{"id":"https://openalex.org/W3040693573","doi":"https://doi.org/10.1109/isqed48828.2020.9136968","title":"Diagnostic Circuit for Latent Fault Detection in SRAM Row Decoder","display_name":"Diagnostic Circuit for Latent Fault Detection in SRAM Row Decoder","publication_year":2020,"publication_date":"2020-03-01","ids":{"openalex":"https://openalex.org/W3040693573","doi":"https://doi.org/10.1109/isqed48828.2020.9136968","mag":"3040693573"},"language":"en","primary_location":{"is_oa":false,"landing_page_url":"https://doi.org/10.1109/isqed48828.2020.9136968","pdf_url":null,"source":null,"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false},"type":"article","type_crossref":"proceedings-article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5103934785","display_name":"Shivendra Singh","orcid":null},"institutions":[{"id":"https://openalex.org/I119939252","display_name":"Indraprastha Institute of Information Technology Delhi","ror":"https://ror.org/03vfp4g33","country_code":"IN","type":"funder","lineage":["https://openalex.org/I119939252"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Shivendra Singh","raw_affiliation_strings":["Indraprastha Institute of Information Technology, Delhi, India"],"affiliations":[{"raw_affiliation_string":"Indraprastha Institute of Information Technology, Delhi, India","institution_ids":["https://openalex.org/I119939252"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5078691800","display_name":"Varshita Gupta","orcid":null},"institutions":[{"id":"https://openalex.org/I119939252","display_name":"Indraprastha Institute of Information Technology Delhi","ror":"https://ror.org/03vfp4g33","country_code":"IN","type":"funder","lineage":["https://openalex.org/I119939252"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Varshita Gupta","raw_affiliation_strings":["Indraprastha Institute of Information Technology, Delhi, India"],"affiliations":[{"raw_affiliation_string":"Indraprastha Institute of Information Technology, Delhi, India","institution_ids":["https://openalex.org/I119939252"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5063583051","display_name":"Anuj Grover","orcid":"https://orcid.org/0000-0002-6057-4984"},"institutions":[{"id":"https://openalex.org/I119939252","display_name":"Indraprastha Institute of Information Technology Delhi","ror":"https://ror.org/03vfp4g33","country_code":"IN","type":"funder","lineage":["https://openalex.org/I119939252"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Anuj Grover","raw_affiliation_strings":["Indraprastha Institute of Information Technology, Delhi, India"],"affiliations":[{"raw_affiliation_string":"Indraprastha Institute of Information Technology, Delhi, India","institution_ids":["https://openalex.org/I119939252"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5015090481","display_name":"Kedar Janardhan Dhori","orcid":null},"institutions":[{"id":"https://openalex.org/I4210094169","display_name":"STMicroelectronics (India)","ror":"https://ror.org/00ft7bw25","country_code":"IN","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210094169"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Kedar Janardhan Dhori","raw_affiliation_strings":["STMicroelectronics Pvt. Ltd., Greater Noida, India"],"affiliations":[{"raw_affiliation_string":"STMicroelectronics Pvt. Ltd., Greater Noida, India","institution_ids":["https://openalex.org/I4210094169"]}]}],"institution_assertions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.885,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.278843,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":73,"max":76},"biblio":{"volume":null,"issue":null,"first_page":"395","last_page":"400"},"is_retracted":false,"is_paratext":false,"primary_topic":{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9999,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9992,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/electromigration","display_name":"Electromigration","score":0.69801915},{"id":"https://openalex.org/keywords/resistive-touchscreen","display_name":"Resistive touchscreen","score":0.64497733},{"id":"https://openalex.org/keywords/spark","display_name":"SPARK (programming language)","score":0.41203356}],"concepts":[{"id":"https://openalex.org/C138055206","wikidata":"https://www.wikidata.org/wiki/Q1319010","display_name":"Electromigration","level":2,"score":0.69801915},{"id":"https://openalex.org/C6899612","wikidata":"https://www.wikidata.org/wiki/Q852911","display_name":"Resistive touchscreen","level":2,"score":0.64497733},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.6161866},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.54139036},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.4956838},{"id":"https://openalex.org/C526921623","wikidata":"https://www.wikidata.org/wiki/Q190117","display_name":"Automotive industry","level":2,"score":0.4664848},{"id":"https://openalex.org/C62611344","wikidata":"https://www.wikidata.org/wiki/Q1062658","display_name":"Node (physics)","level":2,"score":0.46582907},{"id":"https://openalex.org/C530198007","wikidata":"https://www.wikidata.org/wiki/Q80831","display_name":"Integrated circuit","level":2,"score":0.42058682},{"id":"https://openalex.org/C2781215313","wikidata":"https://www.wikidata.org/wiki/Q3493345","display_name":"SPARK (programming language)","level":2,"score":0.41203356},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.41147712},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.39276686},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.3861509},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.24067438},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.23174715},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.12896651},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.09860045},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.09853554},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C66938386","wikidata":"https://www.wikidata.org/wiki/Q633538","display_name":"Structural engineering","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C146978453","wikidata":"https://www.wikidata.org/wiki/Q3798668","display_name":"Aerospace engineering","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"is_oa":false,"landing_page_url":"https://doi.org/10.1109/isqed48828.2020.9136968","pdf_url":null,"source":null,"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.44,"id":"https://metadata.un.org/sdg/9","display_name":"Industry, innovation and infrastructure"}],"grants":[],"datasets":[],"versions":[],"referenced_works_count":23,"referenced_works":["https://openalex.org/W1491818089","https://openalex.org/W1604482631","https://openalex.org/W1989194228","https://openalex.org/W1991891926","https://openalex.org/W2046796401","https://openalex.org/W2072795874","https://openalex.org/W2095196047","https://openalex.org/W2097579272","https://openalex.org/W2113115586","https://openalex.org/W2117812595","https://openalex.org/W2134060760","https://openalex.org/W2135610295","https://openalex.org/W2165487727","https://openalex.org/W2165594756","https://openalex.org/W2244520685","https://openalex.org/W2294838498","https://openalex.org/W2297431808","https://openalex.org/W2519530743","https://openalex.org/W2522697351","https://openalex.org/W2613010563","https://openalex.org/W2775025528","https://openalex.org/W2800005582","https://openalex.org/W4237785350"],"related_works":["https://openalex.org/W4229007131","https://openalex.org/W2542708587","https://openalex.org/W2318525917","https://openalex.org/W2169154812","https://openalex.org/W2138118262","https://openalex.org/W2108703634","https://openalex.org/W2086910809","https://openalex.org/W2055638565","https://openalex.org/W2004615523","https://openalex.org/W1984394007"],"abstract_inverted_index":{"Functional":[0,23],"safety":[1,31],"is":[2,15,26,159],"crucial":[3],"in":[4,176],"automotive":[5,28],"life-critical":[6],"systems.":[7],"Early":[8],"diagnosis":[9],"of":[10,42,89,104,124,127],"unanticipated":[11],"faults":[12],"and":[13,40,48,51,60,72,86,93,129,143,157],"failures":[14,74],"necessary":[16],"to":[17,116,120,161],"prevent":[18],"hazardous":[19],"implications.":[20],"ISO":[21],"26262,":[22],"Safety-Road":[24],"Vehicles,":[25],"an":[27,108],"industry-specific":[29],"functional":[30,177],"standard":[32],"that":[33],"describes":[34],"the":[35,76,84,121,136,144],"course":[36],"for":[37],"classification,":[38],"detection":[39],"control":[41],"potential":[43],"risks.":[44],"Electromigration":[45],"induced":[46],"open":[47],"short":[49],"defects":[50,92,106,165],"Bias":[52],"Temperature":[53],"Instability":[54],"(BTI)":[55],"are":[56],"critical":[57],"failure":[58],"mechanisms":[59],"pose":[61],"severe":[62],"reliability":[63],"concerns":[64],"as":[65,166,168],"they":[66,173],"may":[67],"escape":[68],"tests":[69],"at":[70,98],"fabrication":[71],"cause":[73],"when":[75],"chip":[77],"eventually":[78],"wears":[79],"out.":[80],"This":[81],"paper":[82],"analyzes":[83],"independent":[85],"combined":[87,122],"impact":[88,123],"partial":[90],"resistive":[91,105,134,164],"BTI":[94],"on":[95],"row":[96],"decoders":[97],"55nm":[99],"technology":[100],"node.":[101],"The":[102],"presence":[103],"causes":[107],"additional":[109],"delay":[110,138,146],"which":[111],"gets":[112],"further":[113],"increased":[114],"due":[115],"aging":[117,128],"(BTI).":[118],"Due":[119],"10":[125],"years":[126],"a":[130],"$25\\mathrm{K}\\Omega$":[133],"defect,":[135],"activation":[137],"increases":[139,147],"by":[140,148],"about":[141,149],"16.15%":[142],"deactivation":[145],"22.14%.":[150],"A":[151],"novel":[152],"technology-agnostic":[153],"diagnostic":[154],"test":[155],"circuit":[156],"method":[158],"proposed":[160],"detect":[162],"small":[163],"low":[167],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">$5\\mathrm{K}\\Omega$":[171],"before":[172],"can":[174],"result":[175],"failure.":[178]},"abstract_inverted_index_v3":null,"cited_by_api_url":"https://api.openalex.org/works?filter=cites:W3040693573","counts_by_year":[{"year":2021,"cited_by_count":3}],"updated_date":"2025-04-17T10:16:09.753952","created_date":"2020-07-16"}