{"id":"https://openalex.org/W1975670763","doi":"https://doi.org/10.1109/patmos.2013.6662168","title":"Reliability monitoring of digital circuits by in situ timing measurement","display_name":"Reliability monitoring of digital circuits by in situ timing measurement","publication_year":2013,"publication_date":"2013-09-01","ids":{"openalex":"https://openalex.org/W1975670763","doi":"https://doi.org/10.1109/patmos.2013.6662168","mag":"1975670763"},"language":"en","primary_location":{"is_oa":false,"landing_page_url":"https://doi.org/10.1109/patmos.2013.6662168","pdf_url":null,"source":null,"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false},"type":"article","type_crossref":"proceedings-article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5066733087","display_name":"Nasim Pour Aryan","orcid":null},"institutions":[],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Nasim Pour Aryan","raw_affiliation_strings":["Tech. Univ. Muenchen, Munich, Germany"],"affiliations":[{"raw_affiliation_string":"Tech. Univ. Muenchen, Munich, Germany","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5015790505","display_name":"Georg Georgakos","orcid":"https://orcid.org/0009-0006-4695-4637"},"institutions":[{"id":"https://openalex.org/I137594350","display_name":"Infineon Technologies (Germany)","ror":"https://ror.org/005kw6t15","country_code":"DE","type":"funder","lineage":["https://openalex.org/I137594350"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Georg Georgakos","raw_affiliation_strings":["Infineon Technol. AG, Neubiberg, Germany"],"affiliations":[{"raw_affiliation_string":"Infineon Technol. AG, Neubiberg, Germany","institution_ids":["https://openalex.org/I137594350"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5034576088","display_name":"D. Schmitt\u2010Landsiedel","orcid":"https://orcid.org/0000-0002-4817-5139"},"institutions":[],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Doris Schmitt-Landsiedel","raw_affiliation_strings":["Tech. Univ. Muenchen, Munich, Germany"],"affiliations":[{"raw_affiliation_string":"Tech. Univ. Muenchen, Munich, Germany","institution_ids":[]}]}],"institution_assertions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.988,"has_fulltext":true,"fulltext_origin":"ngrams","cited_by_count":5,"citation_normalized_percentile":{"value":0.637131,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":80,"max":81},"biblio":{"volume":null,"issue":null,"first_page":"150","last_page":"156"},"is_retracted":false,"is_paratext":false,"primary_topic":{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9998,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9996,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/robustness","display_name":"Robustness","score":0.7400593},{"id":"https://openalex.org/keywords/circuit-reliability","display_name":"Circuit reliability","score":0.49538553}],"concepts":[{"id":"https://openalex.org/C63479239","wikidata":"https://www.wikidata.org/wiki/Q7353546","display_name":"Robustness (evolution)","level":3,"score":0.7400593},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.7252834},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.72220397},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6831869},{"id":"https://openalex.org/C81843906","wikidata":"https://www.wikidata.org/wiki/Q173156","display_name":"Digital electronics","level":3,"score":0.5781026},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.5578152},{"id":"https://openalex.org/C2778309119","wikidata":"https://www.wikidata.org/wiki/Q5121614","display_name":"Circuit reliability","level":4,"score":0.49538553},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.47747254},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.37041354},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.3672138},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.2882452},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2317212},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.13824803},{"id":"https://openalex.org/C55493867","wikidata":"https://www.wikidata.org/wiki/Q7094","display_name":"Biochemistry","level":1,"score":0.0},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C104317684","wikidata":"https://www.wikidata.org/wiki/Q7187","display_name":"Gene","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"is_oa":false,"landing_page_url":"https://doi.org/10.1109/patmos.2013.6662168","pdf_url":null,"source":null,"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Industry, innovation and infrastructure","id":"https://metadata.un.org/sdg/9","score":0.4}],"grants":[],"datasets":[],"versions":[],"referenced_works_count":17,"referenced_works":["https://openalex.org/W1967198318","https://openalex.org/W1973014286","https://openalex.org/W2033949796","https://openalex.org/W2079706534","https://openalex.org/W2099766762","https://openalex.org/W2114859176","https://openalex.org/W2127039903","https://openalex.org/W2136500761","https://openalex.org/W2142908374","https://openalex.org/W2142982703","https://openalex.org/W2147381694","https://openalex.org/W2150107614","https://openalex.org/W2747015291","https://openalex.org/W2760007184","https://openalex.org/W3145030156","https://openalex.org/W4244606885","https://openalex.org/W57572067"],"related_works":["https://openalex.org/W95651076","https://openalex.org/W2991739378","https://openalex.org/W2796521923","https://openalex.org/W2770163697","https://openalex.org/W2389800961","https://openalex.org/W2110521006","https://openalex.org/W2081199158","https://openalex.org/W2040773997","https://openalex.org/W1995389502","https://openalex.org/W1975778413"],"abstract_inverted_index":{"Recent":[0],"technological":[1],"advances":[2],"in":[3,34,81],"semiconductor":[4],"industry":[5],"have":[6],"led":[7],"to":[8,123],"extreme":[9],"scaling":[10],"of":[11,36,50,53,62,75,96,105,118],"CMOS":[12],"devices.":[13],"In":[14,43],"such":[15],"advanced":[16],"technologies":[17],"fulfilling":[18],"application":[19,125],"specific":[20,126],"reliability":[21,41,51,127],"requirements":[22],"is":[23,29],"not":[24],"an":[25],"easy":[26],"task.":[27],"This":[28],"a":[30,82,110],"crucial":[31],"issue":[32],"particularly":[33],"case":[35],"safety-critical":[37],"applications":[38],"with":[39],"strict":[40],"requirements.":[42,128],"this":[44],"paper":[45],"we":[46,66,100],"propose":[47,67],"accurate":[48],"monitoring":[49,98,107,121],"status":[52],"digital":[54],"circuits":[55],"through":[56],"measuring":[57],"the":[58,63,70,76,88,92,97,102,106,116,119],"remaining":[59],"timing":[60],"slack":[61],"system.":[64],"Moreover,":[65],"and":[68,73,94],"evaluate":[69,101],"optimized":[71],"design":[72],"implementation":[74],"required":[77],"aging":[78],"resistant":[79],"circuitry":[80],"low":[83],"power":[84,103],"65nm":[85],"technology.":[86],"Besides":[87],"quantitative":[89],"evaluations":[90],"regarding":[91],"accuracy":[93],"robustness":[95],"circuitry,":[99],"efficiency":[104],"approach":[108],"for":[109],"test":[111],"circuit.":[112],"Our":[113],"studies":[114],"support":[115],"applicability":[117],"proposed":[120],"methodology":[122],"fulfill":[124]},"abstract_inverted_index_v3":null,"cited_by_api_url":"https://api.openalex.org/works?filter=cites:W1975670763","counts_by_year":[{"year":2021,"cited_by_count":1},{"year":2017,"cited_by_count":1},{"year":2015,"cited_by_count":1},{"year":2014,"cited_by_count":2}],"updated_date":"2025-04-16T17:15:05.669089","created_date":"2016-06-24"}