{"id":"https://openalex.org/W2121367655","doi":"https://doi.org/10.1109/isqed.2007.21","title":"A New Simulation Method for NBTI Analysis in SPICE Environment","display_name":"A New Simulation Method for NBTI Analysis in SPICE Environment","publication_year":2007,"publication_date":"2007-03-01","ids":{"openalex":"https://openalex.org/W2121367655","doi":"https://doi.org/10.1109/isqed.2007.21","mag":"2121367655"},"language":"en","primary_location":{"is_oa":false,"landing_page_url":"https://doi.org/10.1109/isqed.2007.21","pdf_url":null,"source":null,"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false},"type":"article","type_crossref":"proceedings-article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5040255957","display_name":"Rakesh Vattikonda","orcid":null},"institutions":[{"id":"https://openalex.org/I55732556","display_name":"Arizona State University","ror":"https://ror.org/03efmqc40","country_code":"US","type":"education","lineage":["https://openalex.org/I55732556"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Rakesh Vattikonda","raw_affiliation_strings":["[Dept. of Electr. Eng., Arizona State Univ., Tempe, AZ]"],"affiliations":[{"raw_affiliation_string":"[Dept. of Electr. Eng., Arizona State Univ., Tempe, AZ]","institution_ids":["https://openalex.org/I55732556"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100888927","display_name":"Yan-Sheng Luo","orcid":null},"institutions":[{"id":"https://openalex.org/I55732556","display_name":"Arizona State University","ror":"https://ror.org/03efmqc40","country_code":"US","type":"education","lineage":["https://openalex.org/I55732556"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Yansheng Luo","raw_affiliation_strings":["[Dept. of Electr. Eng., Arizona State Univ., Tempe, AZ]"],"affiliations":[{"raw_affiliation_string":"[Dept. of Electr. Eng., Arizona State Univ., Tempe, AZ]","institution_ids":["https://openalex.org/I55732556"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5020561547","display_name":"Alex Gyure","orcid":null},"institutions":[{"id":"https://openalex.org/I55732556","display_name":"Arizona State University","ror":"https://ror.org/03efmqc40","country_code":"US","type":"education","lineage":["https://openalex.org/I55732556"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Alex Gyure","raw_affiliation_strings":["[Dept. of Electr. Eng., Arizona State Univ., Tempe, AZ]"],"affiliations":[{"raw_affiliation_string":"[Dept. of Electr. Eng., Arizona State Univ., Tempe, AZ]","institution_ids":["https://openalex.org/I55732556"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5002312717","display_name":"Xiaoning Qi","orcid":"https://orcid.org/0000-0003-1748-1878"},"institutions":[{"id":"https://openalex.org/I55732556","display_name":"Arizona State University","ror":"https://ror.org/03efmqc40","country_code":"US","type":"education","lineage":["https://openalex.org/I55732556"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Xiaoning Qi","raw_affiliation_strings":["[Dept. of Electr. Eng., Arizona State Univ., Tempe, AZ]"],"affiliations":[{"raw_affiliation_string":"[Dept. of Electr. Eng., Arizona State Univ., Tempe, AZ]","institution_ids":["https://openalex.org/I55732556"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5066350120","display_name":"Sam Lo","orcid":"https://orcid.org/0000-0002-1440-7616"},"institutions":[{"id":"https://openalex.org/I55732556","display_name":"Arizona State University","ror":"https://ror.org/03efmqc40","country_code":"US","type":"education","lineage":["https://openalex.org/I55732556"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Sam Lo","raw_affiliation_strings":["[Dept. of Electr. Eng., Arizona State Univ., Tempe, AZ]"],"affiliations":[{"raw_affiliation_string":"[Dept. of Electr. Eng., Arizona State Univ., Tempe, AZ]","institution_ids":["https://openalex.org/I55732556"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5064349870","display_name":"M. Shahram","orcid":null},"institutions":[{"id":"https://openalex.org/I55732556","display_name":"Arizona State University","ror":"https://ror.org/03efmqc40","country_code":"US","type":"education","lineage":["https://openalex.org/I55732556"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Mahmoud Shahram","raw_affiliation_strings":["[Dept. of Electr. Eng., Arizona State Univ., Tempe, AZ]"],"affiliations":[{"raw_affiliation_string":"[Dept. of Electr. Eng., Arizona State Univ., Tempe, AZ]","institution_ids":["https://openalex.org/I55732556"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100740019","display_name":"Yu Cao","orcid":"https://orcid.org/0000-0001-6968-1180"},"institutions":[{"id":"https://openalex.org/I55732556","display_name":"Arizona State University","ror":"https://ror.org/03efmqc40","country_code":"US","type":"education","lineage":["https://openalex.org/I55732556"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Yu Cao","raw_affiliation_strings":["[Dept. of Electr. Eng., Arizona State Univ., Tempe, AZ]"],"affiliations":[{"raw_affiliation_string":"[Dept. of Electr. Eng., Arizona State Univ., Tempe, AZ]","institution_ids":["https://openalex.org/I55732556"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5109972401","display_name":"Kishore Singhal","orcid":null},"institutions":[{"id":"https://openalex.org/I55732556","display_name":"Arizona State University","ror":"https://ror.org/03efmqc40","country_code":"US","type":"education","lineage":["https://openalex.org/I55732556"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Kishore Singhal","raw_affiliation_strings":["[Dept. of Electr. Eng., Arizona State Univ., Tempe, AZ]"],"affiliations":[{"raw_affiliation_string":"[Dept. of Electr. Eng., Arizona State