乐胖代购免代理版

{"id":"https://openalex.org/W2047357356","doi":"https://doi.org/10.1109/mdt.1984.5005582","title":"Critical Path Tracing: An Alternative to Fault Simulation","display_name":"Critical Path Tracing: An Alternative to Fault Simulation","publication_year":1984,"publication_date":"1984-02-01","ids":{"openalex":"https://openalex.org/W2047357356","doi":"https://doi.org/10.1109/mdt.1984.5005582","mag":"2047357356"},"language":"en","primary_location":{"is_oa":false,"landing_page_url":"https://doi.org/10.1109/mdt.1984.5005582","pdf_url":null,"source":{"id":"https://openalex.org/S73404582","display_name":"IEEE Design & Test of Computers","issn_l":"0740-7475","issn":["0740-7475","1558-1918"],"is_oa":false,"is_in_doaj":false,"is_indexed_in_scopus":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false},"type":"article","type_crossref":"journal-article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5091289669","display_name":"M. Abramovici","orcid":null},"institutions":[{"id":"https://openalex.org/I72090969","display_name":"Nokia (United States)","ror":"https://ror.org/038km2573","country_code":"US","type":"company","lineage":["https://openalex.org/I2738502077","https://openalex.org/I72090969"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Miron Abramovici","raw_affiliation_strings":["AT&T Bell Labs.#TAB#"],"affiliations":[{"raw_affiliation_string":"AT&T Bell Labs.#TAB#","institution_ids":["https://openalex.org/I72090969"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5109191186","display_name":"P.R. Menon","orcid":null},"institutions":[{"id":"https://openalex.org/I72090969","display_name":"Nokia (United States)","ror":"https://ror.org/038km2573","country_code":"US","type":"company","lineage":["https://openalex.org/I2738502077","https://openalex.org/I72090969"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"P. R. Menon","raw_affiliation_strings":["AT&T Bell Labs.#TAB#"],"affiliations":[{"raw_affiliation_string":"AT&T Bell Labs.#TAB#","institution_ids":["https://openalex.org/I72090969"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5082554849","display_name":"David T. Miller","orcid":"https://orcid.org/0000-0003-1060-1945"},"institutions":[{"id":"https://openalex.org/I72090969","display_name":"Nokia (United States)","ror":"https://ror.org/038km2573","country_code":"US","type":"company","lineage":["https://openalex.org/I2738502077","https://openalex.org/I72090969"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"David T. Miller","raw_affiliation_strings":["AT&T Bell Labs.#TAB#"],"affiliations":[{"raw_affiliation_string":"AT&T Bell Labs.#TAB#","institution_ids":["https://openalex.org/I72090969"]}]}],"institution_assertions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":4.901,"has_fulltext":true,"fulltext_origin":"ngrams","cited_by_count":214,"citation_normalized_percentile":{"value":0.985438,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":98,"max":99},"biblio":{"volume":"1","issue":"1","first_page":"83","last_page":"93"},"is_retracted":false,"is_paratext":false,"primary_topic":{"id":"https://openalex.org/T12127","display_name":"Software System Performance and Reliability","score":0.9639,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12127","display_name":"Software System Performance and Reliability","score":0.9639,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10743","display_name":"Software Testing and Debugging Techniques","score":0.9085,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10260","display_name":"Software Engineering Research","score":0.9079,"subfield":{"id":"https://openalex.org/subfields/1710","display_name":"Information Systems"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/tracing","display_name":"Tracing","score":0.7110474},{"id":"https://openalex.org/keywords/path-tracing","display_name":"Path tracing","score":0.55749834},{"id":"https://openalex.org/keywords/critical-path-method","display_name":"Critical path method","score":0.48732695}],"concepts":[{"id":"https://openalex.org/C138673069","wikidata":"https://www.wikidata.org/wiki/Q322229","display_name":"Tracing","level":2,"score":0.7110474},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.61514926},{"id":"https://openalex.org/C110541219","wikidata":"https://www.wikidata.org/wiki/Q72948","display_name":"Path tracing","level":3,"score":0.55749834},{"id":"https://openalex.org/C115874739","wikidata":"https://www.wikidata.org/wiki/Q825377","display_name":"Critical path method","level":2,"score":0.48732695},{"id":"https://openalex.org/C2777735758","wikidata":"https://www.wikidata.org/wiki/Q817765","display_name":"Path (computing)","level":2,"score":0.43884766},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.35152674},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.23799944},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.21694991},{"id":"https://openalex.org/C201995342","wikidata":"https://www.wikidata.org/wiki/Q682496","display_name":"Systems engineering","level":1,"score":0.17010531},{"id":"https://openalex.org/C121684516","wikidata":"https://www.wikidata.org/wiki/Q7600677","display_name":"Computer graphics (images)","level":1,"score":0.14470291},{"id":"https://openalex.org/C205711294","wikidata":"https://www.wikidata.org/wiki/Q176953","display_name":"Rendering (computer graphics)","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"is_oa":false,"landing_page_url":"https://doi.org/10.1109/mdt.1984.5005582","pdf_url":null,"source":{"id":"https://openalex.org/S73404582","display_name":"IEEE Design & Test of Computers","issn_l":"0740-7475","issn":["0740-7475","1558-1918"],"is_oa":false,"is_in_doaj":false,"is_indexed_in_scopus":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.55,"id":"https://metadata.un.org/sdg/13","display_name":"Climate action"}],"grants":[],"datasets":[],"versions":[],"referenced_works_count":11,"referenced_works":["https://openalex.org/W1846482173","https://openalex.org/W1982245925","https://openalex.org/W2004437077","https://openalex.org/W2050497189","https://openalex.org/W2068889354","https://openalex.org/W2079866295","https://openalex.org/W2111334369","https://openalex.org/W2151980349","https://openalex.org/W2156398779","https://openalex.org/W4233221642","https://openalex.org/W4236231374"],"related_works":["https://openalex.org/W4252197513","https://openalex.org/W3041549326","https://openalex.org/W2365007040","https://openalex.org/W2356898439","https://openalex.org/W2124118389","https://openalex.org/W2123398485","https://openalex.org/W2045633099","https://openalex.org/W2000438891","https://openalex.org/W1970519101","https://openalex.org/W1910575119"],"abstract_inverted_index":{"Critical":[0],"path":[1],"tracing":[2],"determines":[3],"fault":[4,8],"detection":[5],"without":[6],"explicit.":[7],"simulation.":[9],"It":[10],"appears":[11],"to":[12,18],"be":[13],"a":[14],"more":[15],"efficient":[16],"alternative":[17],"conventional":[19],"methods.":[20]},"abstract_inverted_index_v3":null,"cited_by_api_url":"https://api.openalex.org/works?filter=cites:W2047357356","counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":1},{"year":2020,"cited_by_count":4},{"year":2019,"cited_by_count":1},{"year":2018,"cited_by_count":4},{"year":2016,"cited_by_count":1},{"year":2015,"cited_by_count":1},{"year":2014,"cited_by_count":1},{"year":2013,"cited_by_count":1},{"year":2012,"cited_by_count":6}],"updated_date":"2025-03-19T23:28:04.860217","created_date":"2016-06-24"}