乐胖代购免代理版

{"id":"https://openalex.org/W2138084992","doi":"https://doi.org/10.1109/qsic.2009.55","title":"Localizing Software Faults Simultaneously","display_name":"Localizing Software Faults Simultaneously","publication_year":2009,"publication_date":"2009-08-01","ids":{"openalex":"https://openalex.org/W2138084992","doi":"https://doi.org/10.1109/qsic.2009.55","mag":"2138084992"},"language":"en","primary_location":{"is_oa":false,"landing_page_url":"https://doi.org/10.1109/qsic.2009.55","pdf_url":null,"source":null,"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false},"type":"article","type_crossref":"proceedings-article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5030785658","display_name":"Rui Abreu","orcid":"https://orcid.org/0000-0003-3734-3157"},"institutions":[{"id":"https://openalex.org/I98358874","display_name":"Delft University of Technology","ror":"https://ror.org/02e2c7k09","country_code":"NL","type":"education","lineage":["https://openalex.org/I98358874"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"Rui Abreu","raw_affiliation_strings":["Embedded Software Lab., Delft Univ. of Technol., Delft, Netherlands"],"affiliations":[{"raw_affiliation_string":"Embedded Software Lab., Delft Univ. of Technol., Delft, Netherlands","institution_ids":["https://openalex.org/I98358874"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5001628304","display_name":"Peter Zoeteweij","orcid":null},"institutions":[{"id":"https://openalex.org/I98358874","display_name":"Delft University of Technology","ror":"https://ror.org/02e2c7k09","country_code":"NL","type":"education","lineage":["https://openalex.org/I98358874"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"Peter Zoeteweij","raw_affiliation_strings":["Embedded Software Lab., Delft Univ. of Technol., Delft, Netherlands"],"affiliations":[{"raw_affiliation_string":"Embedded Software Lab., Delft Univ. of Technol., Delft, Netherlands","institution_ids":["https://openalex.org/I98358874"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5084609766","display_name":"Arjan J. C. van Gemund","orcid":null},"institutions":[{"id":"https://openalex.org/I98358874","display_name":"Delft University of Technology","ror":"https://ror.org/02e2c7k09","country_code":"NL","type":"education","lineage":["https://openalex.org/I98358874"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"Arjan J. C. van Gemund","raw_affiliation_strings":["Embedded Software Lab., Delft Univ. of Technol., Delft, Netherlands"],"affiliations":[{"raw_affiliation_string":"Embedded Software Lab., Delft Univ. of Technol., Delft, Netherlands","institution_ids":["https://openalex.org/I98358874"]}]}],"institution_assertions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.985,"has_fulltext":true,"fulltext_origin":"ngrams","cited_by_count":22,"citation_normalized_percentile":{"value":0.903846,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":90},"biblio":{"volume":null,"issue":null,"first_page":null,"last_page":null},"is_retracted":false,"is_paratext":false,"primary_topic":{"id":"https://openalex.org/T10743","display_name":"Software Testing and Debugging Techniques","score":0.9997,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10743","display_name":"Software Testing and Debugging Techniques","score":0.9997,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10260","display_name":"Software Engineering Research","score":0.9995,"subfield":{"id":"https://openalex.org/subfields/1710","display_name":"Information Systems"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":0.9993,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/heuristics","display_name":"Heuristics","score":0.7381837},{"id":"https://openalex.org/keywords/siemens","display_name":"Siemens","score":0.5294014},{"id":"https://openalex.org/keywords/fault-model","display_name":"Fault model","score":0.428999},{"id":"https://openalex.org/keywords/software-fault-tolerance","display_name":"Software fault tolerance","score":0.41966677}],"concepts":[{"id":"https://openalex.org/C127705205","wikidata":"https://www.wikidata.org/wiki/Q5748245","display_name":"Heuristics","level":2,"score":0.7381837},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.675822},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.5966948},{"id":"https://openalex.org/C100053769","wikidata":"https://www.wikidata.org/wiki/Q169893","display_name":"Siemens","level":2,"score":0.5294014},{"id":"https://openalex.org/C177264268","wikidata":"https://www.wikidata.org/wiki/Q1514741","display_name":"Set (abstract data type)","level":2,"score":0.50724167},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.4531328},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.42914248},{"id":"https://openalex.org/C167391956","wikidata":"https://www.wikidata.org/wiki/Q1401211","display_name":"Fault model","level":3,"score":0.428999},{"id":"https://openalex.org/C50712370","wikidata":"https://www.wikidata.org/wiki/Q4269346","display_name":"Software fault tolerance","level":3,"score":0.41966677},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.40356272},{"id":"https://openalex.org/C80444323","wikidata":"https://www.wikidata.org/wiki/Q2878974","display_name":"Theoretical computer science","level":1,"score":0.3801145},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.23430875},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.13209173},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"is_oa":false,"landing_page_url":"https://doi.org/10.1109/qsic.2009.55","pdf_url":null,"source":null,"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false}],"best_oa_location":null,"sustainable_development_goals":[],"grants":[],"datasets":[],"versions":[],"referenced_works_count":21,"referenced_works":["https://openalex.org/W110016383","https://openalex.org/W1585935505","https://openalex.org/W1968847337","https://openalex.org/W1969981172","https://openalex.org/W2003116861","https://openalex.org/W2039786027","https://openalex.org/W2095743037","https://openalex.org/W2108309071","https://openalex.org/W2121081915","https://openalex.org/W2123659430","https://openalex.org/W2144386448","https://openalex.org/W2147811874","https://openalex.org/W2153418968","https://openalex.org/W2159949130","https://openalex.org/W2162045655","https://openalex.org/W2162661453","https://openalex.org/W2166007208","https://openalex.org/W2245429186","https://openalex.org/W4241947695","https://openalex.org/W4243127898","https://openalex.org/W72443325"],"related_works":["https://openalex.org/W4234532445","https://openalex.org/W4210447066","https://openalex.org/W2612099265","https://openalex.org/W2607474334","https://openalex.org/W2355966237","https://openalex.org/W2128501201","https://openalex.org/W2128104394","https://openalex.org/W2068422856","https://openalex.org/W2066922864","https://openalex.org/W1494657644"],"abstract_inverted_index":{"Current":[0],"automatic":[1],"diagnosis":[2],"techniques":[3],"are":[4],"predominantly":[5],"of":[6,27,48,53,106],"a":[7,34,104,111],"statistical":[8,96],"nature":[9],"and,":[10],"despite":[11],"typical":[12],"defect":[13],"densities,":[14],"do":[15],"not":[16],"explicitly":[17],"consider":[18],"multiple":[19],"faults,":[20],"as":[21,70,72],"also":[22],"demonstrated":[23],"by":[24],"the":[25,28,84],"popularity":[26],"single-fault":[29,123],"Siemens":[30,85],"set.":[31],"We":[32],"present":[33,110],"logic":[35],"reasoning":[36],"approach,":[37],"called":[38,115],"Zoltar-M(ultiple":[39],"fault),":[40,117],"that":[41,88,118],"yields":[42],"multiple-fault":[43,80,90],"diagnoses,":[44],"ranked":[45],"in":[46],"order":[47],"their":[49],"probability.":[50],"Although":[51],"application":[52],"Zoltar-M":[54],"to":[55,65,130],"programs":[56,91],"with":[57],"many":[58],"faults":[59],"requires":[60],"further":[61],"research":[62],"into":[63],"heuristics":[64],"reduce":[66],"computational":[67],"complexity,":[68],"theory":[69],"well":[71],"experiments":[73],"on":[74],"synthetic":[75],"program":[76,81],"models":[77],"and":[78],"two":[79],"versions":[82],"from":[83],"set":[86],"show":[87],"for":[89,122],"this":[92,107],"approach":[93],"can":[94],"outperform":[95],"techniques,":[97],"notably":[98],"spectrum-based":[99],"fault":[100],"localization":[101],"(SFL).":[102],"As":[103],"side-effect":[105],"research,":[108],"we":[109],"new":[112],"SFL":[113],"variant,":[114],"Zoltar-S(ingle":[116],"is":[119],"provably":[120],"optimal":[121],"programs,":[124],"outperforming":[125],"all":[126],"other":[127],"variants":[128],"known":[129],"date.":[131]},"cited_by_api_url":"https://api.openalex.org/works?filter=cites:W2138084992","counts_by_year":[{"year":2023,"cited_by_count":2},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":2},{"year":2020,"cited_by_count":3},{"year":2019,"cited_by_count":3},{"year":2018,"cited_by_count":2},{"year":2017,"cited_by_count":1},{"year":2016,"cited_by_count":3},{"year":2014,"cited_by_count":1},{"year":2012,"cited_by_count":1}],"updated_date":"2024-12-13T01:48:05.723777","created_date":"2016-06-24"}