乐胖代购免代理版

{"id":"https://openalex.org/W3037730335","doi":"https://doi.org/10.1109/mdat.2020.3000447","title":"From the EIC: Special Issue on Image Processing, Correspondsing Hardware Architectures, and EDA Tools","display_name":"From the EIC: Special Issue on Image Processing, Correspondsing Hardware Architectures, and EDA Tools","publication_year":2020,"publication_date":"2020-06-01","ids":{"openalex":"https://openalex.org/W3037730335","doi":"https://doi.org/10.1109/mdat.2020.3000447","mag":"3037730335"},"language":"en","primary_location":{"is_oa":true,"landing_page_url":"https://doi.org/10.1109/mdat.2020.3000447","pdf_url":"https://ieeexplore.ieee.org/ielx7/6221038/9123747/09123814.pdf","source":{"id":"https://openalex.org/S4210176427","display_name":"IEEE Design and Test","issn_l":"2168-2356","issn":["2168-2356","2168-2364"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true},"type":"article","type_crossref":"journal-article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"bronze","oa_url":"https://ieeexplore.ieee.org/ielx7/6221038/9123747/09123814.pdf","any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5063508488","display_name":"J\u00f6rg Henkel","orcid":"https://orcid.org/0000-0001-9602-2922"},"institutions":[],"countries":[],"is_corresponding":true,"raw_author_name":"Jorg Henkel","raw_affiliation_strings":[],"affiliations":[]}],"institution_assertions":[],"countries_distinct_count":0,"institutions_distinct_count":0,"corresponding_author_ids":["https://openalex.org/A5063508488"],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.0,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":0,"max":61},"biblio":{"volume":"37","issue":"3","first_page":"4","last_page":"4"},"is_retracted":false,"is_paratext":false,"primary_topic":{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":0.9189,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":0.9189,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/float","display_name":"Float (project management)","score":0.68103254},{"id":"https://openalex.org/keywords/portrait","display_name":"Portrait","score":0.5333058},{"id":"https://openalex.org/keywords/high-speed-imaging","display_name":"High-Speed Imaging","score":0.510009}],"concepts":[{"id":"https://openalex.org/C2780337265","wikidata":"https://www.wikidata.org/wiki/Q185958","display_name":"Float (project management)","level":2,"score":0.68103254},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.546169},{"id":"https://openalex.org/C162462552","wikidata":"https://www.wikidata.org/wiki/Q134307","display_name":"Portrait","level":2,"score":0.5333058},{"id":"https://openalex.org/C16345878","wikidata":"https://www.wikidata.org/wiki/Q107472979","display_name":"Orientation (vector space)","level":2,"score":0.5230397},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.33040434},{"id":"https://openalex.org/C142362112","wikidata":"https://www.wikidata.org/wiki/Q735","display_name":"Art","level":0,"score":0.18032405},{"id":"https://openalex.org/C52119013","wikidata":"https://www.wikidata.org/wiki/Q50637","display_name":"Art history","level":1,"score":0.16874793},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.13524175},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.124768555},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C199104240","wikidata":"https://www.wikidata.org/wiki/Q118291","display_name":"Marine engineering","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"is_oa":true,"landing_page_url":"https://doi.org/10.1109/mdat.2020.3000447","pdf_url":"https://ieeexplore.ieee.org/ielx7/6221038/9123747/09123814.pdf","source":{"id":"https://openalex.org/S4210176427","display_name":"IEEE Design and Test","issn_l":"2168-2356","issn":["2168-2356","2168-2364"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true}],"best_oa_location":{"is_oa":true,"landing_page_url":"https://doi.org/10.1109/mdat.2020.3000447","pdf_url":"https://ieeexplore.ieee.org/ielx7/6221038/9123747/09123814.pdf","source":{"id":"https://openalex.org/S4210176427","display_name":"IEEE Design and Test","issn_l":"2168-2356","issn":["2168-2356","2168-2364"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true},"sustainable_development_goals":[],"grants":[],"datasets":[],"versions":[],"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W594086971","https://openalex.org/W4383739071","https://openalex.org/W3169920643","https://openalex.org/W2899084033","https://openalex.org/W2748952813","https://openalex.org/W27177127","https://openalex.org/W2360001249","https://openalex.org/W2358709380","https://openalex.org/W2315550989","https://openalex.org/W2141684174"],"abstract_inverted_index":{"":[4],"":[8],"":[9],"A":[12],"highlight":[13],"of":[14],"this":[15],"IEEE":[16],"Design&Test":[19],"issue":[20,66],"is":[21],"on":[22,35],"image":[23],"processing,":[24],"corresponding":[25],"hardware":[26],"architectures,":[27],"and":[28,38,48],"EDA":[29],"tools":[30],"from":[31],"the":[32,73],"2018":[33],"Symposium":[34],"Integrated":[36],"Circuits":[37],"Systems":[39],"Design":[40],"(SBCCI":[41],"2018).":[42],"The":[43,63],"guest":[44],"editors":[45],"Michael":[46],"H\u00fcbner":[47],"Jose":[49],"Luis":[50],"Guntzel":[51],"have":[52],"selected":[53],"six":[54],"significantly":[55],"extended":[56],"manuscripts":[57],"for":[58],"a":[59,69],"careful":[60],"review":[61],"process.":[62],"presented":[64],"special":[65],"(SI)":[67],"gives":[68],"good":[70],"insight":[71],"into":[72],"excellent":[74],"research":[75],"conduct":[76],"in":[77],"Latin":[78],"America.":[79]},"cited_by_api_url":"https://api.openalex.org/works?filter=cites:W3037730335","counts_by_year":[],"updated_date":"2024-12-04T23:13:23.027654","created_date":"2020-07-02"}