id":"https://openalex.org/C146978453","wikidata":"https://www.wikidata.org/wiki/Q3798668","display_name":"Aerospace engineering","level":1,"score":0.0},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"is_oa":false,"landing_page_url":"https://doi.org/10.1109/smacd.2019.8795245","pdf_url":null,"source":null,"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false},{"is_oa":true,"landing_page_url":"https://hdl.handle.net/10261/354683","pdf_url":"https://digital.csic.es/bitstream/10261/354683/1/SMACD_2019_TiDeVa.pdf","source":{"id":"https://openalex.org/S4306400616","display_name":"DIGITAL.CSIC (Spanish National Research Council (CSIC))","issn_l":null,"issn":null,"is_oa":true,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I134820265","host_organization_name":"Consejo Superior de Investigaciones Cient\u00edficas","host_organization_lineage":["https://openalex.org/I134820265"],"host_organization_lineage_names":["Consejo Superior de Investigaciones Cient\u00edficas"],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"submittedVersion","is_accepted":false,"is_published":false}],"best_oa_location":{"is_oa":true,"landing_page_url":"https://hdl.handle.net/10261/354683","pdf_url":"https://digital.csic.es/bitstream/10261/354683/1/SMACD_2019_TiDeVa.pdf","source":{"id":"https://openalex.org/S4306400616","display_name":"DIGITAL.CSIC (Spanish National Research Council (CSIC))","issn_l":null,"issn":null,"is_oa":true,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I134820265","host_organization_name":"Consejo Superior de Investigaciones Cient\u00edficas","host_organization_lineage":["https://openalex.org/I134820265"],"host_organization_lineage_names":["Consejo Superior de Investigaciones Cient\u00edficas"],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"submittedVersion","is_accepted":false,"is_published":false},"sustainable_development_goals":[],"grants":[],"datasets":[],"versions":[],"referenced_works_count":14,"referenced_works":["https://openalex.org/W1988922865","https://openalex.org/W1996594407","https://openalex.org/W2001309624","https://openalex.org/W2130688260","https://openalex.org/W2149134343","https://openalex.org/W2151679526","https://openalex.org/W2365858435","https://openalex.org/W2734631967","https://openalex.org/W2734764095","https://openalex.org/W2887399373","https://openalex.org/W2904664224","https://openalex.org/W2941497427","https://openalex.org/W2945740982","https://openalex.org/W2945939773"],"related_works":["https://openalex.org/W829257147","https://openalex.org/W4393677513","https://openalex.org/W4390832911","https://openalex.org/W4230157952","https://openalex.org/W4205140848","https://openalex.org/W2978678743","https://openalex.org/W2797837731","https://openalex.org/W2068663075","https://openalex.org/W2029364567","https://openalex.org/W1965248262"],"abstract_inverted_index":{"Time-Dependent":[0],"Variability":[1],"has":[2],"attracted":[3],"increasing":[4],"interest":[5],"in":[6,43,57,68],"the":[7,44,83],"last":[8],"years.":[9],"In":[10,71],"particular,":[11],"time-dependent":[12],"phenomena":[13,48],"such":[14],"as":[15],"Bias":[16],"Temperature":[17],"Instability,":[18],"Hot":[19],"Carrier":[20],"Injection":[21],"and":[22,34,39,53,85,92],"Random":[23],"Telegraph":[24],"Noise":[25],"can":[26],"have":[27],"a":[28,50,58,74,78],"large":[29],"impact":[30],"on":[31],"circuit":[32],"reliability,":[33],"must":[35,54],"be":[36,55],"therefore":[37],"characterized":[38,56],"modeled.":[40],"For":[41],"technologies":[42],"nanometer":[45],"range,":[46],"these":[47],"reveal":[49],"stochastic":[51],"behavior":[52],"massive":[59],"manner,":[60],"with":[61,77],"enormous":[62],"amounts":[63],"of":[64],"data":[65],"being":[66],"generated":[67],"each":[69],"measurement.":[70],"this":[72],"work,":[73],"novel":[75],"tool":[76],"user-friendly":[79],"interface,":[80],"which":[81],"allows":[82],"robust":[84],"fully-automated":[86],"parameter":[87],"extraction":[88],"for":[89],"RTN,":[90],"BTI":[91],"HCI":[93],"experiments,":[94],"is":[95],"presented.":[96]},"cited_by_api_url":"https://api.openalex.org/works?filter=cites:W2967892747","counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":1},{"year":2020,"cited_by_count":1}],"updated_date":"2024-12-07T15:37:09.990119","created_date":"2019-08-22"}