{"id":"https://openalex.org/W2142982703","doi":"https://doi.org/10.1109/olt.2002.1030195","title":"BIST-based delay-fault testing in FPGAs","display_name":"BIST-based delay-fault testing in FPGAs","publication_year":2003,"publication_date":"2003-06-25","ids":{"openalex":"https://openalex.org/W2142982703","doi":"https://doi.org/10.1109/olt.2002.1030195","mag":"2142982703"},"language":"en","primary_location":{"is_oa":false,"landing_page_url":"https://doi.org/10.1109/olt.2002.1030195","pdf_url":null,"source":null,"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false},"type":"article","type_crossref":"proceedings-article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"http://www.eng.auburn.edu/~strouce/class/bist/jetta03.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5091289669","display_name":"M. Abramovici","orcid":null},"institutions":[],"countries":["US"],"is_corresponding":false,"raw_author_name":"M. Abramovici","raw_affiliation_strings":["Circuits & Syst. Res. Lab., Agere Syst., Murray Hill, NJ, USA"],"affiliations":[{"raw_affiliation_string":"Circuits & Syst. Res. Lab., Agere Syst., Murray Hill, NJ, USA","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5033039433","display_name":"Charles E. Stroud","orcid":null},"institutions":[{"id":"https://openalex.org/I102149020","display_name":"University of North Carolina at Charlotte","ror":"https://ror.org/04dawnj30","country_code":"US","type":"funder","lineage":["https://openalex.org/I102149020"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"C. Stroud","raw_affiliation_strings":["Department of Electrical and Computer Engineering, University of North Carolina Charlotte, USA"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, University of North Carolina Charlotte, USA","institution_ids":["https://openalex.org/I102149020"]}]}],"institution_assertions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":7.028,"has_fulltext":true,"fulltext_origin":"ngrams","cited_by_count":45,"citation_normalized_percentile":{"value":0.971264,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":91,"max":92},"biblio":{"volume":null,"issue":null,"first_page":"131","last_page":"134"},"is_retracted":false,"is_paratext":false,"primary_topic":{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":0.999,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/built-in-self-test","display_name":"Built-in self-test","score":0.698552}],"concepts":[{"id":"https://openalex.org/C42935608","wikidata":"https://www.wikidata.org/wiki/Q190411","display_name":"Field-programmable gate array","level":2,"score":0.7939012},{"id":"https://openalex.org/C2780980493","wikidata":"https://www.wikidata.org/wiki/Q181142","display_name":"Built-in self-test","level":2,"score":0.698552},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.61893857},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.61045575},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.5700862},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.46862012},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.37160018},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.29885155},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.06702259},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.055163562},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"is_oa":false,"landing_page_url":"https://doi.org/10.1109/olt.2002.1030195","pdf_url":null,"source":null,"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false},{"is_oa":true,"landing_page_url":"http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.87.2106","pdf_url":"http://www.eng.auburn.edu/~strouce/class/bist/jetta03.pdf","source":{"id":"https://openalex.org/S4306400349","display_name":"CiteSeer X (The Pennsylvania State University)","issn_l":null,"issn":null,"is_oa":true,"is_in_doaj":false,"is_indexed_in_scopus":false,"is_core":false,"host_organization":"https://openalex.org/I130769515","host_organization_name":"Pennsylvania State University","host_organization_lineage":["https://openalex.org/I130769515"],"host_organization_lineage_names":["Pennsylvania State University"],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false}],"best_oa_location":{"is_oa":true,"landing_page_url":"http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.87.2106","pdf_url":"http://www.eng.auburn.edu/~strouce/class/bist/jetta03.pdf","source":{"id":"https://openalex.org/S4306400349","display_name":"CiteSeer X (The Pennsylvania State University)","issn_l":null,"issn":null,"is_oa":true,"is_in_doaj":false,"is_indexed_in_scopus":false,"is_core":false,"host_organization":"https://openalex.org/I130769515","host_organization_name":"Pennsylvania State University","host_organization_lineage":["https://openalex.org/I130769515"],"host_organization_lineage_names":["Pennsylvania State University"],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false},"sustainable_development_goals":[],"grants":[],"datasets":[],"versions":[],"referenced_works_count":20,"referenced_works":["https://openalex.org/W1481050397","https://openalex.org/W1881430677","https://openalex.org/W1914809015","https://openalex.org/W2011456762","https://openalex.org/W2028504835","https://openalex.org/W2043949919","https://openalex.org/W2084641700","https://openalex.org/W2099329957","https://openalex.org/W2101472024","https://openalex.org/W2101930816","https://openalex.org/W2108942153","https://openalex.org/W2125196703","https://openalex.org/W2136629399","https://openalex.org/W2150107614","https://openalex.org/W2152577665","https://openalex.org/W2153887537","https://openalex.org/W2157009629","https://openalex.org/W2157074294","https://openalex.org/W2162156047","https://openalex.org/W4251533442"],"related_works":["https://openalex.org/W776711554","https://openalex.org/W3147816099","https://openalex.org/W2989159162","https://openalex.org/W2534378985","https://openalex.org/W2153201966","https://openalex.org/W2139513292","https://openalex.org/W2122754719","https://openalex.org/W2005858638","https://openalex.org/W1982569681","https://openalex.org/W1874778078"],"abstract_inverted_index":{"We":[0,31],"present":[1],"the":[2,39],"first":[3],"delay-fault":[4],"testing":[5],"approach":[6,18,37],"for":[7,11,14],"FPGAs,":[8],"applicable":[9],"both":[10],"manufacturing":[12],"and":[13,25],"on-line":[15],"testing.":[16],"Our":[17],"is":[19,23],"based":[20],"on":[21,38],"BIST,":[22],"comprehensive,":[24],"does":[26],"not":[27],"require":[28],"expensive":[29],"ATE.":[30],"have":[32],"successfully":[33],"implemented":[34],"this":[35],"BIST":[36],"ORCA":[40],"2C":[41],"series":[42],"FPGA.":[43]},"abstract_inverted_index_v3":null,"cited_by_api_url":"https://api.openalex.org/works?filter=cites:W2142982703","counts_by_year":[{"year":2022,"cited_by_count":1},{"year":2018,"cited_by_count":1},{"year":2017,"cited_by_count":1},{"year":2016,"cited_by_count":1},{"year":2015,"cited_by_count":2},{"year":2014,"cited_by_count":2},{"year":2013,"cited_by_count":3},{"year":2012,"cited_by_count":1}],"updated_date":"2025-03-24T07:42:28.419569","created_date":"2016-06-24"}