乐胖代购免代理版

{"id":"https://openalex.org/W2120870550","doi":"https://doi.org/10.1109/mtdt.2005.19","title":"DFT Techniques for Memory Macro with Built-In ECC","display_name":"DFT Techniques for Memory Macro with Built-In ECC","publication_year":2005,"publication_date":"2005-09-09","ids":{"openalex":"https://openalex.org/W2120870550","doi":"https://doi.org/10.1109/mtdt.2005.19","mag":"2120870550"},"language":"en","primary_location":{"is_oa":false,"landing_page_url":"https://doi.org/10.1109/mtdt.2005.19","pdf_url":null,"source":null,"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false},"type":"article","type_crossref":"proceedings-article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5044735538","display_name":"K. Kushida","orcid":null},"institutions":[{"id":"https://openalex.org/I1292669757","display_name":"Toshiba (Japan)","ror":"https://ror.org/0326v3z14","country_code":"JP","type":"company","lineage":["https://openalex.org/I1292669757"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"K. Kushida","raw_affiliation_strings":["SoC R&D Center, Toshiba Corp., Kawasaki, Japan"],"affiliations":[{"raw_affiliation_string":"SoC R&D Center, Toshiba Corp., Kawasaki, Japan","institution_ids":["https://openalex.org/I1292669757"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5072371146","display_name":"N. Otsuka","orcid":null},"institutions":[{"id":"https://openalex.org/I1292669757","display_name":"Toshiba (Japan)","ror":"https://ror.org/0326v3z14","country_code":"JP","type":"company","lineage":["https://openalex.org/I1292669757"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"N. Otsuka","raw_affiliation_strings":["SoC R&D Center, Toshiba Corp., Kawasaki, Japan"],"affiliations":[{"raw_affiliation_string":"SoC R&D Center, Toshiba Corp., Kawasaki, Japan","institution_ids":["https://openalex.org/I1292669757"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5013755323","display_name":"Osamu Hirabayashi","orcid":null},"institutions":[{"id":"https://openalex.org/I1292669757","display_name":"Toshiba (Japan)","ror":"https://ror.org/0326v3z14","country_code":"JP","type":"company","lineage":["https://openalex.org/I1292669757"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"O. Hirabayashi","raw_affiliation_strings":["SoC R&D Center, Toshiba Corp., Kawasaki, Japan"],"affiliations":[{"raw_affiliation_string":"SoC R&D Center, Toshiba Corp., Kawasaki, Japan","institution_ids":["https://openalex.org/I1292669757"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5032269766","display_name":"Y. Takeyama","orcid":null},"institutions":[{"id":"https://openalex.org/I1292669757","display_name":"Toshiba (Japan)","ror":"https://ror.org/0326v3z14","country_code":"JP","type":"company","lineage":["https://openalex.org/I1292669757"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Y. Takeyama","raw_affiliation_strings":["SoC R&D Center, Toshiba Corp., Kawasaki, Japan"],"affiliations":[{"raw_affiliation_string":"SoC R&D Center, Toshiba Corp., Kawasaki, Japan","institution_ids":["https://openalex.org/I1292669757"]}]}],"institution_assertions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.199,"has_fulltext":true,"fulltext_origin":"ngrams","cited_by_count":5,"citation_normalized_percentile":{"value":0.584608,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":76,"max":77},"biblio":{"volume":"140","issue":null,"first_page":"109","last_page":"114"},"is_retracted":false,"is_paratext":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9999,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9999,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12495","display_name":"Electrostatic Discharge in Electronics","score":0.9998,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9996,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/macro","display_name":"Macro","score":0.7886849},{"id":"https://openalex.org/keywords/built-in-self-test","display_name":"Built-in self-test","score":0.5113234},{"id":"https://openalex.org/keywords/code","display_name":"Code (set