乐胖代购免代理版

{"id":"https://openalex.org/W4231124649","doi":"https://doi.org/10.1109/sbcci.1998.715414","title":"Integrated CMOS linear dosimeters","display_name":"Integrated CMOS linear dosimeters","publication_year":2002,"publication_date":"2002-11-27","ids":{"openalex":"https://openalex.org/W4231124649","doi":"https://doi.org/10.1109/sbcci.1998.715414"},"language":"en","primary_location":{"is_oa":false,"landing_page_url":"https://doi.org/10.1109/sbcci.1998.715414","pdf_url":null,"source":null,"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false},"type":"article","type_crossref":"proceedings-article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5028878397","display_name":"O. Calvo","orcid":null},"institutions":[{"id":"https://openalex.org/I874386039","display_name":"Universidad Nacional de La Plata","ror":"https://ror.org/01tjs6929","country_code":"AR","type":"education","lineage":["https://openalex.org/I874386039"]}],"countries":["AR"],"is_corresponding":false,"raw_author_name":"O. Calvo","raw_affiliation_strings":["Facultad de Ingenieria, Universidad Nacional de La Plata, Argentina"],"affiliations":[{"raw_affiliation_string":"Facultad de Ingenieria, Universidad Nacional de La Plata, Argentina","institution_ids":["https://openalex.org/I874386039"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5048273283","display_name":"M. Gonzalez","orcid":"https://orcid.org/0009-0002-4258-9274"},"institutions":[{"id":"https://openalex.org/I874386039","display_name":"Universidad Nacional de La Plata","ror":"https://ror.org/01tjs6929","country_code":"AR","type":"education","lineage":["https://openalex.org/I874386039"]}],"countries":["AR"],"is_corresponding":false,"raw_author_name":"M. Gonzalez","raw_affiliation_strings":["Facultad de Ingenieria, Universidad Nacional de La Plata, Argentina"],"affiliations":[{"raw_affiliation_string":"Facultad de Ingenieria, Universidad Nacional de La Plata, Argentina","institution_ids":["https://openalex.org/I874386039"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5074751149","display_name":"C. Romero","orcid":null},"institutions":[{"id":"https://openalex.org/I874386039","display_name":"Universidad Nacional de La Plata","ror":"https://ror.org/01tjs6929","country_code":"AR","type":"education","lineage":["https://openalex.org/I874386039"]}],"countries":["AR"],"is_corresponding":false,"raw_author_name":"C. Romero","raw_affiliation_strings":["Facultad de Ingenieria, Universidad Nacional de La Plata, Argentina"],"affiliations":[{"raw_affiliation_string":"Facultad de Ingenieria, Universidad Nacional de La Plata, Argentina","institution_ids":["https://openalex.org/I874386039"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5011423456","display_name":"E. Garcia-Moreno","orcid":null},"institutions":[{"id":"https://openalex.org/I50441567","display_name":"Universitat de les Illes Balears","ror":"https://ror.org/03e10x626","country_code":"ES","type":"education","lineage":["https://openalex.org/I50441567"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"E. Garcia-Moreno","raw_affiliation_strings":["Department of Physics, University of Balearic Islands, Palma de Mallorca, Spain"],"affiliations":[{"raw_affiliation_string":"Department of Physics, University of Balearic Islands, Palma de Mallorca, Spain","institution_ids":["https://openalex.org/I50441567"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5007596960","display_name":"E. Isern","orcid":"https://orcid.org/0000-0001-9332-794X"},"institutions":[{"id":"https://openalex.org/I50441567","display_name":"Universitat de les Illes Balears","ror":"https://ror.org/03e10x626","country_code":"ES","type":"education","lineage":["https://openalex.org/I50441567"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"E. Isern","raw_affiliation_strings":["Department of Physics, University of Balearic Islands, Palma de Mallorca, Spain"],"affiliations":[{"raw_affiliation_string":"Department of Physics, University of Balearic Islands, Palma de Mallorca, Spain","institution_ids":["https://openalex.org/I50441567"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5011140420","display_name":"E. Roca","orcid":"https://orcid.org/0000-0001-6260-6495"},"institutions":[{"id":"https://openalex.org/I50441567","display_name":"Universitat de les Illes Balears","ror":"https://ror.org/03e10x626","country_code":"ES","type":"education","lineage":["https://openalex.org/I50441567"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"M. Roca","raw_affiliation_strings":["Department of Physics, University of Balearic Islands, Palma de Mallorca, Spain"],"affiliations":[{"raw_affiliation_string":"Department of Physics, University of Balearic Islands, Palma de Mallorca, Spain","institution_ids":["https://openalex.org/I50441567"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5077705720","display_name":"J. Segura","orcid":"https://orcid.org/0000-0001-9742-2936"},"institutions":[{"id":"https://openalex.org/I50441567","display_name":"Universitat de les Illes Balears","ror":"https://ror.org/03e10x626","country_code":"ES","type":"education","lineage":["https://openalex.org/I50441567"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"J. Segura","raw_affiliation_strings":["Department of Physics, University of Balearic Islands, Palma de Mallorca, Spain"],"affiliations":[{"raw_affiliation_string":"Department of Physics, University of Balearic Islands, Palma de