Univ., Tempe, AZ]","institution_ids":["https://openalex.org/I55732556"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5024947018","display_name":"Dino Toffolon","orcid":null},"institutions":[{"id":"https://openalex.org/I55732556","display_name":"Arizona State University","ror":"https://ror.org/03efmqc40","country_code":"US","type":"education","lineage":["https://openalex.org/I55732556"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Dino Toffolon","raw_affiliation_strings":["[Dept. of Electr. Eng., Arizona State Univ., Tempe, AZ]"],"affiliations":[{"raw_affiliation_string":"[Dept. of Electr. Eng., Arizona State Univ., Tempe, AZ]","institution_ids":["https://openalex.org/I55732556"]}]}],"institution_assertions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":2.339,"has_fulltext":true,"fulltext_origin":"ngrams","cited_by_count":18,"citation_normalized_percentile":{"value":0.873405,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":87,"max":88},"biblio":{"volume":null,"issue":null,"first_page":"41","last_page":"46"},"is_retracted":false,"is_paratext":false,"primary_topic":{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9997,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12495","display_name":"Electrostatic Discharge in Electronics","score":0.9944,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/spice","display_name":"Spice","score":0.6562315},{"id":"https://openalex.org/keywords/degradation","display_name":"Degradation","score":0.43053967}],"concepts":[{"id":"https://openalex.org/C2780077345","wikidata":"https://www.wikidata.org/wiki/Q16891888","display_name":"Spice","level":2,"score":0.6562315},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.5814925},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.48384824},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.47676307},{"id":"https://openalex.org/C2779679103","wikidata":"https://www.wikidata.org/wiki/Q5251805","display_name":"Degradation (telecommunications)","level":2,"score":0.43053967},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.31560084},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.24228951},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.20233482},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.1994546},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.1487734},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.07896209},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"is_oa":false,"landing_page_url":"https://doi.org/10.1109/isqed.2007.21","pdf_url":null,"source":null,"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Life on land","score":0.66,"id":"https://metadata.un.org/sdg/15"}],"grants":[],"datasets":[],"versions":[],"referenced_works_count":11,"referenced_works":["https://openalex.org/W1583499813","https://openalex.org/W1904268933","https://openalex.org/W1991891926","https://openalex.org/W2102729267","https://openalex.org/W2142908374","https://openalex.org/W2149263288","https://openalex.org/W2166005805","https://openalex.org/W2540699116","https://openalex.org/W2541671985","https://openalex.org/W2543188300","https://openalex.org/W2543567411"],"related_works":["https://openalex.org/W4241196849","https://openalex.org/W2610849239","https://openalex.org/W2360388749","https://openalex.org/W2204879205","https://openalex.org/W2096437374","https://openalex.org/W2088504085","https://openalex.org/W2041608016","https://openalex.org/W2037642033","https://openalex.org/W1943174035","https://openalex.org/W1674491244"],"abstract_inverted_index":{"This":[0],"paper":[1],"presents":[2],"a":[3,59,95],"simulation":[4,34,92],"framework":[5,16],"for":[6,52,85],"reliability":[7,65],"analysis":[8],"of":[9,20,39,80,98,110,146,163],"circuits":[10,168],"in":[11],"the":[12,18,37,49,53,76,108,160],"SPICE":[13],"environment.":[14],"The":[15,43,103,142],"incorporates":[17],"degradation":[19,45,87],"physical":[21],"parameters":[22,135],"such":[23,67],"as":[24,68],"threshold":[25],"voltage":[26],"(V":[27,123,136],"tp":[30],")":[31,132],"into":[32],"circuit":[33,143],"and":[35,72,78,91,101,133],"enables":[36],"design":[38],"highly":[40],"reliable":[41],"circuits.":[42],"parameter":[44],"is":[46,58,149],"based":[47],"on":[48,112,165],"numerical":[50],"solution":[51],"reaction-diffusion":[54],"(R-D)":[55],"mechanism,":[56],"which":[57],"general":[60],"model":[61,104],"applicable":[62],"to":[63],"various":[64],"effects":[66],"NBTI,":[69],"HCI,":[70],"NCS,":[71],"SEE.":[73],"In":[74],"particular,":[75],"accuracy":[77],"efficiency":[79],"this":[81,147],"method":[82,148],"was":[83],"verified":[84,150],"NBTI":[86,111,164],"with":[88,151],"130nm":[89],"experimental":[90],"data":[93,153],"over":[94],"wide":[96],"range":[97],"stress":[99],"voltages":[100],"temperature.":[102],"also":[105,158],"accurately":[106],"captures":[107],"dependence":[109],"multiple":[113],"diffusion":[114],"species":[115],"(H/H":[116],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">2":[119],"),":[120],"key":[121],"process":[122],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">th":[126],",":[127,140],"t":[128],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">ox":[131],"environmental":[134],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">DD":[139],"temperature).":[141],"level":[144],"performance":[145],"silicon":[152],"from":[154],"ring-oscillator":[155],"circuit.":[156],"We":[157],"investigated":[159],"predicted":[161],"impact":[162],"representative":[166],"digital":[167]},"cited_by_api_url":"https://api.openalex.org/works?filter=cites:W2121367655","counts_by_year":[{"year":2015,"cited_by_count":1},{"year":2014,"cited_by_count":3},{"year":2013,"cited_by_count":2},{"year":2012,"cited_by_count":1}],"updated_date":"2024-12-12T22:34:16.053652","created_date":"2016-06-24"}