{"id":"https://openalex.org/W4292793823","doi":"https://doi.org/10.1109/ms.2022.3176657","title":"Rust Library Fuzzing","display_name":"Rust Library Fuzzing","publication_year":2022,"publication_date":"2022-08-23","ids":{"openalex":"https://openalex.org/W4292793823","doi":"https://doi.org/10.1109/ms.2022.3176657"},"language":"en","primary_location":{"is_oa":false,"landing_page_url":"https://doi.org/10.1109/ms.2022.3176657","pdf_url":null,"source":{"id":"https://openalex.org/S6725529","display_name":"IEEE Software","issn_l":"0740-7459","issn":["0740-7459","1937-4194"],"is_oa":false,"is_in_doaj":false,"is_indexed_in_scopus":true,"is_core":true,"host_organization":"https://openalex.org/P4310320439","host_organization_name":"IEEE Computer Society","host_organization_lineage":["https://openalex.org/P4310320439","https://openalex.org/P4310319808"],"host_organization_lineage_names":["IEEE Computer Society","Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false},"type":"article","type_crossref":"journal-article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5014520888","display_name":"Hui Xu","orcid":"https://orcid.org/0000-0003-2465-8627"},"institutions":[{"id":"https://openalex.org/I24943067","display_name":"Fudan University","ror":"https://ror.org/013q1eq08","country_code":"CN","type":"funder","lineage":["https://openalex.org/I24943067"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Hui Xu","raw_affiliation_strings":["School of Computer Science, Fudan University, Shanghai, China"],"affiliations":[{"raw_affiliation_string":"School of Computer Science, Fudan University, Shanghai, China","institution_ids":["https://openalex.org/I24943067"]}]}],"institution_assertions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5014520888"],"corresponding_institution_ids":["https://openalex.org/I24943067"],"apc_list":null,"apc_paid":null,"fwci":0.565,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.623424,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":69,"max":75},"biblio":{"volume":"39","issue":"5","first_page":"105","last_page":"108"},"is_retracted":false,"is_paratext":false,"primary_topic":{"id":"https://openalex.org/T10743","display_name":"Software Testing and Debugging Techniques","score":0.9995,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10743","display_name":"Software Testing and Debugging Techniques","score":0.9995,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11241","display_name":"Advanced Malware Detection Techniques","score":0.9988,"subfield":{"id":"https://openalex.org/subfields/1711","display_name":"Signal Processing"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9986,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/rust","display_name":"Rust (programming language)","score":0.81513435},{"id":"https://openalex.org/keywords/fuzz-testing","display_name":"Fuzz testing","score":0.6903251}],"concepts":[{"id":"https://openalex.org/C197781089","wikidata":"https://www.wikidata.org/wiki/Q575650","display_name":"Rust (programming language)","level":2,"score":0.81513435},{"id":"https://openalex.org/C111065885","wikidata":"https://www.wikidata.org/wiki/Q1189053","display_name":"Fuzz testing","level":3,"score":0.6903251},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6902988},{"id":"https://openalex.org/C115903868","wikidata":"https://www.wikidata.org/wiki/Q80993","display_name":"Software engineering","level":1,"score":0.46709034},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.34624875},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.29259434}],"mesh":[],"locations_count":1,"locations":[{"is_oa":false,"landing_page_url":"https://doi.org/10.1109/ms.2022.3176657","pdf_url":null,"source":{"id":"https://openalex.org/S6725529","display_name":"IEEE Software","issn_l":"0740-7459","issn":["0740-7459","1937-4194"],"is_oa":false,"is_in_doaj":false,"is_indexed_in_scopus":true,"is_core":true,"host_organization":"https://openalex.org/P4310320439","host_organization_name":"IEEE Computer Society","host_organization_lineage":["https://openalex.org/P4310320439","https://openalex.org/P4310319808"],"host_organization_lineage_names":["IEEE Computer Society","Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false}],"best_oa_location":null,"sustainable_development_goals":[],"grants":[],"datasets":[],"versions":[],"referenced_works_count":8,"referenced_works":["https://openalex.org/W2779850521","https://openalex.org/W2963566160","https://openalex.org/W2995341674","https://openalex.org/W3048197573","https://openalex.org/W3107532136","https://openalex.org/W3159691394","https://openalex.org/W3202751128","https://openalex.org/W4283073038"],"related_works":["https://openalex.org/W4385301282","https://openalex.org/W4210660460","https://openalex.org/W3203597304","https://openalex.org/W3120811337","https://openalex.org/W3023977444","https://openalex.org/W2990186179","https://openalex.org/W2899084033","https://openalex.org/W2766647240","https://openalex.org/W2748952813","https://openalex.org/W2511770387"],"abstract_inverted_index":{"Rust":[0,38],"is":[1,39],"an":[2],"emerging":[3],"system":[4,46],"programming":[5],"language":[6],"with":[7],"attractive":[8],"features":[9],"in":[10],"both":[11],"memory":[12],"safety":[13],"and":[14],"efficiency.":[15],"The":[16],"language,":[17],"by":[18],"default,":[19],"distrusts":[20],"developers":[21,47],"and,":[22],"therefore,":[23],"does":[24],"not":[25,43],"allow":[26],"any":[27],"operations":[28],"that":[29],"may":[30],"cause":[31],"undefined":[32],"behaviors.":[33],"Due":[34],"to":[35],"such":[36],"advantages,":[37],"a":[40],"favorite":[41],"of":[42],"only":[44],"many":[45],"but":[48],"also":[49],"scientists":[50],"from":[51],"other":[52],"fields.1":[53]},"abstract_inverted_index_v3":null,"cited_by_api_url":"https://api.openalex.org/works?filter=cites:W4292793823","counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":1}],"updated_date":"2025-03-19T15:26:11.421346","created_date":"2022-08-23"}