Mallorca, Spain","institution_ids":["https://openalex.org/I50441567"]}]}],"institution_assertions":[],"countries_distinct_count":2,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.308,"has_fulltext":true,"fulltext_origin":"ngrams","cited_by_count":1,"citation_normalized_percentile":{"value":0.41805,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":57,"max":64},"biblio":{"volume":null,"issue":null,"first_page":"78","last_page":"81"},"is_retracted":false,"is_paratext":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9999,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9999,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9954,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9954,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/microprocessor","display_name":"Microprocessor","score":0.6421669},{"id":"https://openalex.org/keywords/interface","display_name":"Interface (matter)","score":0.48366675}],"concepts":[{"id":"https://openalex.org/C105636585","wikidata":"https://www.wikidata.org/wiki/Q303665","display_name":"Dosimeter","level":3,"score":0.8942603},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.815912},{"id":"https://openalex.org/C2780728072","wikidata":"https://www.wikidata.org/wiki/Q5297","display_name":"Microprocessor","level":2,"score":0.6421669},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.5960192},{"id":"https://openalex.org/C75088862","wikidata":"https://www.wikidata.org/wiki/Q2291081","display_name":"Dosimetry","level":2,"score":0.5679801},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.490958},{"id":"https://openalex.org/C18231593","wikidata":"https://www.wikidata.org/wiki/Q186161","display_name":"Ionizing radiation","level":3,"score":0.48640847},{"id":"https://openalex.org/C113843644","wikidata":"https://www.wikidata.org/wiki/Q901882","display_name":"Interface (matter)","level":4,"score":0.48366675},{"id":"https://openalex.org/C530198007","wikidata":"https://www.wikidata.org/wiki/Q80831","display_name":"Integrated circuit","level":2,"score":0.45130762},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4459772},{"id":"https://openalex.org/C153385146","wikidata":"https://www.wikidata.org/wiki/Q18335","display_name":"Radiation","level":2,"score":0.416856},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3464886},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.29097968},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.28142565},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.16907495},{"id":"https://openalex.org/C111337013","wikidata":"https://www.wikidata.org/wiki/Q2737837","display_name":"Irradiation","level":2,"score":0.096836686},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.09660837},{"id":"https://openalex.org/C71924100","wikidata":"https://www.wikidata.org/wiki/Q11190","display_name":"Medicine","level":0,"score":0.0},{"id":"https://openalex.org/C157915830","wikidata":"https://www.wikidata.org/wiki/Q2928001","display_name":"Bubble","level":2,"score":0.0},{"id":"https://openalex.org/C129307140","wikidata":"https://www.wikidata.org/wiki/Q6795880","display_name":"Maximum bubble pressure method","level":3,"score":0.0},{"id":"https://openalex.org/C173608175","wikidata":"https://www.wikidata.org/wiki/Q232661","display_name":"Parallel computing","level":1,"score":0.0},{"id":"https://openalex.org/C185544564","wikidata":"https://www.wikidata.org/wiki/Q81197","display_name":"Nuclear physics","level":1,"score":0.0},{"id":"https://openalex.org/C126838900","wikidata":"https://www.wikidata.org/wiki/Q77604","display_name":"Radiology","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"is_oa":false,"landing_page_url":"https://doi.org/10.1109/sbcci.1998.715414","pdf_url":null,"source":null,"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.44,"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy"}],"grants":[],"datasets":[],"versions":[],"referenced_works_count":7,"referenced_works":["https://openalex.org/W1540206583","https://openalex.org/W1892084460","https://openalex.org/W2044635538","https://openalex.org/W2099158499","https://openalex.org/W2145829709","https://openalex.org/W2175499805","https://openalex.org/W4247446711"],"related_works":["https://openalex.org/W4387917714","https://openalex.org/W4300464951","https://openalex.org/W4251755410","https://openalex.org/W3198857158","https://openalex.org/W3137156048","https://openalex.org/W298657778","https://openalex.org/W2908534251","https://openalex.org/W2320896204","https://openalex.org/W2000376702","https://openalex.org/W1979746066"],"abstract_inverted_index":{"This":[0],"paper":[1],"presents":[2],"a":[3,12],"review":[4],"of":[5],"radiation":[6,26],"sensors;":[7],"their":[8],"basic":[9],"principles":[10],"and":[11,31],"possible":[13],"use":[14],"as":[15],"built-in":[16],"sensors":[17],"in":[18],"integrated":[19,45],"circuits":[20,36],"exposed":[21],"to":[22],"ionizing":[23],"radiation.":[24],"Two":[25],"dosimeters":[27],"are":[28,34],"discussed:":[29],"threshold":[30],"linear.":[32],"All":[33],"CMOS":[35],"compatible":[37],"with":[38],"standard":[39],"technology":[40],"using":[41],"pMOSFET":[42],"sensors.":[43],"An":[44],"dosimetry":[46],"system":[47],"including":[48],"microprocessor":[49],"interface":[50],"for":[51],"remote":[52],"monitoring":[53],"is":[54],"described.":[55]},"cited_by_api_url":"https://api.openalex.org/works?filter=cites:W4231124649","counts_by_year":[],"updated_date":"2024-12-07T06:03:36.934067","created_date":"2022-05-11"}