theory)","score":0.45042667}],"concepts":[{"id":"https://openalex.org/C166955791","wikidata":"https://www.wikidata.org/wiki/Q629579","display_name":"Macro","level":2,"score":0.7886849},{"id":"https://openalex.org/C68043766","wikidata":"https://www.wikidata.org/wiki/Q267416","display_name":"Static random-access memory","level":2,"score":0.6842366},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6840703},{"id":"https://openalex.org/C2780980493","wikidata":"https://www.wikidata.org/wiki/Q181142","display_name":"Built-in self-test","level":2,"score":0.5113234},{"id":"https://openalex.org/C87907426","wikidata":"https://www.wikidata.org/wiki/Q6815755","display_name":"Memory refresh","level":4,"score":0.49278215},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.4870153},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.48369557},{"id":"https://openalex.org/C2776760102","wikidata":"https://www.wikidata.org/wiki/Q5139990","display_name":"Code (set theory)","level":3,"score":0.45042667},{"id":"https://openalex.org/C73150493","wikidata":"https://www.wikidata.org/wiki/Q853922","display_name":"Hamming code","level":4,"score":0.43651694},{"id":"https://openalex.org/C173608175","wikidata":"https://www.wikidata.org/wiki/Q232661","display_name":"Parallel computing","level":1,"score":0.43578312},{"id":"https://openalex.org/C125411270","wikidata":"https://www.wikidata.org/wiki/Q18653","display_name":"Encoding (memory)","level":2,"score":0.42675757},{"id":"https://openalex.org/C98986596","wikidata":"https://www.wikidata.org/wiki/Q1143031","display_name":"Semiconductor memory","level":2,"score":0.35763347},{"id":"https://openalex.org/C92855701","wikidata":"https://www.wikidata.org/wiki/Q5830907","display_name":"Computer memory","level":3,"score":0.22883219},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.19313103},{"id":"https://openalex.org/C57273362","wikidata":"https://www.wikidata.org/wiki/Q576722","display_name":"Decoding methods","level":2,"score":0.1454652},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.1206525},{"id":"https://openalex.org/C157125643","wikidata":"https://www.wikidata.org/wiki/Q884707","display_name":"Block code","level":3,"score":0.08537766},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.07093015},{"id":"https://openalex.org/C177264268","wikidata":"https://www.wikidata.org/wiki/Q1514741","display_name":"Set (abstract data type)","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"is_oa":false,"landing_page_url":"https://doi.org/10.1109/mtdt.2005.19","pdf_url":null,"source":null,"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false}],"best_oa_location":null,"sustainable_development_goals":[],"grants":[],"datasets":[],"versions":[],"referenced_works_count":5,"referenced_works":["https://openalex.org/W2097492452","https://openalex.org/W2147053934","https://openalex.org/W2163947478","https://openalex.org/W22219917","https://openalex.org/W2277412813"],"related_works":["https://openalex.org/W919907138","https://openalex.org/W4232117715","https://openalex.org/W3205888584","https://openalex.org/W3200702775","https://openalex.org/W2389480749","https://openalex.org/W2189053673","https://openalex.org/W2133555155","https://openalex.org/W2100773763","https://openalex.org/W2056436264","https://openalex.org/W2019238062"],"abstract_inverted_index":{"DFT":[0],"techniques":[1,43],"to":[2,18,26],"implement":[3],"ECC":[4,29,42],"circuitry":[5],"on":[6],"memory":[7,34],"macro":[8,50],"with":[9,32,56],"no":[10],"additional":[11],"test":[12,38],"cost":[13],"are":[14,44],"proposed.":[15],"New":[16],"methodology":[17],"design":[19],"a":[20,47],"Hamming":[21],"code":[22],"matrix":[23],"is":[24],"used":[25],"achieve":[27],"whole":[28],"system":[30],"testing":[31],"standard":[33],"BIST":[35],"and":[36,51],"conventional":[37],"sequence.":[39],"The":[40],"proposed":[41],"implemented":[45],"in":[46],"512Kb":[48],"SRAM":[49],"demonstrated":[52],"by":[53],"hardware":[54],"characterization":[55],"90nm":[57],"technology.":[58]},"cited_by_api_url":"https://api.openalex.org/works?filter=cites:W2120870550","counts_by_year":[{"year":2014,"cited_by_count":1},{"year":2013,"cited_by_count":1}],"updated_date":"2024-12-11T04:56:44.130566","created_date":"2016-06-24"}