{"id":"https://openalex.org/W3017364791","doi":"https://doi.org/10.1109/lascas45839.2020.9068956","title":"The Research Methodology of Dependence Mode at Parameters Dispersion of a Differential Pair on Integral JFETs in a Radiation-Hardened Structured Array MH2XA010","display_name":"The Research Methodology of Dependence Mode at Parameters Dispersion of a Differential Pair on Integral JFETs in a Radiation-Hardened Structured Array MH2XA010","publication_year":2020,"publication_date":"2020-02-01","ids":{"openalex":"https://openalex.org/W3017364791","doi":"https://doi.org/10.1109/lascas45839.2020.9068956","mag":"3017364791"},"language":"en","primary_location":{"is_oa":false,"landing_page_url":"https://doi.org/10.1109/lascas45839.2020.9068956","pdf_url":null,"source":null,"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false},"type":"article","type_crossref":"proceedings-article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5102756013","display_name":"Oleg V. Dvornikov","orcid":null},"institutions":[],"countries":["BY"],"is_corresponding":false,"raw_author_name":"Oleg V. Dvornikov","raw_affiliation_strings":["Plc., Minsk Research Instrument-Making Institute (MNIPI), Minsk, Belarus"],"affiliations":[{"raw_affiliation_string":"Plc., Minsk Research Instrument-Making Institute (MNIPI), Minsk, Belarus","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5055756428","display_name":"V. \u0410. Tchekhovski","orcid":null},"institutions":[{"id":"https://openalex.org/I291386647","display_name":"Belarusian State University","ror":"https://ror.org/021036w13","country_code":"BY","type":"funder","lineage":["https://openalex.org/I291386647"]}],"countries":["BY"],"is_corresponding":false,"raw_author_name":"Vladimir A. Tchekhovski","raw_affiliation_strings":["Institute for Nuclear Problems of Belarusian State University, Minsk, Belarus"],"affiliations":[{"raw_affiliation_string":"Institute for Nuclear Problems of Belarusian State University, Minsk, Belarus","institution_ids":["https://openalex.org/I291386647"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5007569031","display_name":"Yaroslav D. Galkin","orcid":null},"institutions":[{"id":"https://openalex.org/I291386647","display_name":"Belarusian State University","ror":"https://ror.org/021036w13","country_code":"BY","type":"funder","lineage":["https://openalex.org/I291386647"]}],"countries":["BY"],"is_corresponding":false,"raw_author_name":"Yaroslav D. Galkin","raw_affiliation_strings":["Institute for Nuclear Problems of Belarusian State University, Minsk, Belarus"],"affiliations":[{"raw_affiliation_string":"Institute for Nuclear Problems of Belarusian State University, Minsk, Belarus","institution_ids":["https://openalex.org/I291386647"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5086232572","display_name":"Nikolay N. Prokopenko","orcid":"https://orcid.org/0000-0001-8291-1753"},"institutions":[{"id":"https://openalex.org/I4210097717","display_name":"Don State Technical University","ror":"https://ror.org/00x5je630","country_code":"RU","type":"education","lineage":["https://openalex.org/I4210097717"]}],"countries":["RU"],"is_corresponding":false,"raw_author_name":"Nikolay N. Prokopenko","raw_affiliation_strings":["Don State Technical University, Rostov-on-Don, RR"],"affiliations":[{"raw_affiliation_string":"Don State Technical University, Rostov-on-Don, RR","institution_ids":["https://openalex.org/I4210097717"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5049721663","display_name":"Anna V. Bugakova","orcid":"https://orcid.org/0000-0001-9255-0015"},"institutions":[{"id":"https://openalex.org/I4210097717","display_name":"Don State Technical University","ror":"https://ror.org/00x5je630","country_code":"RU","type":"education","lineage":["https://openalex.org/I4210097717"]}],"countries":["RU"],"is_corresponding":false,"raw_author_name":"Anna Bugakova","raw_affiliation_strings":["Don State Technical University, Rostov-on-Don, RR, Russia"],"affiliations":[{"raw_affiliation_string":"Don State Technical University, Rostov-on-Don, RR, Russia","institution_ids":["https://openalex.org/I4210097717"]}]}],"institution_assertions":[],"countries_distinct_count":2,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":1.043,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.662474,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":60,"max":69},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"4"},"is_retracted":false,"is_paratext":false,"primary_topic":{"id":"https://openalex.org/T11044","display_name":"Particle Detector Development and Performance","score":0.9989,"subfield":{"id":"https://openalex.org/subfields/3106","display_name":"Nuclear and High Energy Physics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11044","display_name":"Particle Detector Development and Performance","score":0.9989,"subfield":{"id":"https://openalex.org/subfields/3106","display_name":"Nuclear and High Energy Physics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9985,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9939,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/jfet","display_name":"JFET","score":0.98322916},{"id":"https://openalex.org/keywords/mode","display_name":"Mode (computer interface)","score":0.49665815}],"concepts":[{"id":"https://openalex.org/C2778484494","wikidata":"https://www.wikidata.org/wiki/Q385520","display_name":"JFET","level":5,"score":0.98322916},{"id":"https://openalex.org/C93226319","wikidata":"https://www.wikidata.org/wiki/Q193137","display_name":"Differential (mechanical device)","level":2,"score":0.64012545},{"id":"https://openalex.org/C145366948","wikidata":"https://www.wikidata.org/wiki/Q178947","display_name":"Operational amplifier","level":4,"score":0.5919554},{"id":"https://openalex.org/C11722477","wikidata":"https://www.wikidata.org/wiki/Q1056298","display_name":"Differential amplifier","level":4,"score":0.58509886},{"id":"https://openalex.org/C48677424","wikidata":"https://www.wikidata.org/wiki/Q6888088","display_name":"Mode (computer interface)","level":2,"score":0.49665815},{"id":"https://openalex.org/C177562468","wikidata":"https://www.wikidata.org/wiki/Q182893","display_name":"Dispersion (optics)","level":2,"score":0.46711004},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4457404},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.43838555},{"id":"https://openalex.org/C194257627","wikidata":"https://www.wikidata.org/wiki/Q211554","display_name":"Amplifier","level":3,"score":0.4181592},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.37704998},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.37605953},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3245088},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.2361534},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.16685694},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.15426907},{"id":"https://openalex.org/C145598152","wikidata":"https://www.wikidata.org/wiki/Q176097","display_name":"Field-effect transistor","level":4,"score":0.10047302},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.090218365},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"is_oa":false,"landing_page_url":"https://doi.org/10.1109/lascas45839.2020.9068956","pdf_url":null,"source":null,"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","score":0.52,"display_name":"Affordable and clean energy"}],"grants":[],"datasets":[],"versions":[],"referenced_works_count":7,"referenced_works":["https://openalex.org/W2032531531","https://openalex.org/W2128990700","https://openalex.org/W2581309805","https://openalex.org/W2766517776","https://openalex.org/W2799205854","https://openalex.org/W2805726058","https://openalex.org/W2899719419"],"related_works":["https://openalex.org/W90381762","https://openalex.org/W4200140230","https://openalex.org/W3046374476","https://openalex.org/W3017364791","https://openalex.org/W2899719419","https://openalex.org/W2165132866","https://openalex.org/W2001852872","https://openalex.org/W1610556722","https://openalex.org/W1550906089","https://openalex.org/W1504378132"],"abstract_inverted_index":{"We":[0,33],"suggest":[1],"a":[2],"method":[3],"to":[4,37,64],"define":[5,34,61],"dispersion":[6],"for":[7,41,68],"transfer":[8],"voltage-ampere":[9],"characteristics":[10],"(VAC)":[11],"of":[12,24],"JFET":[13,47,74],"differential":[14,48,75],"pairs,":[15],"which":[16],"is":[17],"tested":[18],"within":[19],"circuit":[20],"simulation":[21],"and":[22],"measurements":[23,53],"p-JFET":[25],"parameters,":[26],"manufactured":[27],"in":[28],"JSC":[29],"\"Integral\"":[30],"(Belarus":[31],"Republic).":[32],"recommendations,":[35,62],"how":[36,63],"select":[38,65],"operational":[39,42,66,78],"mode":[40,67],"amplifier":[43],"(OA)":[44],"input":[45,72],"stages":[46,73],"pair":[49],"based":[50],"on":[51,56],"the":[52],"made.":[54],"Based":[55],"experimental":[57],"studies,":[58],"we":[59],"have":[60],"analog":[69],"sensor":[70],"interfaces":[71],"pair,":[76],"including":[77],"amplifiers":[79],"(OAs).":[80]},"abstract_inverted_index_v3":null,"cited_by_api_url":"https://api.openalex.org/works?filter=cites:W3017364791","counts_by_year":[{"year":2020,"cited_by_count":1}],"updated_date":"2025-04-15T15:54:22.090890","created_date":"2020-04-24"}